Interektives System zur Störungserkennung in Vermittlungsanlagen = Système interactif pour la détection des défaillances dans les centraux téléphoniques = Interactive system for failure detection in switching systemsFROHBERG, W.Nachrichtentechnik. Elektronik. 1986, Num 5, pp 171-173, issn 0323-4657Article

A study of field failures of solid tantalum capacitorsHASEGAWA, Y.NEC research & development. 1986, Num 82, pp 124-130, issn 0547-051XArticle

Kenngrössen einer Verteilung für den Zeitabschnitt Frühausfallphase = Caractéristiques d'une distribution pour la période des défaillances précoces = Characteristic parameters of a distribution for the period of early failureKRONJAGER, O.Nachrichtentechnik. Elektronik. 1985, Vol 35, Num 12, pp 474-475, issn 0323-4657Article

Role of miniaturization in the improvement of reliabilityARORA, R. K.Microelectronics and reliability. 1986, Vol 26, Num 4, pp 773-775, issn 0026-2714Article

Longterm performance studies of electronic components at rated electrical stressBORA, J. S.Microelectronics and reliability. 1986, Vol 26, Num 5, pp 989-991, issn 0026-2714Article

Lifetime prediction and design = Conception et prévision de la durée de vieLINDBLOM, Y.Materials science and technology. 1986, Vol 2, Num 3, issn 0267-0836, 309Article

Limited failure population life tests: application to integrated circuit reliabilityMEEKER, W. Q. JR.Technometrics. 1987, Vol 29, Num 1, pp 51-65, issn 0040-1706Article

A survey of problems in telecommunication equipment resulting from chemical contaminationREAGOR, B. T; HUSSELL, C. A.IEEE transactions on components, hybrids, and manufacturing technology. 1986, Vol 9, Num 2, pp 209-214, issn 0148-6411Article

Nonhomogeneous software error detection rate model: data analyses and applicationsYAMADA, S; NARIHISA, H; OHTERA, H et al.RAIRO. Recherche opérationnelle. 1986, Vol 20, Num 1, pp 51-60, issn 0399-0559Article

A resilient token transfer algorithm for mutual exclusion in a distributed systemMURO, S; HASEGAWA, T; KATOH, N et al.Systems, computers, controls. 1985, Vol 16, Num 1, pp 1-8, issn 0096-8765Article

Analyse de la fiabilité de la résistance mécanique des navires. Analyse des statistiques de défaillance par un modèle de fatigueAKITA, Y.Journal of the Society of Naval Architects of Japan. 1985, Vol 157, pp 275-284, issn 0514-8499Article

Electromigration in Al/Si contacts ― induced open-circuit failureCHERN, J. G. J; OLDHAM, W. G; NATHAN CHEUNG et al.I.E.E.E. transactions on electron devices. 1986, Vol 33, Num 9, pp 1256-1262, issn 0018-9383Article

Modeling the critical area in yield forecastsFERRIS-PRABHU, A. V.IEEE journal of solid-state circuits. 1985, Vol 20, Num 4, pp 874-878, issn 0018-9200Article

The reliability of photovoltaic fields as a result of a simulation programmeAMBROSONE, G; CATALANOTTI, S; TROISE, G et al.E.C. Photovoltaic solar energy conference. 6. 1985, pp 377-381Conference Paper

Surface cracking in gold-silicon alloysJOHNSON, D. N; JOHNSON, A. A.Solid-state electronics. 1984, Vol 27, Num 12, pp 1107-1109, issn 0038-1101Article

PV system failures, test techniques, and analysisVERNON RISSER, V.EC photovoltaic solar energy conference. 7. 1987, pp 68-72Conference Paper

Polysilicon capacitor failure during rapid thermal processingMCGRUER, N. E; OIKARI, R. A.I.E.E.E. transactions on electron devices. 1986, Vol 33, Num 7, pp 929-933, issn 0018-9383Article

Prediction and detection of cutting tool failure by modified group method of data handling = Prévision et détection des défaillances des outils de coupe par une méthode de groupe des traitements de donnéesUEMATSU, T; MOHRI, N.International journal of machine tool design & research. 1986, Vol 26, Num 1, pp 69-80, issn 0020-7357Article

Defect size variations and their effect on the critical area of VLSI devicesFERRIS-PRABHU, A. V.IEEE journal of solid-state circuits. 1985, Vol 20, Num 4, pp 878-880, issn 0018-9200Article

Failure of carbon steels as a result of cold plastic deformation = Défaillance des aciers au carbone en tant que résultat d'une déformation plastique à froidPOSPIECH, J.Journal of mechanical working technology. 1985, Vol 12, Num 1, pp 93-114, issn 0378-3804Article

Proportional hazards models and MIL-HDBK-217LANDERS, T. L; KOLARIK, W. J.Microelectronics and reliability. 1986, Vol 26, Num 4, pp 763-771, issn 0026-2714Article

Ray failures in finite ray tracingHAZRA, L. N.Applied optics. 1985, Vol 24, Num 24, pp 4278-4280, issn 0003-6935Article

Unusual operating histories of gas processing and olefins plant columnsKISTER, H. Z; HOWER, T. C.Plant/operations progress. 1987, Vol 6, Num 3, pp 151-161, issn 0278-4513Article

Negation and control in PROLOGNAISH, L.Lecture notes in computer science. 1986, Vol 238, issn 0302-9743, IX-119pSerial Issue

Schwingbruch an Schweissnaht führte zum Einsturz eines Portalkrans = Une rupture par fatigue dans une soudure à l'origine de l'accident arrivé à une grue à portique = Fatigue fracture in weld causes failure of gantry craneENGEL, L.Der Praktiker (Dusseldorf). 1987, Vol 39, Num 6, pp 280-282, issn 0554-9965Article