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ZUR CHEMISCHEN ANALYTIK VON FARBFERNSEHBILDROEHREN = L'ANALYSE CHIMIQUE DES TUBES DE TELEVISION COULEURLANGE J.1983; SILIKATTECHNIK; ISSN 0037-5233; DDR; DA. 1983; VOL. 34; NO 1; PP. 11-14; BIBL. 14 REF.Article

RF SPUTTERING OF ALXIN1-XN THIN FILMSSTAROSTA K.1981; PHYS. STATUS SOLIDI (A), APPL. RES.; DDR; DA. 1981-11; VOL. 68; NO 1; PP. K55-K57; BIBL. 10 REF.Article

DESCRIPTION OF INTERNAL FRICTION BACKGROUND OF GLASSES BY MEANS OF MIGRATION PROCESSES = BESCHREIBUNG DES HINTERGRUNDES DER INNEREN REIBUNG VON GLAESERN MITTELS WANDERUNGSPROZESSE = DESCRIPTION DE L'ARRIERE-PLAN DU FROTTEMENT INTERNE DES VERRES A PARTIR DES PROCESSUS DE MIGRATIONGRAEFE W.1982; PHYS. STATUS SOLIDI (A), APPL. RES.; DDR; DA. 1982-03; VOL. 70; NO 1; PP. 101-108; BIBL. 10 REF.Article

SUPERCONDUCTIVITY OF THIN FILMS OF LEAD, INDIUM, AND TIN PREPARED IN THE PRESENCE OF OXYGENEICHELE R; KERN W; HUEBENER RP et al.1981; APPL. PHYS.; DEU; DA. 1981; VOL. 25; NO 2; PP. 95-104; BIBL. 24 REF.Article

THE DETERMINATION OF WETTABILITY BY HYDROCARBONS OF SMALL PARTICLES BY DEUTERON T1RHO MEASUREMENTWILLIAMS CE; FUNG BM.1982; JOURNAL OF MAGNETIC RESONANCE; ISSN 0022-2364; USA; DA. 1982; VOL. 50; NO 1; PP. 71-80; BIBL. 33 REF.Article

ON MECHANISM OF ELECTRIC CONDUCTION IN COMPOSITE THICK FILMSRUD' BM; AKULOVA LT.1981; POROSHK. METALL. (KIEV); UKR; DA. 1981-07; VOL. 7; PP. 50-52; BIBL. 3 REF.Article

USE OF FORMIC ACID TO OBTAIN COATINGS ON DIELECTRIC MATERIALSFOFANOV GM; SOSNITSKIJ VN; DASHKO LN et al.1981; Z. PRIKL. HIM.; ISSN 0044-4618; SUN; DA. 1981; VOL. 54; NO 8; PP. 1871-1873; BIBL. 12 REF.Article

POTENTIAL DISTRIBUTION ON THE SURFACE OF A THIN CYLINDRICAL SUPERCONDUCTING FILM OF IN-PB ALLOYBOHDZIEWICZ A; KAZIMIERSKI M.1981; PHYS. STATUS SOLIDI (A), APPL. RES.; DDR; DA. 1981-11; VOL. 68; NO 1; PP. K33-K36; BIBL. 5 REF.Article

FLUORIDGETRUEBTES GLAS - EIN WEITERES TESTGLAS FUER DIE CHEMISCHE ANALYSE = VERRE OPACIFIE AU FLUORURE - UN AUTRE VERRE D'ESSAI POUR L'ANALYSE CHIMIQUELANGE J.1981; SILIKATTECHNIK; ISSN 0037-5233; DDR; DA. 1981; VOL. 32; NO 12; PP. 362-363; BIBL. 7 REF.Article

SHEAR STRESS AND ADHESION OF FILM AREAS OF VARIOUS SIZES AND SHAPESRIESENBERG R.1981; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1981-08-16; VOL. 66; NO 2; PP. K93-K96; BIBL. 9 REF.Article

LASER MICROPROBE MASS ANALYSIS OF GLASS MICROPARTICLESSURKYN P; ADAMS F.1982; JOURNAL OF TRACE AND MICROPROBE TECHNIQUES; ISSN 51442X; USA; DA. 1982; VOL. 1; NO 1; PP. 79-114; BIBL. 14 REF.Article

DOSAGE DE L'ANHYDRIDE DE BORE DANS DU CRISTALSVISTUNOVA GP; RYABOVA T YU; TUPITSYNA EV et al.1982; STEKLO KERAM.; ISSN 0131-9582; SUN; DA. 1982; NO 1; PP. 30-31Article

THE OPTICAL PROPERTIES OF DISCONTINUOUS SILVER FILMSMCKENNA WT; WARD L.1981; PHYS. STATUS SOLIDI (A), APPL. RES.; DDR; DA. 1981-11; VOL. 68; NO 1; PP. K11-K14; BIBL. 6 REF.Article

HALL EFFECT IN HIGH-OHMIC ISLAND METAL FILMSVEDENEEV AS; GULYAEV IB; DAREVSKIJ AS et al.1980; FIZ. TVERD. TELA; SUN; DA. 1980-09; VOL. 22; NO 9; PP. 2822-2823; BIBL. 5 REF.Article

