A compact electron-gun evaporation source for highly stable evaporation of refractory metalsBEAG, Y. W; EGAWA, K; SHIMIZU, R et al.Review of scientific instruments. 1993, Vol 64, Num 12, pp 3647-3648, issn 0034-6748Article

Effect of Au on the crystallization of germanium thin films by electron-beam evaporationEYGI, Zeynep Deniz; KULAKCI, Mustafa; TURAN, Raşit et al.Applied surface science. 2014, Vol 318, pp 116-120, issn 0169-4332, 5 p.Conference Paper

Expansion cooling for an atomic beamHUANG WU; ARIMONDO, E.Journal of physics. D, Applied physics (Print). 1998, Vol 31, Num 22, pp 3218-3222, issn 0022-3727Article

Au(Ti-W) and Au/Cr metallization of chemically vapor-deposited diamond substrates for multichip module applicationsMEYYAPPAN, I; MALSHE, A. P; NASEEM, H. A et al.Thin solid films. 1994, Vol 253, Num 1-2, pp 407-412, issn 0040-6090Conference Paper

Optical wavelength response of Ta/p-Si position-sensitive detectorsHENRY, J; LIVINGSTONE, J.International journal of electronics. 2003, Vol 90, Num 10, pp 613-625, issn 0020-7217, 13 p.Article

Low-temperature deposition of Co on Cu(111): effects on step etchingSPELLER, S; DEGROOTE, S; DEKOSTER, J et al.Surface science. 1998, Vol 405, Num 2-3, pp L542-L548, issn 0039-6028Article

Surfactant mediated heteroepitaxial growth of Ge/Si(111) probed by X-ray photoelectron diffractionDREINER, S; WESTPHAL, C; SÖKELAND, F et al.Applied surface science. 1998, Vol 123-24, pp 610-614, issn 0169-4332Conference Paper

Modeling of residual stresses in thin films deposited by electron beam evaporationGUISBIERS, G; STREHLE, S; WAUTELET, M et al.Microelectronic engineering. 2005, Vol 82, Num 3-4, pp 665-669, issn 0167-9317, 5 p.Conference Paper

Cleaning of erosion plasma generated by a high-current non-self-maintained arc discharge from microdropletsSAFONOV, V. I; BELOUS, V. A; KARTMAZOV, G. N et al.Surface & coatings technology. 2002, Vol 158-59, pp 136-138, issn 0257-8972Conference Paper

Preparation of one-dimensional photonic crystal with variable period by using ultra-high vacuum electron beam evaporationSU CHEN; ZHITANG SONG; YANG WANG et al.Microelectronics journal. 2007, Vol 38, Num 2, pp 282-284, issn 0959-8324, 3 p.Article

Study on the electrical and optical properties of Ag/Al-doped ZnO coatings deposited by electron beam evaporationSAHU, D. R; LIN, Shin-Yuan; HUANG, Jow-Lay et al.Applied surface science. 2007, Vol 253, Num 11, pp 4886-4890, issn 0169-4332, 5 p.Article

Electron beam evaporation of aluminium with a porous tantalum rod in melt poolDIKSHIT, B; ZENDE, G. R; BHATIA, M. S et al.Journal of physics. D, Applied physics (Print). 2005, Vol 38, Num 14, pp 2484-2488, issn 0022-3727, 5 p.Article

Fabrication of metal structures with nanometer-scale lateral dimensions by sectioning using a microtomeQIAOBING XU; GATES, Byron D; WHITESIDES, George M et al.Journal of the American Chemical Society. 2004, Vol 126, Num 5, pp 1332-1333, issn 0002-7863, 2 p.Article

Low-temperature silicon epitaxy on hydrogen-terminated Si(001) surfacesJI, Jeong-Young; SHEN, T.-C.Physical review B. Condensed matter and materials physics. 2004, Vol 70, Num 11, pp 115309.1-115309.6, issn 1098-0121Article

Evaporation of atoms upon laser isotope separation involving target heating by an oscillating electron beamTKACHEV, A. N; YAKOVLENKO, S. I.Laser physics. 2003, Vol 13, Num 10, pp 1259-1263, issn 1054-660X, 5 p.Article

AC electrical conductivity of electron beam evaporated Cu-GeO₂ thin cermet filmsRAHMAN, M. H; AL-SAIE, A. M; BEYNON, J et al.Journal of materials science. 2000, Vol 35, Num 23, pp 5899-5905, issn 0022-2461Article

Mechanical stress in coevaporated β-FeSi_2+v thin films on silicon substratesHERZ, K; BRÜCKNER, W.Applied surface science. 1998, Vol 134, Num 1-4, pp 213-216, issn 0169-4332Article

Measurements of the temperature profile on the surface of niobium during electron beam evaporationTENCHOV, C; MITEV, V. A; SIMEONOVA, D. S et al.Vacuum. 1993, Vol 44, Num 11-12, pp 1127-1129, issn 0042-207XConference Paper

Nanocrystalline biphasic resorbable calcium phosphate (HAp/β-TCP) thin film prepared by electron beam evaporation techniqueELAYARAJA, K; SARATH CHANDRA, V; AHYMAH JOSHY, M. I et al.Applied surface science. 2013, Vol 274, pp 203-209, issn 0169-4332, 7 p.Article

Silver nanostructure arrays abundant in sub-5 nm gaps as highly Raman-enhancing substratesJUN WANG; LIQING HUANG; LIN YUAN et al.Applied surface science. 2012, Vol 258, Num 8, pp 3519-3523, issn 0169-4332, 5 p.Article

Complete filling of 41 nm trench pattern using Cu seed layer deposited by SAM-modified electroless plating and electron-beam evaporationHAN, W. K; HWANG, G. H; HONG, S. J et al.Applied surface science. 2010, Vol 256, Num 8, pp 2649-2653, issn 0169-4332, 5 p.Article

Field emission characteristics of lanthanum hexaboride coated silicon field emittersXIAOJU WANG; ZULUN LIN; KANGCHENG QI et al.Journal of physics. D, Applied physics (Print). 2007, Vol 40, Num 16, pp 4775-4778, issn 0022-3727, 4 p.Article

Preparation of ZnO thin films for high-resolution field emission display by electron beam evaporationNAKANISHI, Y; MIYAKE, A; KOMINAMI, H et al.Applied surface science. 1999, Vol 142, Num 1-4, pp 233-236, issn 0169-4332Conference Paper

Oscillating magnetoresistance of Co/Cu(111) filmsZORCHENKO, V. V; SAMOPHALOV, V. N; STETSENKO, A. N et al.Journal of magnetism and magnetic materials. 1998, Vol 183, Num 1-2, pp 25-34, issn 0304-8853Article

Growth of Si on disordered Si(111)(1 x 1) surfacesVEUILLEN, J. Y; MALLET, P; GOMEZ-RODRIGUEZ, J.-M et al.Surface science. 1998, Vol 402-04, pp 295-298, issn 0039-6028Conference Paper