CHEMICAL ORIGIN OF THE SPACE-CHARGE LAYER IN CUPRONS OXIDE FRONT-WALL SOLAR CELLSHERION J.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 9; PP. 599-601; BIBL. 10 REF.Article

PROBLEMES DE SURFACE CONCERNANT LE DEPOT DES PRODUITS DE FISSION DANS LES CIRCUITS DES REACTEURS A HAUTE TEMPERATUREHERION J; NIEKISH EA.1975; ; S.L.; DA. 1975; DE L'ALLEM.: CONFERENCE. REAKTORTAGUNG, BERLIN, 2-4 AVRIL 1974; 625-628Miscellaneous

Does analytics produce facts ? An inter-disciplinary approachHERION, J.Fresenius' journal of analytical chemistry. 1992, Vol 344, Num 7-8, pp 353-354, issn 0937-0633Article

THE EFFECT OF ION BEAMS ON THE COMPOSITION OF CU₂O(111) SURFACESHERION J; SCHARL G; TAPIERO M et al.1983; APPLICATIONS OF SURFACE SCIENCE; ISSN 0378-5963; NLD; DA. 1983; VOL. 14; NO 3-4; PP. 233-248; BIBL. 24 REF.Article

INVESTIGATION OF METAL OXIDE/CUPROUS OXIDE HETEROJUNCTION SOLAR CELLSHERION J; NIEKISCH EA; SCHARL G et al.1980; SOL ENERGY MATER.; ISSN 0165-1633; NLD; DA. 1980; VOL. 4; NO 1; PP. 101-112; BIBL. 16 REF.Article

METAL OXIDE/CUPROUS OXIDE HETEROFUNCTION SOLAR CELLSHERION J; NIEKISCH EA; SCHARL G et al.1980; PHOTOVOLTAIC SPECIALISTS CONFERENCE. 1980. 14/1980/SAN DIEGO CA; USA; NEW YORK: IEEE; DA. 1980; PP. 453-457; BIBL. 9 REF.Conference Paper

Hydrogen stability in amorphous germanium filmsBEYER, W; HERION, J; WAGNER, H et al.Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties. 1991, Vol 63, Num 1, pp 269-279, issn 0958-6644, 11 p.Article

Enhancement of sickle erythrocyte adherence to endothelium by autologous plateletsANTONUCCI, R; WALKER, R; HERION, J et al.American journal of hematology. 1990, Vol 34, Num 1, pp 44-48, issn 0361-8609Article

Restructuring of the surface region in SrTiO₃SZOT, K; SPEIER, W; HERION, J et al.Applied physics. A, Materials science & processing (Print). 1997, Vol 64, Num 1, pp 55-59, issn 0947-8396Article

Nucleation and growth of low-temperature fine-crystalline silicon : a scanning probe microscopy and Raman spectroscopy study of the influence of hydrogen and different substratesROSS, C; HERION, J; CARIUS, R et al.Materials science & engineering. B, Solid-state materials for advanced technology. 2000, Vol 72, Num 1, pp 1-6, issn 0921-5107Article

Detection of substrate-related species during depth profiling of a-Si:H films with SIMSHERION, J; BEYER, W; WAGNER, H et al.Surface and interface analysis. 1989, Vol 14, Num 12, pp 839-844, issn 0142-2421Article

Characterization of the surfaces of hydrogen-passivated silicon by STMHERION, J; ROSS, C.Materials science & engineering. B, Solid-state materials for advanced technology. 2000, Vol 71, Num 1-3, pp 244-248, issn 0921-5107Conference Paper

Lithium stability in hydrogenated amorphous siliconBEYER, W; HERION, J; ZASTROW, U et al.Journal of non-crystalline solids. 1991, Vol 137-38, pp 111-114, issn 0022-3093, 1Conference Paper

Nature of the surface layer in ABO₃-type perovskites at elevated temperaturesSZOT, K; PAWELCZYK, M; HERION, J et al.Applied physics. A, Materials science & processing (Print). 1996, Vol 62, Num 4, pp 335-343, issn 0947-8396Article

AFM and STM investigations of hydrogenated amorphous silicon : topography and barrier heightsHERION, J; SZOT, K; BARZEN, S et al.Fresenius' journal of analytical chemistry. 1997, Vol 358, Num 1-2, pp 338-340, issn 0937-0633Conference Paper

Surface layer on KNbO₃ and the hysteresis loop anomalySZOT, K; SPEIER, W; CRAMM, S et al.The Journal of physics and chemistry of solids. 1996, Vol 57, Num 11, pp 1765-1775, issn 0022-3697Article

Heavy carbon doping in low-pressure metalorganic vapor phase epitaxy of GaAs using trimetylarsenic: a comparison between the carrier gases N₂ and H₂HARDTDEGEN, H; UNGERMANNS, C; WIRTZ, K et al.Journal of crystal growth. 1994, Vol 145, Num 1-4, pp 440-446, issn 0022-0248Conference Paper

Towards a better understanding of surfaces of hydrogenated amorphous silicon : investigation by STM and AFMHERION, J; SZOT, K; ROSS, C et al.Journal of non-crystalline solids. 1998, Vol 227-30, pp 78-82, issn 0022-3093, aConference Paper

SIMS depth profile analysis for investigations of the lithium-diffusion in hydrogenated amorphous siliconZASTROW, U; BEYER, W; HERION, J et al.Fresenius' journal of analytical chemistry. 1993, Vol 346, Num 1-3, pp 92-95, issn 0937-0633Conference Paper