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Calculations of field ionization in the field ion microscopeDE CASTILHO, C. M. C; KINGHAM, D. R.Surface science. 1986, Vol 173, Num 1, pp 75-96, issn 0039-6028Article

Simulated electron beam trajectories toward a field ion microscopy specimenLARSON, D. J; CAMUS, P. P; KELLY, T. F et al.Applied surface science. 1993, Vol 67, Num 1-4, pp 473-480, issn 0169-4332Conference Paper

Direct observations of the (1×2) surface reconstruction on the Pt(110) plane = Observations directes de la reconstruction de surface (1×2) sur le plan Pt(110)KELLOGG, G. L.Physical review letters. 1985, Vol 55, Num 20, pp 2168-2171, issn 0031-9007Article

Feldionenmikroskopie der Gitterstörungen im Metallkristallen = Microscopie ionique à émission de champ pour l'étude des défauts cristallins dans les cristaux métalliques = Field ion microscopy of lattice defects in metallic crystalsKRAUTZ, E.Optik (Stuttgart). 1987, Vol 77, Num 1, pp 35-38, issn 0030-4026Article

Atom-probe field ion microscopy and applications to surface scienceTSONG, T. T.Surface science. 1994, Vol 299-300, Num 1-3, pp 153-169, issn 0039-6028Article

Simulation of FIM images of precipitation-hardening alloysSANO, N.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 297-302, issn 0169-4332Conference Paper

Theory of electron tunneling in scanning tunneling microscopy and field ion microscopyTSUKADA, M.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 312-321, issn 0169-4332Conference Paper

Composite thin-film characterization by atom probe field ion microscopyMELMED, A. J; CAMUS, P. P.Ultramicroscopy. 1991, Vol 35, Num 3-4, pp 277-287, issn 0304-3991Article

Imaging gas concentration in the field ion microscope: a theoretical analysisDE CASTILHO, C. M. C; KINGHAM, D. R.Surface science. 1988, Vol 204, Num 3, pp 568-586, issn 0039-6028Article

Icosahedral symmetry in a metallic phase observed by field-ion microscopy = Symétrie icosaédrique dans une phase métallique observée par microscopie ionique à effet de champMELMED, A. J; KLEIN, R.Physical review letters. 1986, Vol 56, Num 14, pp 1478-1481, issn 0031-9007Article

Atomic events at lattice steps and clusters: a direct view of crystal growth processesEHRLICH, G.Surface science. 1995, Vol 331-333, pp 865-877, issn 0039-6028, bConference Paper

Lateral and depth scale calibration of the position sensitive atom probeHYDE, J. M; CEREZO, A; SETNA, R. P et al.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 382-391, issn 0169-4332Conference Paper

Negative field ion microscopy of the initial stages of polymerization of tetracyanoethyleneTHEISS, A; RÖLLGEN, F. W.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 307-311, issn 0169-4332Conference Paper

Study of proper conditions for quantitative atom-probe analysisROLANDER, U; ANDREN, H.-O.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 392-402, issn 0169-4332Conference Paper

Methods for a precision measurement of ionic masses and appearance energies using the pulsed-laser time-of-flight atom probeTSONG, T. T; LIOU, Y; MCLANE, S. B et al.Review of scientific instruments. 1984, Vol 55, Num 8, pp 1246-1254, issn 0034-6748Article

Resolution of the field ion microscopeDE CASTILHO, C. M. C; KINGHAM, D. R.Journal of physics. D, Applied physics (Print). 1987, Vol 20, Num 1, pp 116-124, issn 0022-3727Article

Surface segregation and diffusion kinetics study of a Pt-Ir alloy using the time-of-flight atom-probe field ion microscope = Etude de la ségrégation de surface et de la cinétique de diffusion d'un alliage Pt-Ir en utilisant le microscope ionique à effet de champ à sonde atomique à temps de volAHMAD, M; TSONG, T. T.Applied physics letters. 1984, Vol 44, Num 1, pp 40-42, issn 0003-6951Article

IFES'92 International field emission symposiumMILLER, Michael K; KREUZER, H. Jürgen.Applied surface science. 1993, Vol 67, Num 1-4, issn 0169-4332Conference Proceedings

On the full-width-at-half-maximum of field ion energy distributionsERNST, N; BOZDECH, G; SCHMIDT, H et al.Applied surface science. 1993, Vol 67, Num 1-4, pp 111-117, issn 0169-4332Conference Paper

La microscopie ionique analytique des tissus biologiques = Analytical ion microscopy of biological specimensGALLE, P.Annales de physique (Imprimé). 1985, Vol 10, Num 4, pp 287-305, issn 0003-4169Article

EFFECTS OF LOCAL FIELD VARIATIONS ON THE CONTRAST OF A FIELD-ION MICROSCOPEHOMEIER HHH; KINGHAM DR.1983; JOURNAL OF PHYSICS D: APPLIED PHYSICS; ISSN 0022-3727; GBR; DA. 1983; VOL. 16; NO 6; PP. L115-L120; BIBL. 8 REF.Article

Surface reaction kinetics studied with nanoscale lateral resolutionMOORS, Matthieu; VISART DE BOCARME, Thierry; KRUSE, Norbert et al.Catalysis today. 2007, Vol 124, Num 1-2, pp 61-70, issn 0920-5861, 10 p.Conference Paper

FIELD ION MICROSCOPY OF TANTALUM AND NIOBIUM AT LOW RESIDUAL GAS PRESSURESKRAUTZ E; HAIML G.1981; Z. METALLKD.; DEU; DA. 1981-02; VOL. 72; NO 2; PP. 116-119; BIBL. 16 REF.Article

Towards the three-dimensional field ion microscopeVURPILLOT, F; GILBERT, M; DECONIHOUT, B et al.Surface and interface analysis. 2007, Vol 39, Num 2-3, pp 273-277, issn 0142-2421, 5 p.Conference Paper