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Gallium nitride materials and devices V (25-28 January 2010, San Francisco, California, United States)Chyi, Jen-Inn.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7602, issn 0277-786X, isbn 0-8194-7998-5 978-0-8194-7998-3, 1Vol, various pagings, isbn 0-8194-7998-5 978-0-8194-7998-3Conference Proceedings

Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities aloneJIANWEI MIAO; NISHINO, Yoshinori; KOHMURA, Yoshiki et al.Physical review letters. 2005, Vol 95, Num 8, issn 0031-9007, 085503-1-085503-4Article

Promising composite die-bonding materials for high-power GaN-based LED applicationsHORNG, Ray-Hua; HONG, Jhih-Sin; TSAI, Yu-Li et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7602, issn 0277-786X, isbn 0-8194-7998-5 978-0-8194-7998-3, 1Vol, 76021E.1-76021E.9Conference Paper

Growth of self-standing GaN substratesLEE, Hyun-Jae; FUJII, Katsushi; GOTO, Takenari et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7602, issn 0277-786X, isbn 0-8194-7998-5 978-0-8194-7998-3, 1Vol, 760202.1-760202.8Conference Paper

GaN thin film fabrication by reaction of laser evaporated Ga and GaAs in NH3 atmosphereDI PALMA, T. M; TEGHIL, R; MAROTTA, V et al.Applied surface science. 1998, Vol 127-29, pp 350-354, issn 0169-4332Conference Paper

Highly reliable blue-violet inner stripe laser diodes using planar regrowth of AlGaN/GaN superlattice cladding layerFUKUDA, K; KOHMOTO, S; MATSUDATE, M et al.Physica status solidi. A, Applications and materials science (Print). 2007, Vol 204, Num 6, pp 2094-2097, issn 1862-6300, 4 p.Conference Paper

Analytical Calculation of the Quantum 1/f Coherence Parameter for HFETsHANDEL, Peter H; SHERIF, Taher S.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7602, issn 0277-786X, isbn 0-8194-7998-5 978-0-8194-7998-3, 1Vol, 76020N.1-76020N.7Conference Paper

Momentum selectivity and anisotropy effects in the nitrogen K-edge resonant inelastic x-ray scattering from GaNSTROCOV, V. N; SCHMITT, T; RUBENSSON, J.-E et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 8, pp 085221.1-085221.9, issn 1098-0121Article

Initial stages of the adsorption of Sc and ScN thin films on GaN(0001): First principles calculationsGUERRERO-SANCHEZ, J; COCOLETZI, Gregorio H; RIVAS-SILVA, J. F et al.Applied surface science. 2013, Vol 268, pp 16-21, issn 0169-4332, 6 p.Article

Nanoindentation characterization of GaN epilayers on A-plane sapphire substratesLIN, Meng-Hung; WEN, Hua-Chiang; HUANG, Chih-Yung et al.Applied surface science. 2010, Vol 256, Num 11, pp 3464-3467, issn 0169-4332, 4 p.Article

HEAT CAPACITY OF CRYSTALLINE GaNZIEBORAK-TOMASZKIEWICZ, Iwona; UTZIG, Ewa; GIERYCZ, P et al.Journal of thermal analysis and calorimetry. 2008, Vol 91, Num 1, pp 329-332, issn 1388-6150, 4 p.Article

Investigation of phonon-assisted photoluminescence in wurtzite GaN epilayerWEI LIU; LI, M. F; XU, S.-J et al.SPIE proceedings series. 1998, pp 27-34, isbn 0-8194-2873-6Conference Paper

Preparation and characterization of GaN films by radio frequency magnetron sputtering and carbonized-reaction techniqueZHANG, C. G; CHEN, W. D; BIAN, L. F et al.Applied surface science. 2006, Vol 252, Num 6, pp 2153-2158, issn 0169-4332, 6 p.Article

Effect of annealing on Ni/GaN(0001) contact morphologyGRODZICKI, M; MAZUR, P; ZUBER, S et al.Applied surface science. 2014, Vol 304, pp 24-28, issn 0169-4332, 5 p.Conference Paper

Covalent attachment of a peptide to the surface of gallium nitrideMAKOWSKI, Matthew S; ZEMLYANOV, Dmitry Y; CANTER, Jamie M et al.Surface science. 2011, Vol 605, Num 15-16, pp 1466-1475, issn 0039-6028, 10 p.Article

Formation of amine groups on the surface of GaN: A method for direct biofunctionalizationSTINE, R; SIMPKINS, B. S; MULVANEY, S. P et al.Applied surface science. 2010, Vol 256, Num 13, pp 4171-4175, issn 0169-4332, 5 p.Article

Fabrication of microchannels in single-crystal GaN by wet-chemical-assisted femtosecond-laser ablationNAKASHIMA, Seisuke; SUGIOKA, Koji; MIDORIKAWA, Katsumi et al.Applied surface science. 2009, Vol 255, Num 24, pp 9770-9774, issn 0169-4332, 5 p.Conference Paper

Formation of VNH and MgVNH in p-type GaN(Mg,H)WRIGHT, A. F; MYERS, S. M; SANATI, M et al.Physica. B, Condensed matter. 2006, Vol 376-77, pp 477-481, issn 0921-4526, 5 p.Conference Paper

Growth shape control of group-III nitrides by selective area MOVPEKOBAYASHI, N; AKASAKA, T; ANDO, S et al.SPIE proceedings series. 1998, pp 2-6, isbn 0-8194-2873-6Conference Paper

Yellow photoluminescence in MOCVD-grown n-type GaNSCHUBERT, E. F; GRIESHABER, W; BOUTROS, K. S et al.SPIE proceedings series. 1998, pp 59-68, isbn 0-8194-2718-7Conference Paper

High-fluence hyperthermal ion irradiation of gallium nitride surfaces at elevated temperaturesFINZEL, A; GERLACH, J. W; LORBEER, J et al.Applied surface science. 2014, Vol 317, pp 811-817, issn 0169-4332, 7 p.Article

Polymer/porous GaN bulk heterojunction and its optoelectronic propertyHU, Li-Feng; WANG, Feng-Xia; DENG, Feng-Xiang et al.Applied surface science. 2014, Vol 314, pp 464-467, issn 0169-4332, 4 p.Article

Dissociative adsorption of ammonia on the ZrB2(0001) surfaceMANANDHAR, Kedar; WALKOSZ, Weronika; TRENARY, Michael et al.Surface science. 2013, Vol 615, pp 110-118, issn 0039-6028, 9 p.Article

Aqueous Stability of Ga- and N-Polar Gallium NitrideFOSTER, Corey M; COLLAZO, Ramon; SITAR, Zlatko et al.Langmuir. 2013, Vol 29, Num 1, pp 216-220, issn 0743-7463, 5 p.Article

Gallium nitride materials and devices VI (24-27 January 2011, San Francisco, California, United States)Chyi, Jen-Inn.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7939, issn 0277-786X, isbn 978-0-8194-8476-5, 1 vol, isbn 978-0-8194-8476-5Conference Proceedings

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