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Results 1 to 25 of 2323

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Versatility, flexibility are essential when selecting enclosures and cabinetsWERWICK, V. P.Electronic manufacturing. 1988, Vol 34, Num 2, pp 21-22Article

Ausgewählte Beiträge zur konstruktiven Realisierung moderner elektronischer Baueinheiten = Selected contributions to the construction realization of modern electronic unitsBECKER, R; FECHTEL, J; KUHNT, R et al.Wissenschaftliche Zeitschrift der Technischen Universität Dresden. 1989, Vol 38, Num 4, pp 91-96, issn 0043-6925, 6 p.Article

Design of a high performance digital tachometer with a microcontrollerBONERT, R.IEEE transactions on instrumentation and measurement. 1989, Vol 38, Num 6, pp 1104-1108, issn 0018-9456, 5 p.Article

Automated placement of fine lead pitch surface mount electronic devices using vision guidanceOUGHTON, D. M. A.Advanced manufacturing engineering. 1988, Vol 1, Num 1, pp 6-10, issn 0951-5232Article

Considerations for selecting electronic cabinets. IDUQUETTE, F. J.Electri.onics. 1987, Vol 33, Num 14, pp 45-47, issn 0745-4309Article

Netzwerkanschlusse in der Gebäudeautomation = Liaison de réseaux dans l'automatisation des bâtiments = Network linking in building automationGUSMANN, B; OSBURG, H.TAB. Technik am Bau. 1990, Num 3, pp 245-249, issn 0341-2032, 5 p.Article

A preliminary categorization of end-of-life electrical and electronic equipment as secondary metal resourcesOGUCHI, Masahiro; MURAKAMI, Shinsuke; SAKANAKURA, Hirofumi et al.Waste management (Elmsford). 2011, Vol 31, Num 9-10, pp 2150-2160, issn 0956-053X, 11 p.Article

Economic sustainability of reuse as an end-of-life management tool for computers and televisionsRUBINSTEIN, Lynn.Electronics recycling summitIEEE international symposium on electronics and the environment (ISEE). 2004, pp 1-6, isbn 0-7803-8250-1, 1Vol, 6 p.Conference Paper

A cost analysis of framing systems in microelectronics constructionROBINSON, C; CHASEY, A.D.Cost engineering (Morgantown, W. Va.). 2000, Vol 43, Num 3, pp 26-31, issn 0274-9696Article

Development of a CMOS time memory cell VLSI and a CAMA module with 0.5 ns resolutionARAI, Y; IKENO, M; MATSUMURA, T et al.IEEE transactions on nuclear science. 1992, Vol 39, Num 4, pp 784-788, issn 0018-9499Conference Paper

Electronique et ergothérapie (II): ébauche d'un désigneur à diodes électro-luminescentes (L.E.D.) = Electronic and ergotherapy: rough sketch of a wormer with electroluminescent diodesBELHEUR, J. P.Journal d'ergothérapie (Paris). 1989, Vol 11, Num 2, pp 61-73, issn 0249-6550, 13 p.Article

Sécurité des systèmes électroniques programmables assurée par un contrôle en ligne basé sur l'analyse de signature = Security of programmable electronic systems insured by an on-line control based on signature analysisSCHWEITZER, A; BREMONT, J; LAMOTTE, M et al.Onde électrique. 1988, Vol 68, Num 6, pp 52-58, issn 0030-2430Article

R & M 2000 environmental stress screeningLITTLEFIELD, J. W.IEEE transactions on reliability. 1987, Vol 36, Num 3, pp 335-341, issn 0018-9529Article

Vector analyzer gains in speedBROWNE, J.Microwaves & RF. 1998, Vol 37, Num 3, issn 0745-2993, p. 194Article

Das thermische Verhalten technologischer Ausrüstungen = Thermal behavior concerning technological equipmentsWITTE, I.Wissenschaftliche Zeitschrift der Technischen Universität Dresden. 1989, Vol 38, Num 4, pp 139-141, issn 0043-6925, 3 p.Article

On the implications of R & M 2000 environmental stress screeningSAARI, A. E.IEEE transactions on reliability. 1987, Vol 36, Num 3, pp 342-345, issn 0018-9529Article

The redundancy of two three-state devicesPULLI, T.Microelectronics and reliability. 1985, Vol 25, Num 6, pp 1067-1071, issn 0026-2714Article

Vulnerability of digitized platforms to modern RF electromagnetic weaponsFRATER, Michael R; RYAN, Michael J.SPIE proceedings series. 2001, pp 133-140, isbn 0-8194-4091-4Conference Paper

Semi E10 : Equipment reliability, availability and maintainabilityDHUDSHIA, V. H.Semiconductor international. 1997, Vol 20, Num 6, pp 167-174, issn 0163-3767, 5 p.Article

Elektronische Druckmessung: Prinzipien und Anwendungen = Electronical pressure measurement: principles and applicationsWESPI, A. J.Verfahrenstechnik (Mainz. 1983). 1993, Vol 27, Num 12, pp 54-57, issn 0175-5315, 3 p.Article

Note on MTBF versus mean-wear-life versus MIL-hdbk-217BADENIUS, D.Microelectronics and reliability. 1992, Vol 32, Num 9, pp 1241-1242, issn 0026-2714Article

Amplifier with time-invariant trapezoidal shaping and shape-sensitive pileup rejector for high-rate spectroscopyDRNDAREVIC, V; RYGE, P; GOZANI, T et al.IEEE transactions on nuclear science. 1989, Vol 36, Num 1, pp 1326-1329, issn 0018-9499, 4 p., part 2Article

Disjoncteurs: le «plus» de l'électroniqueMesures (1983). 1988, Vol 53, Num 5, pp 49-51, issn 0755-219XArticle

R & M 2000 and environemental stress screeningCAPITANO, J. L.IEEE transactions on reliability. 1987, Vol 36, Num 3, pp 346-350, issn 0018-9529Article

Electronic corrosion protection through the use of a controlled environment module (CEM)AGOPIAN, N; HUZA, M.Pulp & paper Canada. 1987, Vol 88, Num 12, pp 161-163, issn 0316-4004Conference Paper

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