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SOME UNCONVENTIONAL SAMPLE PRESENTATION TECHNIQUES FOR THE ICP SOURCE = QUELQUES TECHNIQUES DE PREPARATION D'ECHANTILLON ORIGINALES POUR LA SPECTROMETRIE D'EMISSION ICPTHOMPSON M; ANONYMOUS.1981; ICP INF. NEWSL.; ISSN 0161-6951; USA; DA. 1981; VOL. 7; NO 4; PP. 197Conference Paper

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ABSTRACTS OF THE SYMPOSIUM ON OPERATIONAL ASPECTS OF PLASMAS IN OPTICAL EMISSION SPECTROSCOPY = RESUMES DU SYMPOSIUM SUR LES ASPECTS DE L'UTILISATION DES PLASMAS EN SPECTROMETRIE D'EMISSIONANONYMOUS.1981; ICP INF. NEWSL.; ISSN 0161-6951; USA; DA. 1981; VOL. 7; NO 4; 6Conference Paper

Détermination des terres rares dans les roches par spectrométrie d'émission à plasma induitZHAO SHOUJIONG.1983, Vol 4, Num 3, pp 111-122Article

Geothermal fluid analysis by ICP spectroscopy and ion chromatography: a preliminary assessment = Analyse des fluides géothermiques par le spectrométrie d'émission ICP et la chromatographie ionique: estimation préliminaireFINLAYSON, J. B.New Zealand geothermal workshop. 1981, pp 149-155Conference Paper

Fitting of SKβ emission spectra of some 3d metal sulphides = Mise au point des spectres d'émission SKβ de quelques sulfures métalliques 3dGRZETIC, I; SLAVIC, I; EL GORESY, A et al.Mezhdunarodnyj geologicheskij kongress. 27. 1984, 54Conference Paper

Reply to comment on Diagnostics of 13.56 MHz RF sustained Ar-N₂ plasma by optical emission spectroscopy by N. Sadeghi and F.J. Gordillo-VazquezKHAN, F. U; REHMAN, N. U; NASEER, S et al.EPJ. Applied physics (Print). 2009, Vol 47, Num 1, issn 1286-0042, 11002.p1-11002.p2Article

Utilizacíón del microanálisis espectral con laser en mineralogía = Utilisation de la microanalyse spectrale laser en minéralogieRAKIP, W; SMAGULOV, R; KRAPIVA, L et al.1984, Num 2, pp 85-92Article

The using of the scintillation emission spectral analyse (SESA) in investigations of small mineral particlesKOVALEVSKII, A.L; PROKOPCHUK, S.I.International geological congress. 1992, p.691Conference Paper

Gas phase kinetic and optical emission spectroscopy studies in plasma-enhanced hot filament catalytic CVD production of carbon nanotubesGULAS, M; LE NORMAND, F; VEIS, P et al.Applied surface science. 2009, Vol 255, Num 10, pp 5177-5180, issn 0169-4332, 4 p.Conference Paper

Laser ablation of As_xSe_100-x chalcogenide glasses: Plume investigationsFOCSA, C; NEMEC, P; ZISKIND, M et al.Applied surface science. 2009, Vol 255, Num 10, pp 5307-5311, issn 0169-4332, 5 p.Conference Paper

Optical emission spectroscopy investigation of sputtering discharge used for SiO_xN_y thin films deposition and correlation with the film compositionREBIB, F; TOMASELLA, E; THOMAS, L et al.Applied surface science. 2006, Vol 252, Num 15, pp 5611-5614, issn 0169-4332, 4 p.Conference Paper

Enhanced tunability of the composition in silicon oxynitride thin films by the reactive gas pulsing processAUBRY, Eric; WEBER, Sylvain; BILLARD, Alain et al.Applied surface science. 2014, Vol 290, pp 148-153, issn 0169-4332, 6 p.Article

Silicon oxynitride thin films synthesised by the reactive gas pulsing process using rectangular pulsesAUBRY, E; WEBER, S; BILLARD, A et al.Applied surface science. 2011, Vol 257, Num 23, pp 10065-10071, issn 0169-4332, 7 p.Article

Effect of electromagnetic interactions on plasmon excitations in silver particle ensemblesBENIA, H.-M; NILIUS, N; FREUND, H.-J et al.Surface science. 2006, Vol 600, Num 10, issn 0039-6028, L128-L133Article

Directional Study of the Optical Properties of Tb³⁺- and Eu³⁺-Doped Nanoparticles Embedded in Silica Photonic CrystalsBOVERO, Enrico; YANO, Kazuhisa; NAKAMURA, Tadashi et al.ChemPhysChem (Print). 2010, Vol 11, Num 12, pp 2550-2554, issn 1439-4235, 5 p.Article

Determining the Time Zero for Electronic DynamicsSANSONE, Giuseppe.ChemPhysChem (Print). 2010, Vol 11, Num 17, pp 3581-3583, issn 1439-4235, 3 p.Article

An optical emission spectroscopy study of the plasma generated in the DC HF CVD nucleation of diamondLARIJANI, M. M; LE NORNIAND, F; CREGUT, O et al.Applied surface science. 2007, Vol 253, Num 8, pp 4051-4059, issn 0169-4332, 9 p.Article

Plasma diagnostics in pulsed laser deposition of GaLaS chalcogenidesPOMPILIAN, O. G; GURLUI, S; NEMEC, P et al.Applied surface science. 2013, Vol 278, pp 352-356, issn 0169-4332, 5 p.Conference Paper

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Beam interactions with materials and atoms: proceedings/3rd International Conference on particle induced X-ray emission and its analytical applications, Heidelberg, July 18-22, 1983 = Interactions des faisceaux avec les matériaux et les atomes. Comptes rendus de la 3ème Conférence Internationale sur l'émission de rayons X provoquée par particules (PIXE) et applications analytiques, Heidelberg, 18-22 juillet 1983ANDERSEN, H. H; PICRAUX, S. T; MARTIN, B et al.Nuclear instruments and methods in physics research. 1984, Vol 231, Num 1-3, issn 0167-5087, XIX-712 pConference Proceedings

Properties of silicon nitride films prepared by magnetron sputteringHIROHATA, Y; SHIMAMOTO, N; HINO, T et al.Thin solid films. 1994, Vol 253, Num 1-2, pp 425-429, issn 0040-6090Conference Paper

Determinacion de estano en minerales de baja ley por espectrometria de Emision de Plasma. Comparacion de los resultados cou el método de analisio volumétrico = Détermination de l'étain dans les minéraux de faible teneur par spectrométrie d'émission de plasma. Comparaison avec la méthode d'analyse volumétriqueDEL BARRIO MARTIN, S; GARCIA GARZON, J; VERGARA PARDEIRO, A et al.Boletin Geologico y Minero. 1988, Vol 99, Num 4, pp 607-610, issn 0366-0176Article