kw.\*:("Espectrometría fotoelectrón")
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Application of a sine transform method to experiments of single-photon-decay spectroscopy : single exponential decay signalsLÓPEZ, R. J; GONZÁLEZ, F; MORENO, F et al.Review of scientific instruments. 1992, Vol 63, Num 6, pp 3268-3273, issn 0034-6748Article
Augmentation de la sensibilité de seuil d'un spectromètre de rayonnement de photoionisation par collisionsMISHCHENKO, E. D; REBO, I. L.Optika i spektroskopiâ. 1987, Vol 62, Num 2, pp 437-440, issn 0030-4034Article
Magnetoelectric, Raman, and XPS Properties of Pb0.7Sr0.3[(Fe2/3Ce1/3)0.012Ti0.988]O3 and Pb0.7Sr0.3[(Fe2/3La1/3)0.012Ti0.988]O3 NanopartidesVERMA, Kuldeep Chand; KUMAR, Manoj; KOTNALA, R. K et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2014, Vol 45, Num 3, pp 1409-1414, issn 1073-5623, 6 p.Article
Simple instrument for the measurement of photoelectron structure functionsBASANO, L; OTTONELLO, P.Review of scientific instruments. 1985, Vol 56, Num 11, pp 2070-2073, issn 0034-6748Article
X-ray photoelectron spectroscopy surface quantification of sulfided CoMoP catalysts : Relation between activity and promoted sites Part I: Influence of the Co/Mo ratioGANDUBERT, A. D; LEGENS, C; GUILLAUME, D et al.Oil & gas science and technology. 2007, Vol 62, Num 1, pp 79-89, issn 1294-4475, 11 p.Article
Surface oxidation of Ni-20Cr alloys with small additions of Ce and SiAMANO, T; ITOH, A.Applied surface science. 1992, Vol 60-61, pp 677-680, issn 0169-4332Conference Paper
Some aspects of the charging effect in monochromatized focused XPSYU, X; HANTSCHE, H.Fresenius' journal of analytical chemistry. 1993, Vol 346, Num 1-3, pp 233-236, issn 0937-0633Conference Paper
A novel soft X-ray source (hν = 151.6 eV) for core level and valence band photoemission spectroscopy with high surface sensitivityDUO, L; DE MICHELIS, B; FASANA, A et al.Journal of electron spectroscopy and related phenomena. 1993, Vol 62, Num 4, pp 309-316, issn 0368-2048Article
An appraisal of evaporated gold as an energy reference in X-ray photoelectron spectroscopyKOHIRI, S; OKI, K.Journal of electron spectroscopy and related phenomena. 1985, Vol 36, Num 1, pp 105-110, issn 0368-2048Article
Signal-to-noise measurements in X-ray photoelectron spectroscopyKOENIG, M. F; GRANT, J. T.Surface and interface analysis. 1985, Vol 7, Num 5, pp 217-222, issn 0142-2421Article
ESCA features of ligninsVARMA, A. J.Polymer testing. 1986, Vol 6, Num 1, pp 79-80, issn 0142-9418Article
Inexpensive and high-precision digital power supply and counting interface for UPS, XPS, and Auger spectrometersLICHTENBERGER, D. L; KELLOGG, G. E; KRISTOFZSKI, J. G et al.Review of scientific instruments. 1986, Vol 57, Num 9, issn 0034-6748, 2366Article
An X-ray photoelectron spectroscopy study of the influence of hydrogen on the oxygen-silver interactionLEFFERTS, L; VAN OMMEN, J. G; ROSS, J. R. H et al.Journal of the Chemical Society. Faraday Transactions I. 1987, Vol 83, Num 10, pp 3161-3165, issn 0300-9599Article
XPS Analysis of Ti6Al4V Oxidation Under UHV ConditionsHIERRO-OLIVA, M; GALLARDO-MORENO, A. M; GONZALEZ-MARTIN, M. L et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2014, Vol 45, Num 13, pp 6285-6290, issn 1073-5623, 6 p.Article
Investigation of phosphate adsorption onto ferrihydrite by X-ray Photoelectron SpectroscopyMALLET, M; BARTHELEMY, K; RUBY, C et al.Journal of colloid and interface science. 2013, Vol 407, pp 95-101, issn 0021-9797, 7 p.Article
Photoelectron spectroscopy of aromatic compound clusters of the B12 all-boron benzene: B12Au― and B12(BO)―HUI BAI; ZHAI, Hua-Jin; LI, Si-Dian et al.PCCP. Physical chemistry chemical physics (Print). 2013, Vol 15, Num 24, pp 9646-9653, issn 1463-9076, 8 p.Article
Flash vacuum thermolysis of 3,4-dimethyl-1-germacyclopent-3-enes: UV photoelectron spectroscopic characterization of GeH2 and GeMe2LEMIERRE, Virginie; CHROSTOWSKA, Anna; DARGELOS, Alain et al.Applied organometallic chemistry. 2004, Vol 18, Num 12, pp 676-683, issn 0268-2605, 8 p.Conference Paper
Modeling and construction of a novel electron energy analyzer for rapid x-ray photoelectron spectroscopy spectra acquisitionTEPERMEISTER, I; SAWIN, H. H.Review of scientific instruments. 1992, Vol 63, Num 8, pp 3828-3834, issn 0034-6748Article
Etat et distribution de l'iridium dans les catalyseurs Ir déposésBULATOV, A. V; GAJDEJ, T. P; USTRITSKIJ, S. N et al.Kinetika i kataliz. 1988, Vol 29, Num 1, pp 238-240, issn 0453-8811Article
XPS studies of the oxygen 1S and 2s levels in a wide range of functional polymersBRIGGS, D; BEAMSON, G.Analytical chemistry (Washington, DC). 1993, Vol 65, Num 11, pp 1517-1523, issn 0003-2700Article
Valence-band states of ion-bombarded polystyreneTERRASI, A; FOTI, G; HWU, Y et al.Journal of applied physics. 1991, Vol 70, Num 3, pp 1885-1887, issn 0021-8979Article
Photoelectron spectroscopy study of surface oxidation of SnTe, PbTe and PbSnTeBADRINARAYANAN, S; MANDALE, A. B; SINHA, A. P. B et al.Materials chemistry and physics. 1984, Vol 11, Num 1, pp 1-14, issn 0254-0584Article
Note on the formation of surface carbidesSELVAM, P; VISWANATHAN, B; SRINIVASAN, V et al.Journal of electron spectroscopy and related phenomena. 1990, Vol 50, Num 3, pp 277-287, issn 0368-2048Article
The use of parallel imaging ESCA to analyse features smaller than 5 micronsFORSYTH, N. M; COXON, P.Fresenius' journal of analytical chemistry. 1993, Vol 346, Num 1-3, pp 218-222, issn 0937-0633Conference Paper
Background removal in X-ray photoelectron spectroscopyTOKUTAKA, H; ISHIHARA, N; NISHIMORI, K et al.Surface and interface analysis. 1992, Vol 18, Num 10, pp 697-704, issn 0142-2421Article