FACTORS CONTROLLING THE CONTACT RESISTANCE OF SEMICONDUCTORSFANG YK; CHANG CY; SU YK et al.1979; INTERNATION. J. ELECTRON.; GBR; DA. 1979; VOL. 47; NO 6; PP. 577-585; BIBL. 10 REF.Article

CONTACT RESISTANCE IN METAL-SEMICONDUCTOR SYSTEMSFANG YK; CHANG CY; SU YK et al.1979; SOLID-STATE ELECTRON.; GBR; DA. 1979; VOL. 22; NO 11; PP. 933-938; BIBL. 10 REF.Article

DLTS MEASUREMENT OF BULK DENSITY OF GAP STATES IN PLASMA ENHANCED CVD AMORPHOUS SILICONCHANG CY; FANG YK; HSU WC et al.1981; INTERNATIONAL CONFERENCE ON CHEMICAL VAPOR DEPOSITION. 8/1981/GOUVIEUX; USA; PENNINGTON NJ: THE ELECTROCHEMICAL SOCIETY; DA. 1981; PP. 357-367; BIBL. 13 REF.Conference Paper

CHARACTERISTICS OF P-I-N LASER DETECTORS: THEIR DEPENDENCE ON WAVELENGTH AND TEMPERATURESU YK; CHANG CY; WU TS et al.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 20; PP. 3510-3512; BIBL. 8 REF.Article

DEPENDENCE OF PROPERTIES ON PLASMA POWER IN AN A-SI-H FILMCHANG CY; FANG YK; LIN WL et al.1981; INTERNATIONAL CONFERENCE ON CHEMICAL VAPOR DEPOSITION. 8/1981/GOUVIEUX; USA; PENNINGTON NJ: THE ELECTROCHEMICAL SOCIETY; DA. 1981; PP. 368-374; BIBL. 7 REF.Conference Paper

A MIS SOLAR CELL MADE ON PLASMA HYDROGENATED POLYCRYSTALLINE SILICONCHANG CY; FANG YK; WU BS et al.1982; ELECTROCHEMICAL SOCIETY. SPRING MEETING. GENERAL SESSION/1982-05-09/MONTREAL PQ; USA; PENNINGTON: ELECTROCHEMICAL SOCIETY; DA. 1982; PP. 118-119; BIBL. 5 REF.Conference Paper