ON THE INHERENT NOISE OF AN IDEAL TWO-PORT ISOLATORSUTHERLAND AD.1982; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 5; PP. 830-832; BIBL. 2 REF.Article

ELECTRIC FIELD DEPENDENCE OF MOBILITY FLUCTUATION 1/F NOISE IN ELEMENTAL SEMICONDUCTORSJINDAL RP; VAN DER ZIEL A.1981; SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1981; VOL. 24; NO 10; PP. 983-984; BIBL. 5 REF.Article

EXCESS NOISE AND REFIRING PROCESSES IN THICK-FILM RESISTORSPRUDENZIATI M; MORTEN B; MASOERO A et al.1981; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1981; VOL. 14; NO 7; PP. 1355-1362; BIBL. 9 REF.Article

AN ALTERNATE WAY OF LOOKING AT MASER NOISEVAN DER ZIEL A.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 4; PP. 2783-2784; BIBL. 8 REF.Article

RECEPTION QUASI-OPTIMUM DE SIGNAUX AVEC DU BRUITMAZOR YU L.1982; IZV. VYSS. UCEBN. ZAVED., RADIOELEKTRON.; ISSN 0021-3470; SUN; DA. 1982; VOL. 25; NO 4; PP. 36-43; BIBL. 6 REF.Article

DIGITALE BILDVERBESSERUNG VON VERRAUSCHTEN ABTASTERDATEN = RENFORCEMENT DU CONTRASTE DES IMAGES NUMERIQUES DANS LES IMAGES SCANNEREHLERS M; LOHMANN P.1982; BILDMESS. LUFTBILDWES.; ISSN 0006-2421; DEU; DA. 1982; VOL. 50; NO 5; PP. 161-171; ABS. ENG/FRE; BIBL. 10 REF.Article

THEORY OF TRANSPORT NOISE IN SEMICONDUCTORSVAN VLIET KM; MEHTA H.1981; PHYS. STATUS SOLIDI (B), BASIC RES.; ISSN 0370-1972; DDR; DA. 1981; VOL. 106; NO 1; PP. 11-30; BIBL. 30 REF.Article

CONDITIONS DE CONVEXITE DES CARACTERISTIQUES GENERALISEES DES DISPOSITIFS RESOLVANTS LORS DU CONTROLE DE LA FIABILITE D'UNE RECEPTION DE SIGNAUX SUR UN FOND DE BRUITSSINDLER YU B.1982; RADIOTEKH. I ELEKTRON.; SUN; DA. 1982; VOL. 27; NO 3; PP. 438-446; BIBL. 17 REF.Article

ON MOBILITY FLUCTUATIONS IN L/F NOISEVAN VLIET KM; ZIJLSTRA RJJ.1981; PHYSICA B+C; ISSN 0378-4363; NLD; DA. 1981; VOL. 111; NO 2-3; PP. 321-322; BIBL. 5 REF.Article

NOISE MEASUREMENTS ON PHOTO AVALANCHE DIODESGONG J; VAN VLIET KM; SUTHERLAND AD et al.1981; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1981; VOL. 63; NO 2; PP. 445-460; ABS. GER; BIBL. 16 REF.Article

BRUITS DE LUMINESCENCE DANS DES DIODES LUMINESCENTES AU GAL A 2 BANDESPOTEMKIN VV; MAMONTOV YU M.1982; IZV. VYSS. NCEBN. ZAVED., RADIOFIZ.; ISSN 0021-3462; SUN; DA. 1982; VOL. 25; NO 4; PP. 461-465; ABS. ENG; BIBL. 5 REF.Article

NOISE IN AN ALGAAS SEMICONDUCTOR LASER AMPLIFIERMUKAI T; YAMAMOTO Y.1982; IEEE J. QUANTUM ELECTRON.; ISSN 0018-9197; USA; DA. 1982; VOL. 18; NO 4; PP. 564-575; BIBL. 25 REF.Article

PARAMETER FLUCTUATIONS AND LOW FREQUENCY NOISE IN JOSEPHSON JUNCTION DEVICESTESCHE CD.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 41; NO 1; PP. 99-100; BIBL. 8 REF.Article