DETERMINATION OF LOW SPECIFIC SURFACE AREAS OF MINERALS AND OXIDES BY GAS-SOLID CHROMATOGRAPHYTREMAINE PR; WIKJORD AG; LEBLANC JC et al.1982; CAN. J. CHEM.; ISSN 0008-4042; CAN; DA. 1982; VOL. 60; NO 22; PP. 2859-2862; ABS. FRE; BIBL. 19 REF.Article

INVESTIGATION OF GLASSES USING SURFACE PROFILING BY SPECTROCHEMICAL ANALYSIS OF SPUTTER-INDUCED RADIATION. I: SURFACE PROFILING TECHNIQUE WITH HIGH IN-DEPTH RESOLUTIONBACH H; BAUCKE FGK.1982; JOURNAL OF THE AMERICAN CERAMIC SOCIETY; ISSN 0002-7820; USA; DA. 1982; VOL. 65; NO 11; PP. 527-533; BIBL. 83 REF.Article

INVESTIGATION OF GLASSES USING SURFACE PROFILING BY SPECTROCHEMICAL ANALYSIS OF SPUTTER-INDUCED RADIATION. II: FIELD-DRIVEN FORMATION AND ELECTROCHEMICAL PROPERTIES OF PROTONATED GLASSES CONTAINING VARIOUS PROTON CONCENTRATIONSBAUCKE FGK; BACH H.1982; JOURNAL OF THE AMERICAN CERAMIC SOCIETY; ISSN 0002-7820; USA; DA. 1982; VOL. 65; NO 11; PP. 534-539; BIBL. 38 REF.Article

SPECTROSCOPY OF MOLECULAR MONOLAYERS BY RESONANT SECOND-HARMONIC GENERATIONHEINZ TF; CHEN CK; RICARD D et al.1982; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1982; VOL. 48; NO 7; PP. 478-481; BIBL. 11 REF.Article

SPURENBESTIMMUNG VON LA, CE UND ND IN ANORGANISCHEN MATRICES DURCH MASSENSPEKTROMETRISCHE ISOTOPENVERDUENNUNGSANALYSE = DOSAGE DE TRACES DE LA, CE ET ND DANS DES MATRICES MINERALES PAR ANALYSE PAR DILUTION ISOTOPIQUE ET SPECTROMETRIE DE MASSEHEUMANN KG; TRETTENBACH J.1982; FRESENIUS Z. ANAL. CHEM.; ISSN 0016-1152; DEU; DA. 1982; VOL. 310; NO 1-2; PP. 146-153; ABS. ENG; BIBL. 30 REF.Article

ACTIVATION ANALYSIS OF THALLIUM BY 203TL(N,2N) 202TL REACTION IN NUCLEAR REACTORS = ANALYSE PAR ACTIVATION DU THALLIUM PAR REACTION 203TL(N,2N) 202TL DANS DES REACTEURS NUCLEAIRESCOHEN IM; RESNIZKY SM; BARO GB et al.1982; J. RADIANAL. CHEM.; ISSN 0022-4081; CHE; DA. 1982; VOL. 72; NO 1-2; PP. 451-461; BIBL. 8 REF.; ILL.Conference Paper

ADHESIVE ACTIVITY OF TITANIUM, VANADIUM, CHROMIUM, AND MANGANESE IN ALLOYS WITH GALLIUMNAJDICH YU V; CHUVASHOV YU N; ZHURNAVLEV VS et al.1979; ZH. FIZ. KHIM.; SUN; DA. 1979-09; VOL. 53; NO 9; PP. 2342-2344; BIBL. 5 REF.Article

INFLUENCE DE LA TEMPERATURE SUR LA RELATION ENTRE LES ANGLES DE MOUILLAGE D'UNE SURFACE DE VERRE, FRAICHEMENT ETIREE, ET LA VITESSE DE DEPLACEMENT D'UNE INTERFACE DE 3 PHASESGRIBANOVA EV.1983; KOLLOIDNYJ ZURNAL; ISSN 501549; SUN; DA. 1983; VOL. 45; NO 3; PP. 422-429; ABS. ENG; BIBL. 12 REF.Article

SURFACTANT ADSORPTION DYNAMICSGROW DT; SHAEIWITZ JA.1982; J. COLLOID INTERFACE SCI.; ISSN 0021-9797; USA; DA. 1982; VOL. 86; NO 1; PP. 239-253; BIBL. 27 REF.Article

ETUDE PAR SPECTROSCOPIE IR DE L'OXYDATION PAR CONTACT DU POLYETHYLENEEGORENKOV NI; KUZAVKOV AI; LIN DG et al.1982; KOMPOZICIONNYE POLIMERNYE MATERIALY; ISSN 506877; UKR; DA. 1982; NO 13; PP. 46-53; BIBL. 12 REF.Article

MESURE DES ISOTHERMES D'ADSORPTION PAR CHROMATOGRAPHIEBUSEV SA; LARIONOV OG.1982; Z. FIZ. HIM.; ISSN 0044-4537; SUN; DA. 1982; VOL. 56; NO 5; PP. 1238-1241; BIBL. 10 REF.Article

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