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37th European Solid-State Device Research Conference (ESSDERC'07)SCHMITZ, Jurriaan; THEWES, Roland.Solid-state electronics. 2008, Vol 52, Num 9, issn 0038-1101, 211 p.Conference Proceedings

Bridging the business model gap between the semiconductor industry and the automotive industry with respect to quality and reliabilityDE JONG, M; FREEMAN, D.Microelectronics and reliability. 2008, Vol 48, Num 8-9, pp 1112-1113, issn 0026-2714, 2 p.Conference Paper

Diamonds in the Rough: Key Performance Indicators for Reticles and Design SetsACKMANN, Paul.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7122, issn 0277-786X, isbn 978-0-8194-7355-4 0-8194-7355-3, 71222M.1-71222M.17, 2Conference Paper

ESSCIRC 2006KAISER, Andreas; RUSU, Stefan.IEEE journal of solid-state circuits. 2007, Vol 42, Num 7, issn 0018-9200, 175 p.Conference Proceedings

Factory cycle-time prediction with a data-mining approachBACKUS, Phillip; JANAKIRAM, Mani; MOWZOON, Shahin et al.IEEE transactions on semiconductor manufacturing. 2006, Vol 19, Num 2, pp 252-258, issn 0894-6507, 7 p.Article

Just-in-time adaptive disturbance estimation for run-to-run control of semiconductor processesFIRTH, Stacy K; CAMPBELL, W. Jarrett; TOPRAC, Anthony et al.IEEE transactions on semiconductor manufacturing. 2006, Vol 19, Num 3, pp 298-315, issn 0894-6507, 18 p.Article

Reticle enhancement verification for the 65nm and 45nm nodesLUCAS, Kevin; PATTERSON, Kyle; BOONE, Robert et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 61560R.1-61560R.12, issn 0277-786X, isbn 0-8194-6199-7, 1VolConference Paper

Utility mjodel for on-demand digital contentSUBRAMANYA, S. R; YI, Byung K.Computer (Long Beach, CA). 2005, Vol 38, Num 6, pp 95-98, issn 0018-9162, 4 p.Article

SQUID-based simultaneous detection of NMR and biomagnetic signals at ultra-low magnetic fieldsESPY, Michelle A; MATLACHOV, Andrei N; VOLEGOV, Petr L et al.IEEE transactions on applied superconductivity. 2005, Vol 15, Num 2, pp 635-639, issn 1051-8223, 5 p., 1Conference Paper

Organizational and methodical aspects of training of specialists in semiconductor quantum electronicsKARIKH, Evgenii D; MANAK, Ivan S; WOJCIK, Waldemar et al.SPIE proceedings series. 2004, pp 432-434, isbn 0-8194-5525-3, 3 p.Conference Paper

Recent research developments in electronics (Vol. 2 (2004) )Pandalai, S. G.Recent research developments in electronics. 2004, isbn 81-7895-151-7, 96 p., isbn 81-7895-151-7Book

High performance devices (proceedings of the 2004 IEEE Lester Eastman conference on high performance devices)IEEE Lester Eastman conference on high performance devices. 2004, isbn 981-256-196-X, 1Vol, XVII-295 p, isbn 981-256-196-XConference Proceedings

Improving supply chain management : A model for collaborative quality controlTSAL, Timothy P; WANG, Faa-Ching.IEEE / SEMI advanced semiconductor manufacturing conference. 2004, pp 36-42, isbn 0-7803-8312-5, 1Vol, 7 p.Conference Paper

Fifth International Caracas Conference on Devices, Circuits, and Systems (ICCDCS 2004)IEEE International Caracas Conference on Devices, Circuits, and Systems. 2004, isbn 0-7803-8777-5, 1Vol, 357 p., isbn 0-7803-8777-5Conference Proceedings

Implementing a quality system for a manufactureless semiconductor companyMCDONALD, Mary; MADDEN, Michael.SPIE proceedings series. 2003, pp 423-428, isbn 0-8194-5189-4, 6 p.Conference Paper

Design, coordination and control of hybrid factories: research issues from an exploratory field studyDOERR, Ken; MAGAZINE, Michael J.Soldering & surface mount technology. 2001, Vol 13, Num 1, pp 31-38, issn 0954-0911Article

Nanotechnologies : enjeu du futur = Nanotechnologies: a stake in the futureHESTO, Patrice.Essais industriels. 2001, Num 15, pp 2-8, issn 1290-0206Article

Undergraduate electromagnetics laboratory : An invaluable part of the learning process : Electrical and computer engineering educationULABY, F. T; HAUCK, B. L.Proceedings of the IEEE. 2000, Vol 88, Num 1, pp 55-62, issn 0018-9219Article

2000 International Symposium on Microelectronics: Environment friendly technology for mobile machinesTSUNOI, Kazuhisa; IKETAKI, Kenji.SPIE proceedings series. 2000, pp 275-280, isbn 0-930815-62-9Conference Paper

Elektronik im Kraftfahrzeug : ein Beitrag zur Aufrechterhaltung der Mobilität = Electronic systems for vehicles : a contribution to maintain mobilityDAIS, S.VDI-Berichte. 2000, pp 3-15, issn 0083-5560, isbn 3-18-091547-1Conference Paper

Massnahmen zur Steigerung der Innovationsgeschwindigkeit in der Automobilelektronik, ein Vergleich mit der Computer-industrie = Measures to improve the innovation speed in the automotive electronics, a comparison with the computer industryTEEPE, G.VDI-Berichte. 2000, pp 439-446, issn 0083-5560, isbn 3-18-091547-1Conference Paper

Microelectronics and photonics : the futureSUHIR, E.Microelectronics journal. 2000, Vol 31, Num 11-12, pp 839-851, issn 0959-8324Conference Paper

Recycling system for spent copper surface cleanerNAKAMURA, S.Transactions of the Institute of Metal Finishing. 2000, Vol 78, pp B15-B17, issn 0020-2967, 2Conference Paper

An interactive learning environment for VLSI design : Electrical and computer engineering educationALLEN, J; TERMAN, C. J.Proceedings of the IEEE. 2000, Vol 88, Num 1, pp 96-106, issn 0018-9219Article

Innovating adaptive and neural systems instruction with interactive electronic books : Electrical and computer engineering educationPRINCIPE, J. C; EULIANO, N. R; LEFEBVRE, W. C et al.Proceedings of the IEEE. 2000, Vol 88, Num 1, pp 81-95, issn 0018-9219Article

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