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Secondary electron measurement with Auger electron microprobe. I: Calibration of the CMA in the low-energy regionOGOH, I; SHIMIZU, R; HASHIMOTO, H et al.Japanese journal of applied physics. 1985, Vol 24, Num 9, pp 1145-1149, issn 0021-4922Article

Inelastic scattering of charged particles by a statistical atomGERASIMOV, S. A; VOLKOV, V. F.Physics letters. A. 1985, Vol 110, Num 5, pp 276-278, issn 0375-9601Article

Secondary electron emission from polyvinylidene fluoride (PVDF) filmKOSHIDA, N; YOSHIDA, S.Japanese journal of applied physics. 1983, Vol 22, Num 11, issn 0021-4922, 1744Article

The relation of trap distribution of alumina with surface flashover performance in vacuumLI, C. R; DING, L. J; LU, J. Z et al.International Symposium on Discharges and Electrical Insulation in Vacuum. 2004, isbn 0-7803-8461-X, 2Vol, Vol 1, 99-102Conference Paper

Etude du démarrage d'un magnétron avec une cathode froide à émission secondaire à la chute de l'impulsion de tensionNAUMENKO, V. D; CHERENSHCHIKOV, S. A.Izvestiâ vysših učebnyh zavedenij. Radiofizika. 1984, Vol 27, Num 2, pp 250-256, issn 0021-3462Article

Fine structure of the low-energy secondary electron emission spectra of platinum single crystalPANCHENCKO, O; PANCHENKO, L. K.Journal of communications technology & electronics. 1994, Vol 39, Num 3, pp 82-87, issn 1064-2269Article

Performance of a new ion optics for quasisimultaneous secondary ion, secondary neutral, and residual gas mass spectrometryLIPINSKY, D; JEDE, R; GANSCHOW, O et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1985, Vol 3, Num 5, pp 2007-2017, issn 0734-2101Article

Influence of electrode surface and some gas phase processes on electrical breakdown in nitrogen-filled diodesPEJOVIC, M. M; MIJOVIC, B. J; BOSAN, D. A et al.Journal of physics. D, Applied physics (Print). 1984, Vol 17, Num 2, pp 351-355, issn 0022-3727Article

Forward―backward correlated secondary-electron emission depending on the angle of emergence of protons transmitted through a thin carbon foilOGAWA, H; SORAI, K; AMANO, S et al.Journal of physics. B. Atomic, molecular and optical physics (Print). 2014, Vol 47, Num 8, issn 0953-4075, 085201.1-085201.6Article

Interrelation de deux approches différentes dans la description de l'émission secondaire des monocristauxKORABIEV, V. V; KUDINOV, YU. A.Fizika tverdogo tela. 1987, Vol 29, Num 5, pp 1602-1604, issn 0367-3294Article

Prise en considération de la réflexion et de l'émission secondaire des électrons lors des mesures de sondes de la fonction de distribution énergétique des électrons dans le plasmaDEMIDOV, V. I; KOLOKOLOV, N. B; TORONOV, O. G et al.Žurnal tehničeskoj fiziki. 1984, Vol 54, Num 2, pp 388-391, issn 0044-4642Article

Secondary electron emission data of cesiated oxygen free high conductivity copperHOPMAN, H. J; VERHOEVEN, J.Applied surface science. 1999, Vol 150, Num 1-4, pp 1-7, issn 0169-4332Article

The effect of surface charge on the coefficient of secondary electron emission from composite cathodesAITOV, R. D; KORZHAVYI, A. P; KRISTYA, V. I et al.Journal of communications technology & electronics. 1995, Vol 40, Num 15, pp 24-27, issn 1064-2269Article

Dose perturbations at interfaces in photon beams : secondary electron transportWERNER, B. L; DAS, I. J; SALK, W. N et al.Medical physics (Lancaster). 1990, Vol 17, Num 2, pp 212-226, issn 0094-2405Article

Direct indication plasma potential diagnostic based on secondary electron emissionEN YAO WANG; HERSHKOWITZ, N; INTRATOR, T et al.Review of scientific instruments. 1986, Vol 57, Num 6, pp 1085-1089, issn 0034-6748Article

Secondary electron emission under electron bombardment from graphene nanoplateletsMONTERO, Isabel; AGUILERA, Lydya; DAVILA, María E et al.Applied surface science. 2014, Vol 291, pp 74-77, issn 0169-4332, 4 p.Conference Paper

Secondary electron emission from highly charged carbon grainsBERANEK, M; RICHTEROVA, I; NEMECEK, Z et al.The European physical journal. D, Atomic, molecular and optical physics (Print). 2009, Vol 54, Num 2, pp 299-304, issn 1434-6060, 6 p.Article

Studies of multipactor threshold in square coaxial linesWU CHUNBANG; SUN QINFEN; LUO YAOHUI et al.ISAPE 2000 : international symposium on antennas, propagation and EM theory. 2000, pp 422-425, isbn 0-7803-6377-9Conference Paper

Secondary electron emission measurements on synthetic diamond filmsHOPMAN, H. J; VERHOEVEN, J; BACHMANN, P. K et al.Diamond and related materials. 1999, Vol 8, Num 6, pp 1033-1038, issn 0925-9635Article

Influence de la structure des verres de borosilicate de plomb sur leur coefficient d'émission d'électrons secondairesLEONOV, N. B; VOLKOV, A. S; MURASHOV, S. V et al.Fizika i himiâ stekla. 1988, Vol 14, Num 5, pp 686-690, issn 0132-6651Article

Secondary electron yield of graphite and TiC coatingsFRANCONI, E.Fusion technology. 1984, Vol 6, Num 2, pp 414-419, issn 0748-1896, 2Article

Plasma-wall interactions in DC discharges and sheath of Langmuir probesCENIAN, A; RACHUBINSKI, H; CHERNUKHO, A et al.The European physical journal. Special topics. 2013, Vol 222, Num 9, pp 2143-2156, issn 1951-6355, 14 p.Conference Paper

High bandwidth secondary electron detection in variable pressure scanning electron microscopy using a Frisch gridMORGAN, S. W; PHILLIPS, M. R.Journal of physics. D, Applied physics (Print). 2008, Vol 41, Num 5, issn 0022-3727, 055504.1-055504.6Article

Décompositions de l'énergie des électrons secondaires émis par l'arséniure de gallium avec l'affinité électronique négativeANDRONOV, A.N; STUCHINSKIJ, G.B; YANYUSHKIN, E.I et al.Fizika tverdogo tela. 1989, Vol 31, Num 5, pp 23-30, issn 0367-3294Article

Secondary electron emission from a charged dielectricBUDD, P. A; JAVIDI, B; ROBINSON, J. W et al.IEEE transactions on electrical insulation. 1985, Vol 20, Num 3, pp 485-491, issn 0018-9367Article

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