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DISPOSITIF POUR LA SEPARATION DES RAIES SPECTRALES DU FOND CONTINU D'UN RAYONNEMENT INTERFERANTKATSKOV DA; KRUGLIKOVA LP; L'VOV BV et al.1974; ZH. PRIKL. SPEKTROSK., BELORUS. S.S.R.; S.S.S.R.; DA. 1974; VOL. 21; NO 2; PP. 366-371; BIBL. 15 REF.Article

EVALUATION OF DIFFERENTIAL PULSE VOLTAMMETRY AT CARBON ELECTRODESWANG J; FREIHA BA.1983; TALANTA (OXFORD); ISSN 0039-9140; GBR; DA. 1983; VOL. 30; NO 5; PP. 317-322; BIBL. 27 REF.Article

ELIMINATION OF SPECTRAL INTERFERENCES USING ZEEMAN EFFECT BACKGROUND CORRECTIONFERNANDEZ FJ; GIDDINGS R.1982; AT. SPECTROSC.; ISSN 0195-5373; USA; DA. 1982; VOL. 3; NO 3; PP. 61-65; ABS. FRE/GER; BIBL. 6 REF.Article

THE ORIGIN OF SYSTEMATIC ERRORS IN BACKGROUND MEASUREMENTS IN ZEEMAN ATOMIC ABSORPTION SPECTROMETRYMASSMANN H.1982; TALANTA (OXF.); ISSN 0039-9140; GBR; DA. 1982; VOL. 29; NO 11B; PP. 1051-1055; BIBL. 15 REF.Article

THE BACKGROUND INTERNAL FRICTION OF COLD-WORKED IRON SINGLE CRYSTALSNAKAMURA M; SUGENO T.1973; ACTA METALLURG.; E.U.; DA. 1973; VOL. 21; NO 5; PP. 539-545; ABS. FR. ALLEM.; BIBL. 13 REF.Serial Issue

A BACKGROUND EMISSION CORRECTION SYSTEM FOR ATOMIC ABSORPTION SPECTROMETRYDEWALT FG; AMEND JR; WOODRIFF R et al.1981; APPL. SPECTROSC.; ISSN 0003-7028; USA; DA. 1981; VOL. 35; NO 2; PP. 176-181; BIBL. 21 REF.Article

ACCURATE BACKGROUND MONITORING CIRCUIT FOR BC6-EQUIPED VARIAN-TECHTRON AA5 AND AA6 ATOMIC ABSORPTION SPECTROMETERSSIEMER DD.1980; ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1980; VOL. 119; NO 2; PP. 379-382; BIBL. 4 REF.Article

Spectrométrie d'électrons et analyse quantitative des surfaces. Application à l'XPS. Cas des Nickel-Chrome = Quantitative Electron Spectroscopy of Surfaces. XPS analysis. Nickel-Chromium StudiesNoille-Repoux, Monique; Delamare, François.1991, 123 p.Thesis

CHARACTERISTICS OF THE BACKGROUND EMISSION SPECTRUM FROM A MINIATURE INDUCTIVELY-COUPLED PLASMASAVAGE RN; HIEFTJE GM.1981; ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1981; VOL. 123; PP. 319-324; BIBL. 12 REF.Article

DOUBLE-LAYER EFFECTS IN POTENTIOMETRIC STRIPPING ANALYSISMORTENSEN J; BRITZ D.1981; ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1981; VOL. 131; PP. 159-165; BIBL. 9 REF.Article

EINE NEUE AUSWERTEMETHODE DER ROENTGENFLUORESCENZANALYSE. II: UNTERGRUND UND LINIENUEBERLAGERUNG = UNE NOUVELLE METHODE D'EVALUATION POUR L'ANALYSE PAR FLUORESCENCE RX. II. FOND CONTINU ET RECOUVREMENT DES RAIESSUCHOMEL J; UMLAND F.1980; FRESENIUS Z. ANAL. CHEM.; ISSN 0016-1152; DEU; DA. 1980; VOL. 300; NO 4; PP. 263-266; ABS. ENG; BIBL. 1 REF.Article

