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Results 1 to 25 of 72

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Nanocrystalline diamond filmsGRUEN, D. M.Annual review of materials science. 1999, Vol 29, pp 211-259, issn 0084-6600Article

Emission, ground, and excited state absorption spectroscopy of Cr2 isolated in Ar and Kr matricesPELLIN, M. J; GRUEN, D. M.The Journal of chemical physics. 1983, Vol 79, Num 12, pp 5887-5893, issn 0021-9606Article

Structural, optical, and electronic properties of nanocrystalline and ultrananocrystalline diamond thin filmsACHATZ, P; GARRIDO, J. A; WILLIAMS, O. A et al.Physica status solidi. A, Applications and materials science (Print). 2007, Vol 204, Num 9, pp 2874-2880, issn 1862-6300, 7 p.Conference Paper

Structural and chemical characterisation of soot particles formed in Ar/H2/CH4 microwave discharges during nanocrystalline diamond film synthesisAGGADI, N; ARNAS, C; BENEDIC, F et al.Diamond and related materials. 2006, Vol 15, Num 4-8, pp 908-912, issn 0925-9635, 5 p.Conference Paper

Ion beam deposition and surface characterization of thin multi-component oxide films during growthKRAUSS, A. R; IM, J; SMENTKOWSKI, V et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 1998, Vol 253, Num 1-2, pp 221-233, issn 0921-5093Conference Paper

Thermostability and decomposition of the (Bi,Pb)2Sr2Ca2Cu3O10 phase in silver-clad tapesLUO, J. S; MERCHANT, N; MARONI, V. A et al.Journal of applied physics. 1992, Vol 72, Num 6, pp 2385-2389, issn 0021-8979Article

First easily reproduced solution-phase synthesis and confirmation of superconductivity in the fullerene KxC60 (Tc = 18.0 ± 0.1 K)HAU WANG, H; KINI, A. M; WELP, U et al.Inorganic chemistry (Print). 1991, Vol 30, Num 14, pp 2838-2839, issn 0020-1669Article

Triplet states of fullerenes C60 and C70 : electron paramagnetic resonance spectra, photophysics, and electronic structuresWASIELEWSKI, M. R; O'NEIL, M. P; LYKKE, K. R et al.Journal of the American Chemical Society. 1991, Vol 113, Num 7, pp 2774-2776, issn 0002-7863Article

Resonance ionization mass spectrometry of sputtered osmium and rhenium atomsBLUM, J. D; PELLIN, M. J; CALAWAY, W. F et al.Analytical chemistry (Washington, DC). 1990, Vol 62, Num 2, pp 209-214, issn 0003-2700, 6 p.Article

Isotope shifts of Zn neutral atoms measured by two-photon doppler-free laser-induced fluorescence spectroscopyARLINGHAUS, H. F; CALAWAY, W. F; YOUNG, C. E et al.Vacuum. 1990, Vol 41, Num 1-3, pp 204-206, issn 0042-207X, 3 p.Conference Paper

Ion-dose dependence of the sputtering yield on Ru(0001) at very low fluences = Variation en fonction de la quantité d'ion du rendement de pulvérisation de Ru(0001) à très basses fluencesBURNETT, J. W; PELLIN, M. J; CALAWAY, W. F et al.Physical review letters. 1989, Vol 63, Num 5, pp 562-565, issn 0031-9007Article

Low temperature electron spin resonance investigation of ultrananocrystalline diamond films as a function of nitrogen contentROVERE, M; PORRO, S; MUSSO, S et al.Diamond and related materials. 2006, Vol 15, Num 11-12, pp 1913-1916, issn 0925-9635, 4 p.Conference Paper

Ultra-nano-crystalline/single crystal diamond heterostructure diodeZIMMERMANN, T; KUBOVIC, M; DENISENKO, A et al.Diamond and related materials. 2005, Vol 14, Num 3-7, pp 416-420, issn 0925-9635, 5 p.Conference Paper

Charge-based deep level transient spectroscopy of undoped and nitrogen-doped ultrananocrystalline diamond filmsPOLYAKOV, V. I; RUKOVISHNIKOV, A. I; ROSSUKANYI, N. M et al.Diamond and related materials. 2003, Vol 12, Num 10-11, pp 1776-1782, issn 0925-9635, 7 p.Article

Atmosphere influence on in-situ ion beam analysis of thin film growthYUPING LIN; KRAUSS, A. R; CHANG, R. P. H et al.Thin solid films. 1994, Vol 253, Num 1-2, pp 247-253, issn 0040-6090Conference Paper

Kinetics and mechanism of the (Bl,Pb)2Sr2Ca2Cu3O10 formation reaction in silver-sheathed wiresLUO, J. S; MERCHANT, N; MARONI, V. A et al.Applied superconductivity. 1993, Vol 1, Num 1-2, pp 101-107, issn 0964-1807Conference Paper

Fast one-step separation and purification of buckminsterfullerene, C60, from carbon sootCHATTERJEE, K; PARKER, D. H; WURZ, P et al.Journal of organic chemistry. 1992, Vol 57, Num 11, pp 3253-3254, issn 0022-3263Article

Characterization of fullerenes by laser-based mass spectrometryWURZ, P; LYKKE, K. R; PELLIN, M. P et al.Vacuum. 1992, Vol 43, Num 5-7, pp 381-385, issn 0042-207XConference Paper

Computer-controlled ion beam deposition systems for high Tc superconductor and other multi-component oxide thin films and layered structuresKRAUSS, A. R; AUCIELLO, O; KINGON, A. I et al.Applied surface science. 1990, Vol 46, Num 1-4, pp 67-73, issn 0169-4332, 7 p.Conference Paper

Surface compositional and topographical changes resulting from excimer laser impacting on YBa2Cu3O7 single phase superconductorsAUCIELLO, O; KRAUSS, A. R; SANTIAGO-AVILES, J et al.Applied physics letters. 1988, Vol 52, Num 3, pp 239-241, issn 0003-6951Article

Synergistic sputtering properties of binary alloys = Propriétés synergiques de pulvérisation des alliages binairesKRAUSS, A. R; DEWALD, A. B; GRUEN, D. M et al.Radiation effects. 1985, Vol 89, Num 1-2, pp 129-148, issn 0033-7579Conference Paper

A new diamond based heterostructure diodeKOHN, E; DENISENKO, A; KUBOVIC, M et al.Semiconductor science and technology. 2006, Vol 21, Num 4, issn 0268-1242, L32-L35Article

Mechanical properties of ultrananocrystalline diamond thin films relevant to MEMS/NEMS devicesESPINOSA, H. D; PROROK, B. C; PENG, B et al.Experimental mechanics. 2003, Vol 43, Num 3, pp 256-268, issn 0014-4851, 13 p.Article

Characterization of Ni on Si wafers : comparison of surface analysis techniquesCALAWAY, W. F; COON, S. R; PELLIN, M. J et al.Surface and interface analysis. 1994, Vol 21, Num 2, pp 131-137, issn 0142-2421Conference Paper

Velocity distribution and yield measurements of Fe ejected from FeS2 during ion bombardmentNIKZAD, S; CALAWAY, W. F; YOUNG, C. E et al.Physical review. B, Condensed matter. 1992, Vol 45, Num 18, pp 10255-10263, issn 0163-1829Article

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