Development of a reference material and reference method to provide a calibration of the instrument intensity scale for differential AESSEAH, M. P; HUNT, C. P; TOSA, M et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 61, Num 2, pp 149-171, issn 0368-2048Article

Interlaboratory tests of a composite reference sample to calibrate Auger electron spectrometers in the differential modeSEAH, M. P; HUNT, C. P; SYKES, D et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 61, Num 2, pp 173-182, issn 0368-2048Article

Instrumental considerations for acquiring quantitative Auger electron spectraSMITH, M. A.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1991, Vol 9, Num 4, pp 2309-2314, issn 0734-2101Article

A modified sample introduction system for the Perkin-Elmer 545 scanning Auger microprobePOTTER, T. J; BAIRD, R. J.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1988, Vol 6, Num 4, pp 2574-2575, issn 0734-2101Article

Two-grid Auger-low energy electron diffraction systemNAMBA, Y; MORI, T.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1986, Vol 4, Num 4, pp 1884-1887, issn 0734-2101Article

Inexpensive and high-precision digital power supply and counting interface for UPS, XPS, and Auger spectrometersLICHTENBERGER, D. L; KELLOGG, G. E; KRISTOFZSKI, J. G et al.Review of scientific instruments. 1986, Vol 57, Num 9, issn 0034-6748, 2366Article

Auger-electron spectra formation under solid surface bombardment by diatomic molecular beamsFERLEGER, V. K; MATVEEV, V. I.Vacuum. 1991, Vol 42, Num 14, pp 871-875, issn 0042-207XArticle

A matched filter technique for Auger depth profile sensitivity enhancementSCHWARZ, S. A; YOON, H. W.Applied surface science. 1988, Vol 31, Num 2, pp 189-196, issn 0169-4332Article

Auger analyzer translation using ball bushingsREUTER, M. C; TROMP, R. M.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1988, Vol 6, Num 4, pp 2575-2576, issn 0734-2101Article

An Auger electron spectroscopic study of the reaction of ammonia with Fe(110)BHATTACHARYA, A. K; CHESTERS, M. A.Journal of catalysis (Print). 1987, Vol 108, Num 2, pp 484-486, issn 0021-9517Article

Interpretation of the Auger Electron Spectra (AES) of sulfide minerals = Interprétation des spectres d'électrons Auger des minéraux sulfurésVAUGHAN, D. J; TOSSELL, J. A.Physics and chemistry of minerals. 1986, Vol 13, Num 5, pp 347-350, issn 0342-1791Article

Quantitative analysis of iron nitrides (γ'-Fe₄N and ε-Fe_2-3N) using Auger electron spectroscopySTRYDOM, I. L. R; WELLS, A.Surface science. 1986, Vol 173, Num 1, pp 245-263, issn 0039-6028Article

High fidelity in Auger spectroscopy : dependence on experimental parametersSAIJO, H; KONDA, Y; SHIOJIRI, M et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1991, Vol 9, Num 2, pp 201-206, issn 0734-2101, 6 p.Article

Spectrométries des vibrations et des particules. Spectroscopie des électrons Auger = Vibrational and particle spectroscopies. Auger electron spectroscopyLE GRESSUS, Claude.Techniques de l'ingénieur. Analyse et caractérisation. 1990, Vol P4, Num P2620, pp P2620.1-P2620.21, issn 1762-8717Article

Apparatus for positron annihilation-induced Auger electron spectroscopyCHUN LEI; MEHL, D; KOYMEN, A. R et al.Review of scientific instruments. 1989, Vol 60, Num 12, pp 3656-3660, issn 0034-6748Article

Composition dans la masse et en surface des catalyseurs solides du système palladium-rhodiumGRISHINA, T. M; LAZAREVA, L. I.Žurnal fizičeskoj himii. 1987, Vol 61, Num 7, pp 1812-1816, issn 0044-4537Article

The first stages of oxidation of a-Si: a study of the Si L_2,3VV Auger lineshapeVIDAL, R; PASSEGGI, M. C. G.Journal of physics. Condensed matter (Print). 1989, Vol 1, Num 33, pp 5783-5792, issn 0953-8984, 10 p.Article

Use of the direct energy spectra in Auger electron spectroscopyLANGERON, J.-P.Surface and interface analysis. 1989, Vol 14, Num 6-7, pp 381-387, issn 0142-2421Conference Paper

Low energy Auger electron spectroscopy of titanium nitrides for quantitative analysisDAWSON, P. T; TZATZOV, K. K.Surface science. 1986, Vol 171, Num 2, pp 239-254, issn 0039-6028Article

Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combinedSEAH, M. P.Applied surface science. 1999, Vol 144-45, pp 161-167, issn 0169-4332Conference Paper

Application of ICP AES to the determination of REE in Egypt's black sand depositsEID, M. A; NAIM, G; MAHDY, A. A et al.Journal of alloys and compounds. 1994, Vol 207-08, pp 482-486, issn 0925-8388Conference Paper

Quantification of the excitation of Auger spectra by characteristic and by white X-radiationEBEL, H; EBEL, M. F; WERNISCH, J et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 62, Num 4, pp 359-370, issn 0368-2048Article

Random uncertainties in AES and XPS. I: Uncertainties in peak energies, intensities and areas derived from peak synthesisCUMPSON, P. J; SEAH, M. P.Surface and interface analysis. 1992, Vol 18, Num 5, pp 345-360, issn 0142-2421Article

Line narrowing in photoemission by coincidence spectroscopy = Rétrécissement de raie dans la photoémission par spectroscopie de coïncidenceJENSEN, E; BARTYNSKI, R. A; HULBERT, S. L et al.Physical review letters. 1989, Vol 62, Num 1, pp 71-73, issn 0031-9007Article

Détection et extraction de pics Auger noyés dans le bruit = Detection and extraction of Auger peaks buried in noiseVICARIO, E; DOGHMANE, N; THOLOMIER, M et al.Journal de microscopie et de spectroscopie électroniques. 1989, Vol 14, Num 2, pp 95-112, issn 0395-9279Article