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Novel theoretical analyses of some features of X-ray spectrometry. III: Concentration correction equations derived for scattered radiationKUCZUMOW, A.Spectrochimica acta. Part B : Atomic spectroscopy. 1988, Vol 43, Num 6-7, pp 737-742, issn 0584-8547Article

Compositional mapping with the electron probe microanalyzer. Part INEWBURY, D. E; FIORI, C. E; MARINENKO, R. B et al.Analytical chemistry (Washington, DC). 1990, Vol 62, Num 22, pp 1159A-1166A, issn 0003-2700Article

Ted Hall and the science of biological microprobe X-ray analysis : a historical perspective of methodology and biological dividendsGUPTA, B. L.Scanning microscopy. 1991, Vol 5, Num 2, pp 379-426, issn 0891-7035Article

Principles and recent developments of XANES spectroscopyDAVOLI, I; PARIS, E.European meeting on absorption spectroscopy in mineralogy. 1990, pp 205-226Conference Paper

Starch crystal transformations and their industrial importance = Transformations des cristaux d'amidon et leur importance industrielleZOBEL, H. F.Stärke. 1988, Vol 40, Num 1, pp 1-7, issn 0038-9056Conference Paper

Diesel Soot Chemical Characterization using XANESPATEL, Mihir; ASWATH, Pranesh.Tribology & lubrication technology. 2010, Vol 66, Num 2, pp 17-18, issn 1545-858X, 2 p.Article

Local crystal lattice curvature measurements for bent-crystal spectrometersSCHUMACHER, U; NOLTE, R.Review of scientific instruments. 1990, Vol 61, Num 1, pp 121-123, issn 0034-6748, 1Article

Calibration of pulsed x-ray spectraANDERSON, J. A; COLLINS, C. B.Review of scientific instruments. 1988, Vol 59, Num 3, pp 414-419, issn 0034-6748Article

The development process of an expert system for the automated interpretation of large EPMA data setsJANSSENS, K; DORRINE, W; VAN ESPEN, P et al.Chemometrics and intelligent laboratory systems. 1988, Vol 4, Num 2, pp 147-161Article

Principles of differential energy-dispersive X-ray spectroscopy (DEDXS)COUSINS, C. S. G.Journal of applied crystallography. 1988, Vol 21, Num 5, pp 496-503, issn 0021-8898Article

A study of PIXE continuum polarization propertiesPOTIRIADIS, C; KARYDAS, A. G; ZARKADAS, Ch et al.X-ray spectrometry. 2005, Vol 34, Num 4, pp 335-340, issn 0049-8246, 6 p.Conference Paper

X-ray photoelectron spectroscopy for detection of the different Si-O bonding states of siliconPLEUL, Dieter; FRENZEL, Ralf; ESCHNER, Michael et al.Analytical and bioanalytical chemistry. 2003, Vol 375, Num 8, pp 1276-1281, 6 p.Conference Paper

Compact convex crystal x-ray spectrometerONG, C. X; WONG, C. S.Review of scientific instruments. 1991, Vol 62, Num 10, pp 2501-2502, issn 0034-6748Article

Long-term oxidation behavior of Ni₃Al alloys with and without chromium additionsPAN, Y. C; CHUANG, T. H; YAO, Y. D et al.Journal of materials science. 1991, Vol 26, Num 22, pp 6097-6103, issn 0022-2461Article

Applications of EXAFS in mineralogyCALAS, G; MANCEAU, A; COMBES, J.-M et al.European meeting on absorption spectroscopy in mineralogy. 1990, pp 171-204Conference Paper

Corps étrangers en IAA. Quand les rayons X traquent l'indésirableMesures (1983). 1988, Num 11, pp 59-61, issn 0755-219XArticle

Differential PIXE measurements for the stratigraphic analysis of the painting Madonna deifusi by Leonardo da VinciGRASSI, N; MIGLIORI, A; MANDO, P. A et al.X-ray spectrometry. 2005, Vol 34, Num 4, pp 306-309, issn 0049-8246, 4 p.Conference Paper

Imaging-plate X-ray spectrometer for high-resolution particle-induced X-ray emissionKAWAI, J; MAEDA, K; YAMANE, T et al.Analytical sciences. 1993, Vol 9, Num 2, pp 179-184, issn 0910-6340Article

Correction for specimen movement after acquisition of element-specific electron microprobe imagesLAMVIK, M. K; INGRAM, P; MENON, R. G et al.Journal of microscopy (Print). 1989, Vol 156, pp 183-190, issn 0022-2720, 8 p., part 2Article

Structure of an antibody-antigen complex: crystal structure of the HyHEL-10 Fan―lysozyme complexPADLAN, E. A; SILVERTON, E. W; SHERIFF, S et al.Proceedings of the National Academy of Sciences of the United States of America. 1989, Vol 86, Num 15, pp 5938-5942, issn 0027-8424, 5 p.Article

An attempt to incorporate the Gaussian line shape in the study of spectroscopic limiting line intensityYAP, C. T; ANICIN, I. V.Applied spectroscopy. 1988, Vol 42, Num 5, pp 729-730, issn 0003-7028, 2 p.Article

Determination of conditions for optimum resolution of a high angle thin window energy dispersive spectrometerBLACKFORD, M. G; SMITH, K. L.Microscopy research and technique. 1992, Vol 22, Num 2, pp 194-198Article

Nomenclature system for X-ray spectroscopyJENKINS, R; MANNE, R; ROBIN, R et al.X-ray spectrometry. 1991, Vol 20, Num 3, pp 149-155, issn 0049-8246, 7 p.Article

Analysis of a chondrite meteorite from SloveniaSMIT, Z; JEZERSEK, D; PELICON, P et al.X-ray spectrometry. 2011, Vol 40, Num 3, pp 205-209, issn 0049-8246, 5 p.Article