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On the meaning of the diffusion layer thickness for slow electrode reactionsMOLINA, A; GONZALEZ, J; LABORDA, E et al.PCCP. Physical chemistry chemical physics (Print). 2013, Vol 15, Num 7, pp 2381-2388, issn 1463-9076, 8 p.Article

Laser microsintering of tungsten in vacuumEBERT, Robby; ULLMANN, Frank; HARTWIG, Lars et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7589, issn 0277-786X, isbn 978-0-8194-7985-3, 75891G.1-75891G.12Conference Paper

Bildanalytische Schichtdickenbestimmung an Al-Diffusionsbeschichtungen = The determination of Al-diffusion layer thickness by image processingBERGHOF-HASSELBÄCHER, E; ROHR, V; NICOLAS, E et al.Praktische Metallographie. 2006, Vol 43, Num 3, pp 127-142, issn 0032-678X, 16 p.Article

Influence of baffle on improving the thickness uniformity of thin film deposited by magnetron sputtering systemHE YU; YADONG JIANG; TAO WANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7658, issn 0277-786X, isbn 978-0-8194-8088-0, 76581N.1-76581N.5, 2Conference Paper

Analysis of film thickness for magnetron sputtering system with more than one workbenchWANG TAO; YU HE; WU ZHIMING et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7506, issn 0277-786X, isbn 978-0-8194-7892-4 0-8194-7892-X, 75062B.1-75062B.9, 2Conference Paper

Characteristics of nanostructure and electrical properties of Ti thin films as a function of substrate temperature and film thicknessSAVALONI, H; KHOJIER, K; ALAEE, M. S et al.Journal of materials science. 2007, Vol 42, Num 8, pp 2603-2611, issn 0022-2461, 9 p.Article

The effect of film thickness variations in periodic cracking: Analysis and experimentsTAYLOR, A. A; EDLMAYR, V; CORDILL, Mj et al.Surface & coatings technology. 2011, Vol 206, Num 7, pp 1830-1836, issn 0257-8972, 7 p.Conference Paper

Designs of Masks in Thickness UniformityJAING, Cheng-Chung.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7655, issn 0277-786X, isbn 978-0-8194-8085-9, 76551Q.1-76551Q.8, 2Conference Paper

Ultrasonic measurement of condensate film thicknessKIMBALL, Jeramy T; BAILEY, Michael R; HERMANSON, James C et al.The Journal of the Acoustical Society of America. 2008, Vol 124, Num 4, issn 0001-4966, EL.196-EL.202, 1Article

Synthesis of composite materials of carbon nanofibres and ceramic monoliths with uniform and tuneable nanofibre layer thicknessGARCIA-BORDEJE, Enrique; KVANDE, Ingvar; DE CHEN et al.Carbon (New York, NY). 2007, Vol 45, Num 9, pp 1828-1838, issn 0008-6223, 11 p.Article

Stability of landsat-4 thematic mapper outgassing modelsMICIJEVIC, Esad; CHANDER, Gyanesh.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62960E.1-62960E.11, issn 0277-786X, isbn 0-8194-6375-2, 1VolConference Paper

Effect of temperature and layer thickness on these strengths of carbon bonding for carbon/carbon compositesKOYAMA, Masashi; HATTA, Hiroshi; FUKUDA, Hiroshi et al.Carbon (New York, NY). 2005, Vol 43, Num 1, pp 171-177, issn 0008-6223, 7 p.Article

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Design and manufacture of broadband high-reflective filmJING ZHANG; XIUHUA FU.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6722, pp 672235.1-672235.4, issn 0277-786X, isbn 978-0-8194-6879-6 0-8194-6879-7, 2Conference Paper

Silicon detector dead layer thickness estimates using proton bremsstrahlung from low atomic number targetsCOHEN, David D; STELCER, Eduard; SIEGELE, Rainer et al.X-ray spectrometry. 2008, Vol 37, Num 2, pp 125-128, issn 0049-8246, 4 p.Conference Paper

Hydrodynamic response of adsorbed polymers. DiscussionWU, D. T; CATES, M. E; VAN DE VEN, T et al.Colloids and surfaces. A, Physicochemical and engineering aspects. 1994, Vol 86, pp 275-281, issn 0927-7757Conference Paper

Performance simulation of reflection-mode GaAs photocathodes with back-interface recombinationZOU JIJUN; DENG WENJUAN; FENG LIN et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8194, issn 0277-786X, isbn 978-0-8194-8835-0, 81942L.1-81942L.8, 2Conference Paper

Advanced high-k/metal gate stack progress and challenges - a materials and process integration perspectivePARK, C. S; LYSAGHT, P; HUSSAIN, M. M et al.International journal of materials research. 2010, Vol 101, Num 2, pp 155-163, issn 1862-5282, 9 p.Article

Nano-Materials analysis using optical profilerDENGTENG GE; YAO LI; SEN HAN et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7284, issn 0277-786X, isbn 978-0-8194-7544-2 0-8194-7544-0, 1Vol, 728414.1-728414.4Conference Paper

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Investigation of sensibility of temperature response on selected parameters of multilayer structure : 11th Winter workshop on phtoacoustics and thermal wave methodsSUSZYNSKI, Z; MAJCHRZAK, P; MAJCHRZAK, L et al.Journal de physique. IV. 2006, Vol 137, pp 353-356, issn 1155-4339, 4 p.Conference Paper

Fourier Transform estimation of reflecting thin film thicknessVERLY, Pierre G.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 596306.1-596306.7, issn 0277-786X, isbn 0-8194-5981-X, 1VolConference Paper

Effect of refractive status on peripapillary retinal nerve fibre layer thickness: a study by RTVue spectral domain optical coherence tomographyNER, Veysi Ö; AYKUT, Veysel; TAS, Mehmet et al.British journal of ophthalmology. 2013, Vol 97, Num 1, pp 75-79, issn 0007-1161, 5 p.Article

Support Layer Influencing Sticking Probability: Enhancement of Mercury Sorption Capacity of GoldSABRI, Ylias M; IPPOLITO, Samuel J; BHARGAVA, Suresh K et al.Journal of physical chemistry. C. 2013, Vol 117, Num 16, pp 8269-8275, issn 1932-7447, 7 p.Article