RECURSIVE KALMAN WINDOW APPROACH TO IMAGE RESTORATIONDIKSHIT SS.1982; IEEE TRANS. ACOUST. SPEECH SIGNAL PROCESS.; ISSN 0096-3518; USA; DA. 1982; VOL. 30; NO 2; PP. 125-140; BIBL. 16 REF.Article

ROBUST DETECTION OF KNOWN SIGNALS IN ASYMMETRIC NOISEKASSAM SA; MOUSTAKIDES G; JUNG GIL SHIN et al.1982; IEEE TRANS. INF. THEORY; ISSN 0018-9448; USA; DA. 1982; VOL. 28; NO 1; PP. 84-91; BIBL. 21 REF.Article

COMPARISON OF TWO 1/F NOISE MODELS IN MOSFETSPARK HS; VAN DER ZIEL A; LIU ST et al.1982; SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1982; VOL. 25; NO 3; PP. 213-217; BIBL. 15 REF.Article

MEASURING THE QUANTUM CORRECTION AT ZERO BIAS IN METAL-OXIDE-METAL DIODE NOISEVAN DER ZIEL A; SUTHERLAND AD.1982; IEEE J. QUANTUM ELECTRON.; ISSN 0018-9197; USA; DA. 1982; VOL. 18; NO 1; PP. 17-19; BIBL. 3 REF.Article

FILTRAGE DES BRUITS PAR UNE BOUCLE D'ACCORD AUTOMATIQUE EN PHASEBLATOV VV.1982; RADIOTEKH. I ELEKTRON.; SUN; DA. 1982; VOL. 27; NO 4; PP. 737-741; BIBL. 6 REF.Article

FILTRAGE OPTIMUM DES SIGNAUX ET COMPENSATION DES BRUITSKOTOUSOV AS.1982; RADIOTEKH. I ELEKTRON.; SUN; DA. 1982; VOL. 27; NO 4; PP. 742-745; BIBL. 4 REF.Article

TRANSMISSION D'UNE FREQUENCE ETALON LE LONG D'UN CANAL DE COMMUNICATION CONTENANT UN CABLE GUIDE DE LUMIEREBUDKIN LA; MOROZOV VP; PIKHTELEV AI et al.1982; RADIOTEKH. I ELEKTRON.; SUN; DA. 1982; VOL. 27; NO 4; PP. 813-819; BIBL. 16 REF.Article

RESISTIVE-GATE-INDUCED THERMAL NOISE IN IGFET'STHORNBER KK.1981; IEEE J. SOLID-STATE CIRCUITS; ISSN 0018-9200; USA; DA. 1981; VOL. 16; NO 4; PP. 414-415; BIBL. 3 REF.Article

LOW FREQUENCY NOISE PHYSICAL ANALYSIS FOR THE IMPROVEMENT OF THE SPECTRAL PURITY OF GAAS FETS OSCILLATORSGRAFFEUIL J; TANTRARONGROJ K; SAUTEREAU JF et al.1982; SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1982; VOL. 25; NO 5; PP. 367-374; BIBL. 15 REF.Article

NOISE AND DISTORTION CHARACTERISTICS OF SEMICONDUCTOR LASERS IN OPTICAL FIBER COMMUNICATION SYSTEMSPETERMANN K; ARNOLD G.1982; IEEE J. QUANTUM ELECTRON.; ISSN 0018-9197; USA; DA. 1982; VOL. 18; NO 4; PP. 543-555; BIBL. 75 REF.Article

THE EXACT NOISE FIGURE OF AMPLIFIERS WITH PARALLEL FEEDBACK AND LOSSY MATCHING CIRCUITSNICLAS KB.1982; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 5; PP. 832-835; BIBL. 11 REF.Article

IMMUNITE AUX BRUITS D'UN SYSTEME DE COMMUNICATION AVEC PREVISION LORS DE LA MODIFICATION DE LA STRUCTURE DE PHASE DU SIGNALSUSLONOV SA.1982; IZV. VYSS. UCEBN. ZAVED., RADIOELEKTRON.; ISSN 0021-3470; SUN; DA. 1982; VOL. 25; NO 4; PP. 4-11; BIBL. 8 REF.Article