AUGER ELECTRON SPECTROSCOPY OF SOLID SURFACES.GRANT JT.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 133-154; BIBL. 3 P.Conference Paper

COMPARISON OF MG L²,3)MM AUGER CURRENTS USING ELECTRON AND ION EXCITATION.GRANT JT; HOOKER MP.1975; PHYS. LETTERS, A; NETHERL.; DA. 1975; VOL. 54; NO 2; PP. 167-168; BIBL. 8 REF.Article

SCANNING ELECTRON EXCITED AUGER ELECTRON SPECTROSCOPYHAAS TW; GRANT JT.1979; APPL. SURF. SCI.; NLD; DA. 1979; VOL. 2; NO 2; PP. 322-334; BIBL. 20 REF.Article

THE USE OF AUGER ELECTRON SPECTROSCOPY TO CHARACTERIZE THE ADSORPTION OF CO ON TRANSITION METALS.HOOKER MP; GRANT JT.1977; SURF. SCI.; NETHERL.; DA. 1977; VOL. 62; NO 1; PP. 21-30; BIBL. 23 REF.Article

AUGER ELECTRON SPECTROSCOPY STUDIES OF CO ON NI SPECTRAL LINE SHAPES AND QUANTITATIVE ASPECTSHOOKER MP; GRANT JT.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 55; NO 2; PP. 741-746; BIBL. 13 REF.Article

OXYGEN KLL AUGER SPECTRA FROM O₂ AND CO ADSORBED ON NIGRANT JT; HOOKER MP.1976; SOLID STATE COMMUNIC.; G.B.; DA. 1976; VOL. 19; NO 2; PP. 111-113; BIBL. 14 REF.Article

ELECTRON-BEAM-INDUCED DECOMPOSITION OF ION BOMBARDED CALCIUM FLUORIDE SURFACESSTRECKER CL; MODDEMAN WE; GRANT JT et al.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 11; PP. 6921-6927; BIBL. 23 REF.Article

APPEARANCE POTENTIAL SPECTROSCOPY: RELATIVE SIGNAL STRENGTHS FROM 3D TRANSITION METALSGRANT JT; HOOKER MP; HAAS TW et al.1975; SURF. SCI.; NETHERL.; DA. 1975; VOL. 51; NO NO 2; PP. 433-440; BIBL. 9 REF.Article

QUANTITATIVE COMPARISON OF TI AND TIO SURFACES USING AUGER ELECTRON AND SOFT X-RAY APPEARANCE POTENTIAL SPECTROSCOPIESGRANT JT; HAAS TW; HOUSTON JE et al.1974; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1974; VOL. 11; NO 1; PP. 227-230; BIBL. 17 REF.; (20TH NATL SYMP. VAC. SOC. 11TH CONF. NICROBALANCE TECH. PROC.; NEW YORK; 1973)Conference Paper

THE DETERMINATION OF SULFUR ION IMPLANTATION PROFILES IN GAAS USING AUGER ELECTRON SPECTROSCOPYPARK YS; GRANT JT; HAAS TW et al.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 2; PP. 809-812; BIBL. 8 REF.Article

JOINT AUSTRALIAN - FEDERAL REPUBLIC OF GERMANY - UNITED STATES WORKSHOP ON THE COMPARISON OF ELECTRON AND ION BEAM METHODS FOR SURFACE ANALYSISGRANT JT; MACDONALD RJ; TAGLAUER E et al.1982; APPL. SURF. SCI.; ISSN 0378-5963; NLD; DA. 1982; VOL. 13; NO 1-2; PP. 1-3Conference Paper

MULTIPLE INSULATOR LAYERS ON GAAS STUDIED BY AUGER ANALYSISGRANT JT; HARTNAGEL HL; SCHUERMEYER FL et al.1979; INTERNATION. J. ELECTRON.; GBR; DA. 1979; VOL. 46; NO 2; PP. 209-214; BIBL. 9 REF.Article

INTERNATIONAL WORKSHOP ON ELECTRON AND ION BEAM METHODS FOR SURFACE ANALYSIS, HELD AT THE UNIVERSITY OF NEWCASTLE, NEW SOUTH WALES, AUSTRALIA, 23-27 FEBRUARY 1981 = ATELIER INTERNATIONAL SUR LES METHODES PAR FAISCEAU D'ELECTRONS ET PAR FAISCEAU D'IONS, TENU A L'UNIVERSITE DE NEWCASTLE, NOUVELLES-GALLES DU SUD, AUSTRALIE, 23-27 FEVRIER 1981GRANT JT ED; MACDONALD RJ ED; TAGLAUER E ED et al.1982; APPL. SURF. SCI.; ISSN 0378-5963; NLD; DA. 1982; VOL. 13; NO 1-2; 319 P.; BIBL. DISSEM.Conference Paper

QUANTITATIVE AES ANALYSIS OF CU-NI SYSTEMS USING M₁ VV TRANSITIONS (90-110 EV); COMPUTER SIMULATIONGOTO K; ISHIKAWA K; WOLFE RG et al.1979; APPL. SURF. SCI.; NLD; DA. 1979; VOL. 3; NO 2; PP. 211-216; BIBL. 7 REF.Article

AN EASY METHOD TO ACCURATELY ALIGN ION-BOMBARDMENT GUNS FOR DEPTH PROFILING IN AUGER ELECTRON SPECTROSCOPY.SPRINGER RW; HAAS TW; GRANT JT et al.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 9; PP. 1113-1114; BIBL. 3 REF.Article

THE APPLICATION OF TAILORED MODULATION TECHNIQUES TO DEPTH PROFILING WITH AUGER ELECTRON SPECTROSCOPY.GRANT JT; HOOKER MP; SPRINGER RW et al.1976; SURF. SCI.; NETHERL.; DA. 1976; VOL. 60; NO 1; PP. 1-12; BIBL. 17 REF.Article