EMPLOI DE FIGURES DE MOIRE POUR L'ETUDE DES PROCESSUS DE LAMINAGEPOLUKHIN PI; VORONTSOV VK; BUDNIKOV GV et al.1973; IZVEST. VYSSH. UCHEBN. ZAVED., CHERN. METALLURG.; S.S.S.R.; DA. 1973; NO 3; PP. 78-80; BIBL. 3 REF.Serial Issue

CHARACTERISTICS OF SUPERPOSED PATTERNS IN OPTICS.BRYNGDAHL O.1976; J. OPT. SOC. AMER.; U.S.A.; DA. 1976; VOL. 66; NO 2; PP. 87-94; BIBL. 5 REF.Article

THEORETICAL INTERPRETATION OF THE MOIRE PATTERN.YOKOZEKI S.1974; OPT. COMMUNIC.; NETHERL.; DA. 1974; VOL. 11; NO 4; PP. 378-381; BIBL. 13 REF.Article

COMPUTER GENERATED MOIRELOHMANN AW; LU PO SHIANG.1980; OPT. COMMUNIC.; NLD; DA. 1980; VOL. 34; NO 2; PP. 167-170; BIBL. 6 REF.Article

VARIFOCAL MOIRE ZONE PLATES FOR STRAIGHTNESS MEASUREMENT.BURCH JM; WILLIAMS DC.1977; APPL. OPT.; U.S.A.; DA. 1977; VOL. 16; NO 9; PP. 2445-2450; BIBL. 16 REF.Article

MOIRE: FORMATION AND INTERPRETATION.BRYNGDAHL O.1974; J. OPT. SOC. AMER.; U.S.A.; DA. 1974; VOL. 64; NO 10; PP. 1287-1294; BIBL. 18 REF.Article

MOIRE MICROWAVE HOLOGRAPHY.GREGORIS LG; IIZUKA K.1977; APPL. OPT.; U.S.A.; DA. 1977; VOL. 16; NO 2; PP. 418-426; BIBL. 25 REF.Article

MOIRE PROFILE PREDICTION BY USING FOURIER SERIES FORMALISM.PATORSKI K; YOKOZEKI S; SUZUKI T et al.1976; JAP. J. APPL. PHYS.; JAP.; DA. 1976; VOL. 15; NO 3; PP. 443-456; BIBL. 17 REF.Article

THE MOIRE ANALOGY TO HOLOGRAM INTERFEROMETRY.ABRAMSON N.1974; IN: ELECTRO-OPT. INT.'74 CONF. PROC. TECH. PROGR.; BRIGHTON, ENGL.; 1974; SURBITON, SURREY; KIVER COMMUN.; DA. 1974; PP. 35-42; BIBL. 2 REF.Conference Paper

ELECTRON INTERFERENCE IN SHADOW MICROSCOPY.DOWELL WCT.1977; OPTIK; DTSCH.; DA. 1977; VOL. 47; NO 2; PP. 195-204; ABS. ALLEM.; BIBL. 11 REF.; (DGA O/NTG-TAG. VERARBEITUNG OPT. INF. BER.; NUERNBERG; 1976)Conference Paper

SUR LE PROBLEME DE LA PHOTOMETRIE DES FIGURES D'INTERFERENCEZHILKIN VA; POPOV AM.1978; ZAVODSK. LAB.; SUN; DA. 1978; VOL. 44; NO 7; PP. 824-826; BIBL. 2 REF.Article

THE DEVELOPMENT AND THE PRESENT STATUS OF MOIRE TOPOGRAPHYTAKASAKI H.1979; OPT. ACTA; GBR; DA. 1979; VOL. 26; NO 8; PP. 1009-1019; ABS. FRE/GER; BIBL. 13 REF.Article

EXPERIENCE D'YOUNG AVEC N TROUS ET APPLICATIONS.NGUYEN DUNG.1978; ACTA PHYS. POLON., A; POL; DA. 1978; VOL. 53; NO 3; PP. 465-470; ABS. ENG; BIBL. 7 REF.Article

GEOMETRIC PARAMETERS OF MOIRE FRINGES.YOKOZEKI S; KUSAKA Y; PATORSKI K et al.1976; APPL. OPT.; U.S.A.; DA. 1976; VOL. 15; NO 9; PP. 2223-2227; BIBL. 16 REF.Article

ON THE INTERPRETATION OF SHADOW-MOIRE FRINGESROGER RE.1980; EXP. MECH.; ISSN 0014-4851; USA; DA. 1980; VOL. 20; NO 9; PP. 322-324; BIBL. 3 REF.Article

TUNABLE MOIRE GRATING FOR OPTICAL MAPPINGKAFRI O; LIVNAT A.1979; OPT. LETTERS; USA; DA. 1979; VOL. 4; NO 10; PP. 314-316; BIBL. 6 REF.Article

MOIRE FRINGE PROFILE PREDICTION METHOD ANT ITS APPLICATION TO FRINGE SHARPENINGYOKOSEKI S; PATORSKI K.1978; APPL. OPT.; USA; DA. 1978; VOL. 17; NO 16; PP. 2541-2547; BIBL. 9 REF.Article

POLARIZATION GRATINGS, PHASE RULINGS, AND MOIRE ANALYSISLIVNAT A; KAFRI O.1981; OPT. LETT.; ISSN 0146-9592; USA; DA. 1981; VOL. 6; NO 6; PP. 266-268; BIBL. 2 REF.Article

MULTIPLE BEAM HOLOGRAPHIC INTERFEROMETRYSHAALAN MS; JONATHAN JM.1978; OPT. ACTA; GBR; DA. 1978; VOL. 25; NO 11; PP. 1025-1034; BIBL. 10 REF.Article

FORMATION OF A LAPLACIAN BY ZONE PLATE MOIRE PATTERNSWESS O.1978; OPT. COMMUNIC.; NLD; DA. 1978; VOL. 27; NO 2; PP. 220-225; BIBL. 5 REF.Article

ELECTRONIC PROCESSING OF MOIRE FRINGES: APPLICATION TO MOIRE TOPOGRAPHY AND COMPARISON WITH PHOTOGRAMMETRYPERRIN JC; THOMAS A.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 4; PP. 563-574; BIBL. 13 REF.Article

MULTIPURPOSE OPTICAL MOIRE PROCESSORCHIANG FP; PARKER B; OPLINGER D et al.1979; OPT. ENGNG; USA; DA. 1979; VOL. 18; NO 5; PP. 456-460; BIBL. 17 REF.Article

DEPOUILLEMENT ELECTRO-OPTIQUE DE FRANGES DE MOIRE. APPLICATION A LA MESURE DE FORMES ET A LA MESURE DE DEFORMATIONS.PERRIN JC; THOMAS A.1977; DGRST-7571412; FR.; DA. 1977; PP. (88P.); BIBL. DISSEM.; (RAPP. FINAL, ACTION CONCERTEE: MEC.). 2 FASCReport