kw.\*:("Fiabilité")
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Availability modeling for the application of manufacturing equipmentBRALL, Aron.Proceedings. Annual Reliability and Maintainability Symposium. 2002, pp 411-416, issn 0149-144X, isbn 0-7803-7348-0, 6 p.Conference Paper
Les différentes étapes de la construction de la fiabilité = The way, step by step, towards reliabilityROSIAUX, C. M.-J.Ingénieurs de l'automobile (Paris). 1994, Num 693, pp 38-41, issn 0020-1200Conference Paper
On reliability theory and its applicationsBERGMAN, B.Scandinavian journal of statistics. 1985, Vol 12, Num 1, pp 1-41, issn 0303-6898Article
Reliability '83: proceedings/4th National reliability conference, [London], July 6-8, 1983National reliability conference. 4. 1983, 2Vol, pag. multConference Proceedings
How to hand-check a symbolic reliability expressionRUSHDI, A. M.IEEE transactions on reliability. 1983, Vol 32, Num 5, pp 402-408, issn 0018-9529Article
Human reliability with probabilistic learning in discrete and continuous tasks: conceptualization and modelingPARK, K. S.Microelectronics and reliability. 1985, Vol 25, Num 1, pp 157-166, issn 0026-2714Article
The ordering of terms in cut-based recursive disjoint productsBUZACOTT, J. A.IEEE transactions on reliability. 1983, Vol 32, Num 5, pp 472-474, issn 0018-9529Article
Mean time to achieve a failure-free requirement with imperfect repairEBRAHIMI, N.IEEE transactions on reliability. 1985, Vol 34, Num 1, pp 34-37, issn 0018-9529Article
Reliability derivation by cutset approachJAMIL, A. T. M; HASANUDDIN AHMAD, S.Microelectronics and reliability. 1985, Vol 25, Num 4, pp 789-795, issn 0026-2714Article
MAP derivation of the minimal serm of a switching function from that of its complementRUSHDI, A. M.Microelectronics and reliability. 1985, Vol 25, Num 6, pp 1055-1065, issn 0026-2714Article
Fitting cost―reliability data in a standard curveKAMAL KUMAR GOVIL.Microelectronics and reliability. 1985, Vol 25, Num 5, pp 913-915, issn 0026-2714Article
Human reliability analysis : need, status, trends and limitationsSWAIN, A. D.Reliability engineering & systems safety. 1990, Vol 29, Num 3, pp 301-313, issn 0951-8320, 13 p.Article
FIABILITE PREVISIONNELLE.BLANC M.sdIN: INITIATION FIABILITE. COURS; ST-MEDARD-EN-JALLES, FR.; 1974; 33160 ST-MEDARD-EN-JALLES; ASSOC. DEV. ENSEIGN. RECH. AUPRES UNIV. INST. RECH. AQUITAINE ANTILLES GUYANE; DA. S.D.; PP. D.1-D.47Conference Paper
On a conjecture of Barlow and Proschan concerning reliability boundsZAKHAR MAYMIN.Journal of statistical planning and inference. 1987, Vol 16, Num 3, pp 337-344, issn 0378-3758Article
Optimal-arrangement & importance of the components in a consecutive-k-out-of-r-from-n:F systemPAPASTAVRIDIS, S. G; SFAKIANAKIS, M. E.IEEE transactions on reliability. 1991, Vol 40, Num 3, pp 277-279, issn 0018-9529Article
A factoring method to calculate reliability for systems of dependent componentsYUAN, J; KAI-LI KO.Reliability engineering & systems safety. 1988, Vol 21, Num 2, pp 107-118, issn 0951-8320Article
Simplified reliabilities for consecutive-k-out-of-n systemsHWANG, F. K.SIAM journal on algebraic and discrete methods. 1986, Vol 7, Num 2, pp 258-264, issn 0196-5212Article
Availability analysis of 3-state systemsKHAN, N. M; ASHOK GUPTA.IEEE transactions on reliability. 1985, Vol 34, Num 1, pp 86-87, issn 0018-9529Article
Reliability bounds for multistate systems with multistate componentsHUDSON, J. C; KAPUR, K. C.Operations research. 1985, Vol 33, Num 1, pp 153-160, issn 0030-364XArticle
Operating and maintenance policies of a service systemFINGER, N; MEHREZ, A.Computers & industrial engineering. 1985, Vol 9, Num 2, pp 135-139, issn 0360-8352Article
Some notes on availability theoryBAXTER, L. A.Microelectronics and reliability. 1985, Vol 25, Num 5, pp 921-926, issn 0026-2714Article
Reliability evaluation of protective system with scheduled and unscheduled maintenanceKOHDA, T; AKINARI, K; KUMAMOTO, H et al.Microelectronics and reliability. 1984, Vol 24, Num 5, pp 957-960, issn 0026-2714Article
Boolean difference techniques for time-sequence and common-cause analysis of fault-treesMORET, B. M. E; THOMASON, M. G.IEEE transactions on reliability. 1984, Vol 33, Num 5, pp 399-405, issn 0018-9529Article
Comments on : improved method of inclusion-exclusion applied to k-out-of-n systems. ReplyLOCKS, M. O; HEIDTMANN, K. D.IEEE transactions on reliability. 1984, Vol 33, Num 4, pp 321-322, issn 0018-9529Article
Multistate reliability modelsEBRAHIMI, N.Naval research logistics quarterly. 1984, Vol 31, Num 4, pp 671-680, issn 0028-1441Article