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HIGH ELECTRIC FIELD EFFECTS AND PERMITTIVITY CHANGES IN NON-POLAR LIQUIDSHELLEMANS L; DE MAEYER M.1982; FARADAY TRANS. 2; ISSN 0300-9238; GBR; DA. 1982; VOL. 78; NO 3; PP. 401-416; BIBL. 29 REF.Article

ABSORPTION AND DISPERSION OF THE FIELD INDUCED DIELECTRIC INCREMENT IN CAPROLACTAM-CYCLOHEXANE SOLUTIONS.HELLEMANS L; DE MAEYER L.1975; J. CHEM. PHYS.; U.S.A.; DA. 1975; VOL. 63; NO 8; PP. 3490-3498; BIBL. 29 REF.Article

CONSISTENT FORCE FIELD CALCULATIONS ON THE GEOMETRY OF TRIETHYLAMINEROBIEN W; HELLEMANS L; WOLSCHANN P et al.1980; MONATSH. CHEM.; ISSN 0026-9247; AUT; DA. 1980; VOL. 111; NO 3; PP. 779-782; ABS. GER; BIBL. 12 REF.Article

FIELD DISSOCIATION EFFECT, CHEMICAL RELAXATION, AND CONDUCTANCE OF TETRABUTYLAMMONIUM PICRATE ION PAIRS IN DIPHENYL ETHERNAUWELAERS F; HELLEMANS L; PERSOONS A et al.1976; J. PHYS. CHEM.; U.S.A.; DA. 1976; VOL. 80; NO 7; PP. 767-775; BIBL. 22 REF.Article

The non-linear dielectric effect in xenon and in other non-polar liquidsHELLEMANS, L; DE MAEYER, M.Chemical physics letters. 1988, Vol 146, Num 6, pp 609-614, issn 0009-2614Article

On the relation of the non-linear dielectric effect to the Kerr effect: closing a GapHELLEMANS, L; DE MAEYER, L.Chemical physics letters. 1986, Vol 129, Num 3, pp 262-268, issn 0009-2614Article

Chemical relaxation of cholesterol aggregation processes in carbon tetrachlorideJADZYN, J; HELLEMANS, L.Berichte der Bunsen-Gesellschaft. 1993, Vol 97, Num 2, pp 205-210, issn 0940-483XArticle

Improved algorithm for the discrete Fourier transformFROEYEN, M; HELLEMANS, L.Review of scientific instruments. 1985, Vol 56, Num 12, pp 2325-2327, issn 0034-6748Article

Nonlinear dielectric relaxation due to chemical rate processes in cholesterol solutionsJADZYN, J; HELLEMANS, L.Acta physica Polonica. A. 1985, Vol 67, Num 6, pp 1093-1109, issn 0587-4246Article

Imaging uremic red blood cells with the atomic force microscopeZACHEE, P; BOOGAERTS, M; SNAUWAERT, J et al.American journal of nephrology. 1994, Vol 14, Num 3, pp 197-200, issn 0250-8095Article

Micromechanical deformation and recovery processes of nylon-6/rubber Thermoplastic vulcanizates as studied by atomic force microscopy and transmission electron microscopyODERKERK, J; DE SCHAETZEN, G; GODERIS, B et al.Macromolecules. 2002, Vol 35, Num 17, pp 6623-6629, issn 0024-9297Article

Use of the synthetic superoxide dismutase/catalase mimetic EUK-134 to compensate for seasonal antioxidant deficiency by reducing pre-existing lipid peroxides at the human skin surfaceDECLERCQ, L; SENTE, I; HELLEMANS, L et al.International journal of cosmetic science. 2004, Vol 26, Num 5, pp 255-263, issn 0142-5463, 9 p.Article

Growth of high crystalline quality thin epitaxial CeO2 films on (1102) sapphireFRÖHLICH, K; MACHAJDIK, D; HELLEMANS, L et al.Journal de physique. IV. 1999, Vol 9, Num 8, pp Pr8.341-Pr8.347, issn 1155-4339, 1Conference Paper

Imaging red blood cells with the atomic force microscopeZACHEE, P; SNAUWAERT, J; VANDENBERGHE, P et al.British journal of haematology. 1996, Vol 95, Num 3, pp 472-481, issn 0007-1048Article

Nonlinear dielectric relaxation in dipolar systemsKEDZIORA, P; JADZYN, J; HELLEMANS, L et al.SPIE proceedings series. 1999, pp 201-206, isbn 0-8194-3643-7Conference Paper

Surface quality of epitaxial CeO2 thin films grown on sapphire by aerosol MOCVDFRÖHLICH, K; SOUC, J; MACHAJDIK, D et al.Chemical vapor deposition (Print). 1998, Vol 4, Num 6, pp 216-220, issn 0948-1907Article

A novel approach to AFM characterization of adhesive tooth-biomaterial interfacesYOSHIDA, Y; VAN MEERBEEK, B; SNAUWAERT, J et al.Journal of biomedical materials research. 1999, Vol 47, Num 1, pp 85-90, issn 0021-9304Article

Sensitive light scattering as a semiquantitative method for studying photoresist strippingROTONDARO, A. L. P; MEURIS, M; SCHMIDT, H. F et al.Journal of the Electrochemical Society. 1995, Vol 142, Num 1, pp 211-216, issn 0013-4651Article

An atomic-resolution atomic-force microscope implemented using an optical leverALEXANDER, S; HELLEMANS, L; MARTI, O et al.Journal of applied physics. 1989, Vol 65, Num 1, pp 164-167, issn 0021-8979Article

Growth and recrystallization of CeO2 thin films deposited on R-plane sapphire by off-axis RF sputteringSPANKOVA, M; VAVRA, I; GAZI, S et al.Journal of crystal growth. 2000, Vol 218, Num 2-4, pp 287-293, issn 0022-0248Article

Anisotropically etched silicon mirrors for optical sensor applicationsKWA, T. A; FRENCH, P. J; WOLFFENBUTTEL, R. F et al.Journal of the Electrochemical Society. 1995, Vol 142, Num 4, pp 1226-1233, issn 0013-4651Article

Immobilizing and imaging microtubules by atomic force microscopyVINCKIER, A; HEYVAERT, I; D'HOORE, A et al.Ultramicroscopy. 1995, Vol 57, Num 4, pp 337-343, issn 0304-3991Article

Nonlinear dielectric relaxation in solutions of mesogenic moleculesKEDZIORA, P; JADZYN, J; HELLEMANS, L et al.SPIE proceedings series. 2000, pp 208-213, isbn 0-8194-3792-1Conference Paper

Strong enhancement of nonlinear optical properties through supramolecular chiralityVERBIEST, T; VAN ELSHOCHT, S; KAURANEN, M et al.Science (Washington, D.C.). 1998, Vol 282, Num 5390, pp 913-915, issn 0036-8075Article

The relationship of the silicon surface roughness and gate oxide integrity in NH4OH/H2O2 mixturesMEURIS, M; VERHAVERBEKE, S; MERTENS, P. W et al.Japanese journal of applied physics. 1992, Vol 31, Num 11A, pp L1514-L1517, issn 0021-4922, 2Article

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