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ETUDE DE LA RELATION ENTRE L'INTENSITE DU FOND EN SPECTROMETRIE RX ET LA COMPOSITION CHIMIQUE DES PRISES D'ESSAIREVENKO AG; PAVLINSKIJ GV; LOSEV NF et al.1974; ZAVODSK. LAB.; S.S.S.R.; DA. 1974; VOL. 40; NO 11; PP. 1334-1338; BIBL. 9 REF.Article

BACKGROUND CORRECTION IN THE CONTROLLED POTENTIAL COULOMETRIC DETERMINATION OF URANIUMLE DUIGOU Y; LEIDERT W.1980; FRESENIUS Z. ANAL. CHEM.; ISSN 0016-1152; DEU; DA. 1980; VOL. 303; NO 1; PP. 29-30; BIBL. 2 REF.Article

DISPOSITIF POUR LA SEPARATION DES RAIES SPECTRALES DU FOND CONTINU D'UN RAYONNEMENT INTERFERANTKATSKOV DA; KRUGLIKOVA LP; L'VOV BV et al.1974; ZH. PRIKL. SPEKTROSK., BELORUS. S.S.R.; S.S.S.R.; DA. 1974; VOL. 21; NO 2; PP. 366-371; BIBL. 15 REF.Article

EVALUATION OF DIFFERENTIAL PULSE VOLTAMMETRY AT CARBON ELECTRODESWANG J; FREIHA BA.1983; TALANTA (OXFORD); ISSN 0039-9140; GBR; DA. 1983; VOL. 30; NO 5; PP. 317-322; BIBL. 27 REF.Article

ELIMINATION OF SPECTRAL INTERFERENCES USING ZEEMAN EFFECT BACKGROUND CORRECTIONFERNANDEZ FJ; GIDDINGS R.1982; AT. SPECTROSC.; ISSN 0195-5373; USA; DA. 1982; VOL. 3; NO 3; PP. 61-65; ABS. FRE/GER; BIBL. 6 REF.Article

THE ORIGIN OF SYSTEMATIC ERRORS IN BACKGROUND MEASUREMENTS IN ZEEMAN ATOMIC ABSORPTION SPECTROMETRYMASSMANN H.1982; TALANTA (OXF.); ISSN 0039-9140; GBR; DA. 1982; VOL. 29; NO 11B; PP. 1051-1055; BIBL. 15 REF.Article

COMPARISON OF DIFFERENT METHODS FOR ELIMINATING THE CHARGE BUILD-UP ON INSULATING SAMPLES IN PIXE ANALYSISGOCLOWSKI M; JASKOLA M; ZEMLO L et al.1983; NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH; ISSN 0167-5087; NLD; DA. 1983; VOL. 204; NO 2-3; PP. 553-558; BIBL. 14 REF.Article

POWDER NEUTRON DIFFRACTION-REFINEMENT OF THE TOTAL PATTERN.SABINE TM; CLARKE PJ.1977; J. APPL. CRYSTALLOGR.; DENM.; DA. 1977; VOL. 10; NO 9; PP. 277-280; BIBL. 7 REF.Article

(ANALYSE PAR FLUORESCENCE X). NATURE DU FOND CONTINU AU VOISINAGE D'UNE RAIE EN EMISSION DE FLUORESCENCE X. APPLICATION A L'ELIMINATION DES DIFFERENTES CAUSES D'ERREURS LORS DU DOSAGE DE FAIBLES TENEURS EN HAFNIUM DANS DES OXYDES DE ZIRCONIUMVIE LE SAGE R; GRUBIS B.1973; C.R. ACAD. SCI., C; FR.; DA. 1973; VOL. 276; NO 9; PP. 759-762; BIBL. 6 REF.Serial Issue

THE BACKGROUND INTERNAL FRICTION OF COLD-WORKED IRON SINGLE CRYSTALSNAKAMURA M; SUGENO T.1973; ACTA METALLURG.; E.U.; DA. 1973; VOL. 21; NO 5; PP. 539-545; ABS. FR. ALLEM.; BIBL. 13 REF.Serial Issue

A BACKGROUND EMISSION CORRECTION SYSTEM FOR ATOMIC ABSORPTION SPECTROMETRYDEWALT FG; AMEND JR; WOODRIFF R et al.1981; APPL. SPECTROSC.; ISSN 0003-7028; USA; DA. 1981; VOL. 35; NO 2; PP. 176-181; BIBL. 21 REF.Article

ACCURATE BACKGROUND MONITORING CIRCUIT FOR BC6-EQUIPED VARIAN-TECHTRON AA5 AND AA6 ATOMIC ABSORPTION SPECTROMETERSSIEMER DD.1980; ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1980; VOL. 119; NO 2; PP. 379-382; BIBL. 4 REF.Article

