LONG RANGE INJECTION LASER RADAR.SALATHE R; BOLLETER W; GILGEN H et al.1977; APPL. OPT.; U.S.A.; DA. 1977; VOL. 16; NO 10; PP. 2621-2623; BIBL. 7 REF.Article

Polymerdickfilmtechnologie: kostengünstige Erweiterung der konventionellen Leiterplattenherstellung = Technology of thick polymer films: A profit-earning development of conventional printed circuits manufacturingANDEREGG, F; GILGEN, H.Technische Mitteilungen PTT. 1989, Vol 67, Num 3, pp 108-113, issn 0040-1471, 6 p.Article

Decadal changes in shortwave irradiance at the surface in the period from 1960 to 2000 estimated from Global Energy Balance Archive Data : Global dimming and brighteningGILGEN, H; ROESCH, A; WILD, M et al.Journal of geophysical research. 2010, Vol 115, Num D10, issn 0148-0227, D00D08.1-D00D08.12Article

Regional climate simulation with a high resolution GCM : surface radiative fluxesWILD, M; OHMURA, A; GILGEN, H et al.Climate dynamics. 1995, Vol 11, Num 8, pp 469-486, issn 0930-7575Article

Means and trends of shortwave irradiance at the surface estimated from Global Energy Balance Archive dataGILGEN, H; WILD, M; OHMURA, A et al.Journal of climate. 1998, Vol 11, Num 8, pp 2042-2061, issn 0894-8755Article

Méthodes de mesures optiques par rétrodiffusion = Methodi di misura ottici a retrodiffusione = Optical Reflectometer Measuring Methods with Micrometer ResolutionNOVAK, P; BEAUD, P; HODEL, W et al.Technische Mitteilungen PTT. 1992, Vol 70, Num 4, pp 130-149, issn 0040-1471Article

Assessment of GCM simulated snow albedo using direct observationsROESCH, A; GILGEN, H; WILD, M et al.Climate dynamics. 1999, Vol 15, Num 6, pp 405-418, issn 0930-7575Article

Optische Rückstreu-Messmethoden mit Mikrometer-Auflösung = Optical reflectometer measuring methods with micrometer resolutionNOVAK, R. P; BEAUD, P; HODEL, W et al.Technische Mitteilungen PTT. 1991, Vol 69, Num 10, pp 421-432, issn 0040-1471Article

Waveguiding effects in laser-induced aqueous etching of semiconductorsPODLESNIK, D. V; GILGEN, H. H; OSGOOD, R. M. JR et al.Applied physics letters. 1986, Vol 48, Num 7, pp 496-498, issn 0003-6951Article

Resonant, optical growth of submicrometer metal gratingsCHEN, C. J; GILGEN, H. H; OSGOOD, R. M et al.Optics letters. 1985, Vol 10, Num 4, pp 173-175, issn 0146-9592Article

The distribution of solar energy at the earth's surface as calculated in the ECMWF re-analysisWILD, M; OHMURA, A; GILGEN, H et al.Geophysical research letters. 1998, Vol 25, Num 23, pp 4373-4376, issn 0094-8276Article

Laser generated microstructuresRYTZ-FROIDEVAUX, Y; SALATHE, R. P; GILGEN, H. H et al.Applied physics. A, Solids and surfaces. 1985, Vol 37, Num 3, pp 121-138, issn 0721-7250Article

Photobias effect in laser-controlled etching of InPWILLNER, A. E; PODLESNIK, D. V; GILGEN, H. H et al.Applied physics letters. 1988, Vol 53, Num 13, pp 1198-1200, issn 0003-6951Article

Interaction of deep-ultraviolet laser light with GaAs surfaces in aqueous solutionsPODLESNIK, D. V; GILGEN, H. H; WILLNER, A. E et al.Journal of the Optical Society of America. B, Optical physics (Print). 1986, Vol 3, Num 5, pp 775-783, issn 0740-3224Article

Maskless, chemical etching of submicrometer gratings in single-crystalline GaAsPODLESNIK, D. V; GILGEN, H. H; OSGOOD, R. M. JR et al.Applied physics letters. 1983, Vol 43, Num 12, pp 1083-1085, issn 0003-6951Article

Photodeposition rates of metal from metal alkyls = Vitesses de dépôt photolytique de métal à partir d'alkyles métalliquesKRCHNAVEK, R. R; GILGEN, H. H; CHEN, J. C et al.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1987, Vol 5, Num 1, pp 20-26, issn 0734-211XArticle

Ultraviolet-light-enhanced oxidation of gallium arsenide surfaces studied by X-ray photoelectron and Auger electron spectroscopyYU, C. F; PODLESNIK, D. V; SCHMIDT, M. T et al.Chemical physics letters. 1986, Vol 130, Num 4, pp 301-306, issn 0009-2614Article

Bragg grating characterization by optical low-coherence reflectometryLAMBELET, P; FONJALLAZ, P. Y; LIMBERGER, H. G et al.IEEE photonics technology letters. 1993, Vol 5, Num 5, pp 565-567, issn 1041-1135Article

Optical reflectometry with micrometer resolution for the investigation of integrated optical devicesBEAUD, P; SCHÜTZ, J; HODEL, W et al.IEEE journal of quantum electronics. 1989, Vol 25, Num 4, pp 755-759, issn 0018-9197, 5 p.Article

First global WCRP shortwave surface radiation budget datasetWHITLOCK, C. H; CHARLOCK, T. P; LECROY, S. R et al.Bulletin of the American Meteorological Society. 1995, Vol 76, Num 6, pp 905-922, issn 0003-0007Article

Baseline Surface Radiation Network (BSRN/WCRP) : New precision radiometry for Climate ResearchOHMURA, A; DUTTON, E. G; PHILIPONA, R et al.Bulletin of the American Meteorological Society. 1998, Vol 79, Num 10, pp 2115-2136, issn 0003-0007Article