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A Bayes reliability growth model for a development testing programFARD, N. S; DIETRICH, D. L.IEEE transactions on reliability. 1987, Vol 36, Num 5, pp 568-572, issn 0018-9529Article

A factoring method to calculate reliability for systems of dependent componentsYUAN, J; KAI-LI KO.Reliability engineering & systems safety. 1988, Vol 21, Num 2, pp 107-118, issn 0951-8320Article

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Les besoins des PME en maintenance = The needs of small and medium enterprises in maintenanceLECOUFLE, J.-C.CETIM informations. 1991, Num 124, pp 63-66, issn 0399-0001Article

Market monitoring and mitigation : Impacts on system reliabilityTHOMAS, Robert J.2004 IEEE Power Engineering Society general meeting (Denver CO, 6-10 June 2004). 2004, isbn 0-7803-8465-2, 2Vol, vol 1, 397-402Book Chapter

On the reliability function of a system of components sharing a common environmentCURRIT, A; SINGPURWALLA, N. D.Journal of applied probability. 1988, Vol 25, Num 4, pp 763-771, issn 0021-9002Article

Functions of elementary random variables and their application to system reliabilitySTÖRMER, H.Zeitschrift für Operations Research. 1987, Vol 31, Num 5, pp A173-A188, issn 0373-790XArticle

Reliability concepts under the theory of evidenceDELGADO, M; MORAL, S.European journal of operational research. 1988, Vol 35, Num 1, pp 89-97, issn 0377-2217Article

Comment on: multistate Markov models and structural properties of the transition-rate matrixNAHMAN, J. M.IEEE transactions on reliability. 1987, Vol 36, Num 5, issn 0018-9529, 639Article

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Eine Zerlegungsformel für die Zuverlässigkeit komplizierter technischer Systeme = A decomposition formula for determing the reliability of complex technical systemsBEICHELT, F; TITTMANN, P.Automatisierungstechnik. 1992, Vol 40, Num 3, pp 100-103, issn 0178-2312Article

Improving the lower bound for the reliability when the strength distribution is gamma and the stress distribution is chi-squareJAISINGH, L. R.Microelectronics and reliability. 1988, Vol 28, Num 1, pp 27-41, issn 0026-2714Article

One unit reliability system subject to random shocks and preventive maintenanceABDUL AMEER AL-ALI; MURARI, K.Microelectronics and reliability. 1988, Vol 28, Num 3, pp 373-377, issn 0026-2714Article

On the first failure time of dependent multicomponent reliability systemsSHAKED, M; SHANTHIKUMAR, J. G.Mathematics of operations research. 1988, Vol 13, Num 1, pp 50-64, issn 0364-765XArticle

An algebraic method for reliability calculationsGUPTA, P. P; SHARMA, R. K.Microelectronics and reliability. 1987, Vol 27, Num 1, pp 19-23, issn 0026-2714Article

On a conjecture of Barlow and Proschan concerning reliability boundsZAKHAR MAYMIN.Journal of statistical planning and inference. 1987, Vol 16, Num 3, pp 337-344, issn 0378-3758Article

Reliability of a consecutive-k-out-of-n:F system for Markov-dependent componentsPAPASTAVRIDIS, S; LAMBIRIS, M.IEEE transactions on reliability. 1987, Vol 36, Num 1, pp 78-79, issn 0018-9529Article

A simple markovian method for MTTF calculationDUBI, A; GOLDFELD, A; SASSON, D et al.Microelectronics and reliability. 1987, Vol 27, Num 3, pp 459-462, issn 0026-2714Article

Coherent continuous systems and the generalized functional equation of associativityKING-TIM MAK.Mathematics of operations research. 1987, Vol 12, Num 4, pp 597-625, issn 0364-765XArticle

Test system impact on system availabilityPAU, L. F.IEEE transactions on aerospace and electronic systems. 1987, Vol 23, Num 5, pp 625-633, issn 0018-9251Article

Two recursive algorithms for computing the reliability of k-out-of-n systemsRAI, S; SARJE, A. K; PRASAD, E. V et al.IEEE transactions on reliability. 1987, Vol 36, Num 2, pp 261-265, issn 0018-9529Article

On a two dissimilar unit cold standby system with switchover time and proper initializtaion of connect switchingMOKADDIS, G. S; ELIAS, S. S; LABIB, S. W et al.Microelectronics and reliability. 1987, Vol 27, Num 5, pp 819-822, issn 0026-2714Article

The study of a maintenance float model with gamma failure distributionMADU, C. N.International journal of production research. 1987, Vol 25, Num 9, pp 1305-1323, issn 0020-7543Article