MEV ION SCATTERING FOR SURFACE STRUCTURE DETERMINATION = DIFFUSION DES IONS MEV POUR LA DETERMINATION DE LA STRUCTURE DE SURFACEFELDMAN LC.1981; CRC CRIT. REV. SOLID STATE MATER. SCI.; ISSN 0161-1593; USA; DA. 1981; VOL. 10; NO 2; PP. 143-167; BIBL. 29 REF.Article

COMPARISON OF HIGH ENERGY ION BEAM AND ELECTRON BEAM SURFACE PROBESFELDMAN LC.1982; APPL. SURF. SCI.; ISSN 0378-5963; NLD; DA. 1982; VOL. 13; NO 1-2; PP. 211-230; BIBL. 43 REF.Conference Paper

END-POINT ENERGY VARIATIONS IN THE NONCHARACTERISTIC RADIATION PRODUCED BY S, CL, AR, K, CA, AND TI BOMBARDMENT OF SI.BISSINGER G; FELDMAN LC.1974; PHYS. REV. LETTERS; U.S.A.; DA. 1974; VOL. 33; NO 1; PP. 1-4; BIBL. 10 REF.Article

ATOMIC STRUCTURE AT THE (111) SI-SIO₂ INTERFACEHAIGHT R; FELDMAN LC.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 7; PP. 4884-4887; BIBL. 19 REF.Article

STRUCTURAL STUDIES OF THE RECONSTRUCTED W(001) SURFACE WITH MEV ION SCATTERINGFELDMAN LC; SILVERMAN PJ; STENSGAARD I et al.1979; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1979; VOL. 87; NO 2; PP. 410-414; BIBL. 8 REF.Article

CHARGE STATES OF 25-150 KEV H AND ⁴HE BACKSCATTERED FROM SOLID SURFACESBUCK TM; WHEATLEY GH; FELDMAN LC et al.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 35; PP. 345-361; BIBL. 30 REF.; (SOLID-VAC. INTERFACE. PROC. 2ND SYMP. SURF. PHYS.; ENSCHEDE, NETH.; 1972)Conference Paper

RECONSTRUCTION OF THE W(001) SURFACE AND ITS REORDERING BY HYDROGEN ADSORPTION, STUDIED BY MEV ION SCATTERINGSTENSGAARD I; FELDMAN LC; SILVERMAN PJ et al.1979; PHYS. REV. LETTERS; USA; DA. 1979; VOL. 42; NO 4; PP. 247-250; BIBL. 14 REF.Article

SEARCH FOR CHESTER EFFECTS IN X-RAY PRODUCTION BY FAST HYDROGEN MOLECULES.LURIO A; ANDERSEN HH; FELDMAN LC et al.1978; PHYS. REV., A; U.S.A.; DA. 1978; VOL. 17; NO 1; PP. 90-92; BIBL. 9 REF.Article

APPLICATION OF SELECTIVE CHEMICAL REACTION CONCEPT FOR CONTROLLING THE PROPERTIES OF OXIDES ON GAASCHANG RPH; COLEMAN JJ; POLAK AJ et al.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 3; PP. 237-238; BIBL. 8 REF.Article

SURFACE SCATTERING FROM W SINGLE CRYSTALS BY MEV HE⁺ IONS.FELDMAN LC; KAUFFMAN RL; SILVERMAN PJ et al.1977; PHYS. REV. LETTERS; U.S.A.; DA. 1977; VOL. 39; NO 1; PP. 38-41; BIBL. 14 REF.Article

ANALYSIS OF PLASMA-GROWN GAAS OXIDE FILMS.KAUFFMAN RL; FELDMAN LC; POATE JM et al.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 30; NO 7; PP. 319-321; BIBL. 11 REF.Article

A QUANTITATIVE STUDY OF THE RELATIONSHIP BETWEEN INTERFACIAL CARBON AND LINE DISLOCATION DENSITY IN SILICON MOLECULAR BEAM EPITAXYMCFEE JH; SWARTZ RG; ARCHER VD et al.1983; JOURNAL OF THE ELECTROCHEMICAL SOCIETY; ISSN 0013-4651; USA; DA. 1983; VOL. 130; NO 1; PP. 214-216; BIBL. 9 REF.Article

SIGNIFICANCE OF THE CHANNELING SURFACE PEAK IN THIN-FILM ANALYSIS.KAUFFMAN RL; FELDMAN LC; SILVERMAN PJ et al.1978; APPL. PHYS. LETTERS; U.S.A.; DA. 1978; VOL. 32; NO 2; PP. 93-94; BIBL. 8 REF.Article

EPITAXY OF AU ON AG(111) STUDIED BY HIGH-ENERGY ION SCATTERING = EPITAXIE DE AU SUR AG(111) ETUDIEE PAR DIFFUSION D'IONS DE HAUTE ENERGIECULBERTSON RJ; FELDMAN LC; SILVERMAN PJ et al.1981; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1981; VOL. 47; NO 9; PP. 657-660; BIBL. 10 REF.Article

STUDIES ON THE SI-SIO₂ INTERFACE BY MEV ION CHANNELINGCHEUNG NW; FELDMAN LC; SILVERMAN PJ et al.1979; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1979; VOL. 35; NO 11; PP. 859-861; BIBL. 7 REF.Article

POSITRON-ANNIHILATION MOMENTUM PROFILES IN ALUMINUM: CORE CONTRIBUTION AND THE INDEPENDENT-PARTICLE MODEL.LYNN KG; MACDONALD JR; BOIE RA et al.1977; PHYS. REV. LETTERS; U.S.A.; DA. 1977; VOL. 38; NO 5; PP. 241-245; BIBL. 12 REF.Article

OPTICAL RADIATION FROM ELECTRON-STIMULATED DESORPTION OF EXCITED PARTICLESTOLK NH; FELDMAN LC; KRAUS JS et al.1981; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1981; VOL. 46; NO 2; PP. 134-137; BIBL. 11 REF.Article

ROLE OF SURFACE INTERACTIONS IN BEAM-FOIL EXCITED-STATE FORMATIONTOLK NH; FELDMAN LC; KRAUS JS et al.1981; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1981; VOL. 47; NO 7; PP. 487-490; BIBL. 22 REF.Article

NI ON SI (111): REACTIVITY AND INTERFACE STRUCTURECHEUNG NW; CULBERTSON RJ; FELDMAN LC et al.1980; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1980; VOL. 45; NO 2; PP. 120-124; BIBL. 18 REF.Article