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Self-enhancement effects on XRF K-lines due to natural widthFERNANDEZ, Jorge E; SCOT, Viviana.X-ray spectrometry. 2009, Vol 38, Num 3, pp 175-181, issn 0049-8246, 7 p.Conference Paper

X-ray fluorescence detection low-Z elements using a microchannel plate detectorROSENBERG, R. A; SIMONS, J. K; FRIGO, S. P et al.Review of scientific instruments. 1992, Vol 63, Num 4, pp 2193-2194, issn 0034-6748, 1Article

Effect of helium environment and mylar foil on the sensitivity of different elements in energy dispersive X-ray fluorescence spectroscopyKHATRI, R. P.Journal of radioanalytical and nuclear chemistry. 1989, Vol 134, Num 1, pp 53-63, issn 0236-5731, 11 p.Article

Concentrations of essential and nonessential elements in shoots and storage roots of carrot grown in NaCI and Na2SO4 salinity : XRS in environmental and geochemical scienceINAL, Ali; GUNES, Aydin; PILBEAM, David J et al.X-ray spectrometry. 2009, Vol 38, Num 1, pp 45-51, issn 0049-8246, 7 p.Article

Some considerations on the definition of the limit of detection in X-ray fluorescence spectrometryKUMP, P.Spectrochimica acta. Part B : Atomic spectroscopy. 1997, Vol 52, Num 3, pp 405-408, issn 0584-8547Article

Provenance study of Venezuelan pre-Columbian ceramics employing radioisotope X-ray fluorescenceLABRECQUE, J. J; VAZ, J. E; TARBLE, K et al.Applied spectroscopy. 1988, Vol 42, Num 8, pp 1482-1487, issn 0003-7028Article

Nondestructive elemental depth profiling of Japanese lacquerware 'Tamamushi-nuri' by confocal 3D-XRF analysis in comparison with micro GE-XRF : XRS in Environmental and Geochemical ScienceNAKANO, Kazuhiko; TSUJI, Kouichi.X-ray spectrometry. 2009, Vol 38, Num 5, pp 446-450, issn 0049-8246, 5 p.Article

Influence of photo and Auger electrons of the elements with high atomic numbers on formation of carbon x-ray fluorescence intensityDUKHANIN, A. Yu; PAVLINSKY, G. V; BARANOV, E. O et al.X-ray spectrometry. 2006, Vol 35, Num 1, pp 34-39, issn 0049-8246, 6 p.Article

eXtRa Fine analysis of ceramicsOLIVER, G.Materials world. 2000, Vol 8, Num 5, pp 22-23, issn 0967-8638Article

Accuracy of the emission-transmission method applied in XRF analysis of intermediate thickness samplesMARKOWICZ, A; HASELBERGER, N; EL HASSAN, H. S et al.Journal of radioanalytical and nuclear chemistry. 1992, Vol 158, Num 2, pp 409-415, issn 0236-5731Article

Synchrotron radiation-induced x-ray microanalysisJANSSENS, K; VINCZE, L; ADAMS, F et al.Analytica chimica acta. 1983, Vol 283, Num 1, pp 98-110, issn 0003-2670Conference Paper

A combined SAXS/WAXS/XAFS setup capable of observing concurrent changes across the nano-to-micrometer size range in inorganic solid crystallization processesBEALE, Andrew M; VAN DER EERDEN, Ad M. J; JACQUES, Simon D. M et al.Journal of the American Chemical Society. 2006, Vol 128, Num 38, pp 12386-12387, issn 0002-7863, 2 p.Article

Evidence for calcium soaps in human hair shaft revealed by sub-micrometer X-ray fluorescenceBRIKI, F; MERIGOUX, C; SARROT-REYNAULD, F et al.Journal de physique. IV. 2003, Vol 104, pp 337-340, issn 1155-4339, 4 p.Conference Paper

Analysis of a Roman Centaurus from Canas de Senhorim (Portugal): Comparative study using EDXRF and SXRFARAUJO, M. F; PINHEIRO, T; VALERIO, P et al.Journal de physique. IV. 2003, Vol 104, pp 523-526, issn 1155-4339, 4 p.Conference Paper

New approach to improving the reliability of X-ray fluorescence analysisONISHCHENKO, A. M.Journal of analytical chemistry (New York, NY). 1997, Vol 52, Num 10, pp 934-938, issn 1061-9348Article

Applications and perspectives for the use of an integrated XRF-XRD spectrometerYELLEPEDDI, R; BONVIN, D.World cement. 1995, Vol 26, Num 11, pp 54-59, issn 0263-6050, 4 p.Article

Derniers développements en matière de fluorescence X de table et fluorescence multi-dispersive : Centenaire des rayons X = Latest developments in benchtop X-ray- and multi-dispersive fluorescenceROBSON, N; CHATELAIN, L.Analusis (Imprimé). 1995, Vol 23, Num 7, pp 282-285, issn 0365-4877Article

Method for quantitative XRF analysis of inhomogeneous thin specimensMARKOWICZ, A; HASELBERGER, N; WHAI ZIN OO, U et al.X-ray spectrometry. 1993, Vol 22, Num 3, pp 160-162, issn 0049-8246Article

Matrix correction in X-ray fluorescence analysis by the effective coefficient methodBROLL, N; CAUSSIN, P; PETER, M et al.X-ray spectrometry. 1992, Vol 21, Num 1, pp 43-49, issn 0049-8246Article

Background correction procedure for multi-channel X-ray fluorescence spectrometersGUNICHEVA, T. N; AFONIN, V. P; FINKELSHTEIN, A. L et al.X-ray spectrometry. 1992, Vol 21, Num 5, pp 253-258, issn 0049-8246Article

Suitability of total reflection X-ray fluorescence spectrometry for elemental speciation studiesMUKHTAR, S; HASWELL, S. J.Journal of analytical atomic spectrometry (Print). 1991, Vol 6, Num 4, pp 339-341, issn 0267-9477Article

Enhancement effects in XRF analysisSALEH, N. S; AL-SALEH, K. A; ABU EL-HAIJA, A. J et al.Journal of radioanalytical and nuclear chemistry. 1988, Vol 120, Num 1, pp 161-165, issn 0236-5731Article

Improvement of spatial resolution of μ-XRF by using a thin metal filterNAKANO, Kazuhiko; MATSUDA, Akinori; NODERA, Yuta et al.X-ray spectrometry. 2008, Vol 37, Num 6, pp 642-645, issn 0049-8246, 4 p.Article

Measurement of background components in wavelength dispersive X-ray fluorescence spectrometryVERKHOVODOV, Petro O.X-ray spectrometry. 2006, Vol 35, Num 5, pp 296-304, issn 0049-8246, 9 p.Article

Optimizing accuracy and precision in spectral dataGREAVES, E. D; BENNUM, L; PALACIOS, F et al.X-ray spectrometry. 2005, Vol 34, Num 3, pp 194-199, issn 0049-8246, 6 p.Article

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