Spectrométrie d'électrons et analyse quantitative des surfaces. Application à l'XPS. Cas des Nickel-Chrome = Quantitative Electron Spectroscopy of Surfaces. XPS analysis. Nickel-Chromium StudiesNoille-Repoux, Monique; Delamare, François.1991, 123 p.Thesis

CHARACTERISTICS OF THE BACKGROUND EMISSION SPECTRUM FROM A MINIATURE INDUCTIVELY-COUPLED PLASMASAVAGE RN; HIEFTJE GM.1981; ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1981; VOL. 123; PP. 319-324; BIBL. 12 REF.Article

DOUBLE-LAYER EFFECTS IN POTENTIOMETRIC STRIPPING ANALYSISMORTENSEN J; BRITZ D.1981; ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1981; VOL. 131; PP. 159-165; BIBL. 9 REF.Article

EINE NEUE AUSWERTEMETHODE DER ROENTGENFLUORESCENZANALYSE. II: UNTERGRUND UND LINIENUEBERLAGERUNG = UNE NOUVELLE METHODE D'EVALUATION POUR L'ANALYSE PAR FLUORESCENCE RX. II. FOND CONTINU ET RECOUVREMENT DES RAIESSUCHOMEL J; UMLAND F.1980; FRESENIUS Z. ANAL. CHEM.; ISSN 0016-1152; DEU; DA. 1980; VOL. 300; NO 4; PP. 263-266; ABS. ENG; BIBL. 1 REF.Article

DETECTION AU LASER D'ATOMES ISOLESBALYKIN VI; BEKOV GI; LETOKHOV VS et al.1980; USPEHI FIZ. NAUK; ISSN 0042-1294; SUN; DA. 1980; VOL. 132; NO 2; PP. 293-344; BIBL. 3 P.Article

AN IMPROVED METHOD FOR THE DETERMINATION OF MICROSTRUCTURAL PARAMETERS BY DIFFRACTION-PROFILE FOURIER ANALYSISZOCCHI M.1980; ACTA CRYSTALLOGR. SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1980; VOL. 36; NO 2; PP. 164-170; BIBL. 30 REF.Article

PHOTOACOUSTIC SPECTROSCOPY IN GASES BASED ON WAVELENGTH MODULATIONYIP BC; YEUNG ES.1983; ANALYTICAL CHEMISTRY (WASHINGTON); ISSN 0003-2700; USA; DA. 1983; VOL. 55; NO 6; PP. 978-981; BIBL. 24 REF.Article

CORRECTION FOR BACKGROUND ABSORPTION AND STRAY RADIATION IN A.C. MODULATED ZEEMAN ATOMIC ABSORPTION SPECTROMETRYDE LOOS VOLLEBREGT MTC; DE GALAN L.1982; SPECTROCHIM. ACTA, B: AT. SPECTROSC.; ISSN 0584-8547; GBR; DA. 1982; VOL. 37; NO 8; PP. 659-672; BIBL. 17 REF.Article

A GENERAL EQUATION FOR THE BACKGROUND IN ENERGY-DISPERSIVE XRF SPECTRAARINC F.1982; JOURNAL OF RADIOANALYTICAL CHEMISTRY; ISSN 0022-4081; CHE; DA. 1982; VOL. 75; NO 1-2; PP. 245-252; BIBL. 5 REF.Article

DETERMINATION OF SPECIMEN TICKNESS BY CONTINUUM INTEGRATIONWEAVERS BA.1979; MICRON; GBR; DA. 1979; VOL. 10; NO 4; PP. 285-290; BIBL. 18 REF.Article

A SIMPLE PROCEDURE FOR FITTING A BACKGROUND TO A CERTAIN CLASS OF MEASURED SPECTRASTEENSTRUP S.1981; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1981; VOL. 14; NO 4; PP. 226-229; BIBL. 5 REF.Article

BASIC INVESTIGATIONS ON BACKGROUND PROBLEMS IN THE PLATINUM-LOOP METHOD IN COMPARISON TO GRAPHITE-FURNACE AND FLAME ATOMIC-ABSORPTION SPECTROPHOTOMETRYGUCER S; BERNDT H.1981; TALANTA (OXF.); ISSN 0039-9140; GBR; DA. 1981; VOL. 28; NO 5; PP. 334-336; BIBL. 11 REF.Article

ON THE ANALYSIS OF RAMAN SPECTRA BY CURVE RESOLUTION.GANS P; GILL JB.1977; APPL. SPECTROSC.; U.S.A.; DA. 1977; VOL. 31; NO 5; PP. 451-455; BIBL. 30 REF.Article

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