DETECTION AU LASER D'ATOMES ISOLESBALYKIN VI; BEKOV GI; LETOKHOV VS et al.1980; USPEHI FIZ. NAUK; ISSN 0042-1294; SUN; DA. 1980; VOL. 132; NO 2; PP. 293-344; BIBL. 3 P.Article

AN IMPROVED METHOD FOR THE DETERMINATION OF MICROSTRUCTURAL PARAMETERS BY DIFFRACTION-PROFILE FOURIER ANALYSISZOCCHI M.1980; ACTA CRYSTALLOGR. SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1980; VOL. 36; NO 2; PP. 164-170; BIBL. 30 REF.Article

DETERMINATION OF SPECIMEN TICKNESS BY CONTINUUM INTEGRATIONWEAVERS BA.1979; MICRON; GBR; DA. 1979; VOL. 10; NO 4; PP. 285-290; BIBL. 18 REF.Article

ON THE ANALYSIS OF RAMAN SPECTRA BY CURVE RESOLUTION.GANS P; GILL JB.1977; APPL. SPECTROSC.; U.S.A.; DA. 1977; VOL. 31; NO 5; PP. 451-455; BIBL. 30 REF.Article

A SIMPLE BACKGROUND CORRECTION FOR AES PEAK HEIGHT MEASUREMENTSLABOHM F.1982; SURF. INTERFACE ANAL.; ISSN 0142-2421; GBR; DA. 1982; VOL. 4; NO 5; PP. 194-196; BIBL. 5 REF.Article

LINE ABSORPTION OF MATRIX ELEMENTS AS A BACKGROUND CORRECTION ERROR IN ATOMIC ABSORPTION SPECTROMETRYVAJDA F.1981; ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1981; VOL. 128; PP. 31-43; BIBL. 3 REF.Article

Method of spectral background evaluation using higher energy peaks in X-ray energy analysisCIRONE, R; GIGANTE, G. E; GUALTIERI, G et al.X-ray spectrometry. 1984, Vol 13, Num 3, pp 110-114, issn 0049-8246Article

Elimination of spectral interferences in the determination of Se in nickel-base alloys using Zeeman background correctionFERNANDEZ, F. J; BEATY, M. M.Spectrochimica acta. Part B : Atomic spectroscopy. 1984, Vol 39, Num 2-3, pp 519-523, issn 0584-8547Article

Simultaneous recording of analyte and background absorbance from the Perkin-Elmer Model 5000 spectrometer using the model 3600 data stationDE LOOS-VOLLEBREGT, M. T. C; OOSTERLING, R. A. M; BOUDEWIJN, F. B et al.Atomic spectroscopy. 1983, Vol 4, Num 4, pp 160-162, issn 0195-5373Article

Reduction of background emission in room-temperature phosphorescenceMCALEESE, D. L; DUNLAP, R. B.Analytical chemistry (Washington, DC). 1984, Vol 56, Num 3, pp 600-601, issn 0003-2700Article

Overcoming background contamination in closed loop stripping analysis (CLSA)GROB, K; GROB, G; HABICH, A et al.HRC & CC. Journal of high resolution chromatography & chromatography communications. 1984, Vol 7, Num 6, pp 340-342, issn 0344-7138Article

USER-ORIENTED SOFTWARE FOR DETERMINATION OF THE PRECISION OF SIGNAL-INTEGRATING ANALYTICAL METHODSDUURSMA RPJ; SMIT HC.1981; ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1981; VOL. 133; NO 1; PP. 67-84; BIBL. 8 REF.Article

DETECTION SYSTEMS FOR MULTIELEMENT ANALYSIS WITH INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROSCOPYMCGEORGE SW; SALIN ED.1982; CAN. J. SPECTROSC.; ISSN 0045-5105; CAN; DA. 1982; VOL. 27; NO 2; PP. 25-36; ABS. FRE; BIBL. 38 REF.Article