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Isotopic studies of oxidation of Si₃N₄ and Si using SIMSHONGHUA DU; HOUSER, C. A; TRESSLER, R. E et al.Journal of the Electrochemical Society. 1990, Vol 137, Num 2, pp 741-742, issn 0013-4651, 2 p.Article

Sulfur Isotope Studies in Solid Organics: A Protocol for Utilizing Heterogeneous Standards and Secondary Ion Mass SpectrometryKING, Hubert E; ZIMMER, Mindy M; HORN, William C et al.Energy & fuels. 2014, Vol 28, Num 3-4, pp 2446-2453, issn 0887-0624, 8 p.Article

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Range of high energy phophorus and medium energy boron ions implanted in polymersTSOUKALAS, D.Solid-state electronics. 1990, Vol 33, Num 6, pp 639-643, issn 0038-1101, 5 p.Article

Application of characteristic secondary ion mass spectroscopy to phase identification in amorphous titanium carbideKALOYEROS, A; WILLIAMS, W. S.Surface science. 1986, Vol 171, Num 2, pp L454-L460, issn 0039-6028Article

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Ion yields of impurities in gallium arsenide for secondary ion mass spectrometryHOMMA, Y; TANAKA, T.Analytical chemistry (Washington, DC). 1986, Vol 58, Num 6, pp 1108-1112, issn 0003-2700Article

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XPS, static SIMS and NEXAFS spectroscopic investigation of thiol adsorption on metals and metal sulfidesGOH, S. W; BUCKLEY, A. N; LAMB, R. N et al.Proceedings - Electrochemical Society. 2006, pp 107-119, issn 0161-6374, isbn 1-56677-440-3, 1Vol, 13 p.Conference Paper

Optimization of the dynamic range of SIMS depth profiles by sample preparationVON CRIEGERN, R; WEITZEL, I; ZEININGER, H et al.Surface and interface analysis. 1990, Vol 15, Num 7, pp 415-421, issn 0142-2421Article

Does analytics produce facts ? An inter-disciplinary approachHERION, J.Fresenius' journal of analytical chemistry. 1992, Vol 344, Num 7-8, pp 353-354, issn 0937-0633Article

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Metrology infrastructure for sustainable development of the Americas: the role of SIMBRANDI, Humberto S; LOPES DE SOUZA, Taynah.Accreditation and quality assurance. 2009, Vol 14, Num 10, pp 567-573, issn 0949-1775, 7 p.Article

Discrimination of prostate cancer cells and non-malignant cells using secondary ion mass spectrometryBAKER, Matthew J; BROWN, Michael D; GAZI, Ehsan et al.Analyst (London. 1877. Print). 2008, Vol 133, Num 2, pp 175-179, issn 0003-2654, 5 p.Article

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Classification of secondary ion mass spectrometry (SIMS) micrographs to characterize chemical phasesLATKOCZY, C; HUTTER, H; GRASSERBAUER, M et al.Mikrochimica acta (1966. Print). 1995, Vol 119, Num 1-2, pp 1-12, issn 0026-3672Article

Time-of-flight secondary ion mass spectrometry of poly(alkyl methacrylates)ZIMMERMAN, P. A; HERCULES, D. M; BENNINGHOVEN, A et al.Analytical chemistry (Washington, DC). 1993, Vol 65, Num 8, pp 983-991, issn 0003-2700Article

A boundary for reaction mechanisms within the transition metals interacting with nitrogen oxides is observed in DSIMS experimentsBILL, J; RYBCZYNSKI, W; SEIDEL, W et al.Fresenius' journal of analytical chemistry. 1993, Vol 346, Num 1-3, pp 241-245, issn 0937-0633Conference Paper

A sample positioning system for vacuum applicationsVARGAS-ABURTO, C; LIFF, D. R.Measurement science & technology (Print). 1992, Vol 3, Num 2, pp 161-169, issn 0957-0233Article

An empirical model for ion formation from polymer surfaces during analysis by secondary ion mass spectrometryLEGGETT, G. J; VICKERMAN, J. C.International journal of mass spectrometry and ion processes. 1992, Vol 122, pp 281-319, issn 0168-1176Article