Pascal and Francis Bibliographic Databases

Help

Search results

Your search

au.\*:("HEYDENREICH J")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 59

  • Page / 3

Export

Selection :

  • and

MOEGLICHKEITEN UND GRENZEN DER ELEKTRONENMIKROSKOPIE. = POSSIBILITES ET LIMITES DE LA MICROSCOPIE ELECTRONIQUEHEYDENREICH J.1977; MICR. ACTA; ALLEM.; DA. 1977; VOL. 79; NO 4; PP. 301-326; ABS. ALLEM.Article

MOEGLICHKEITEN UND GRENZEN DER ELEKTRONENMIKROSKOPIE. = POSSIBILITES ET LIMITES DE LA MICROSCOPIE ELECTRONIQUEHEYDENREICH J.1976; BILD U. TON; DTSCH.; DA. 1976; VOL. 29; NO 7; PP. 197-208; ABS. ANGL. FR.Article

ON THE COMPUTER SIMULATION OF THE ELECTRON MICROSCOPIC DIFFRACTION CONTRAST OF DISLOCATIONS IN JOG AND DIPOLE CONFIGURATIONS.SCHEERSCHMIDT K; HEYDENREICH J.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 42; NO 1; PP. 47-59; ABS. ALLEM.; BIBL. 16 REF.Article

Heterophases and interfaces in semiconductorsHEYDENREICH, J.Journal de microscopie et de spectroscopie électroniques. 1988, Vol 13, Num 6, pp 479-490, issn 0395-9279Article

ON THE CALCULATION OF ELECTRON OPTICAL HIGH RESOLUTION IMAGESHILLEBRAND R; NEUMANN W; HEYDENREICH J et al.1979; ULTRAMICROSCOPY; NLD; DA. 1979; VOL. 4; NO 3; PP. 305-316; BIBL. 33 REF.Article

ZUM BILDKONTRAST KRISTALLINER OBJEKTE IN DER RASTERELEKTRONENMIKROSKOPIE. = CONSTRASTE DE L'IMAGE D'OBJETS CRISTALLINS EN MICROSCOPIE ELECTRONIQUE A BALAYAGEWERNER U; BETHGE H; HEYDENREICH J et al.1974; KRISTALL U. TECH.; DTSCH.; DA. 1974; VOL. 9; NO 2; PP. 97-105; ABS. ANGL.; BIBL. 6 REF.Article

ON THE COMPUTER SIMULATION OF MANY-BEAM ELECTRON MICROSCOPICAL IMAGES OF PHYLLO-SILICATESHILLEBRAND R; WERNER P; HEYDENREICH J et al.1983; CRYSTAL RESEARCH AND TECHNOLOGY (1979); ISSN 0232-1300; DDR; DA. 1983; VOL. 18; NO 2; PP. 249-260; ABS. GER; BIBL. 14 REF.Article

AN ANALYTIC MODEL OF ELECTRON BACKSCATTERING FOR THE ENERGY RANGE OF 10-100 KEVWERNER U; BETHGE H; HEYDENREICH J et al.1982; ULTRAMICROSCOPY; ISSN 0304-3991; NLD; DA. 1982; VOL. 8; NO 4; PP. 417-427; BIBL. 24 REF.Article

ZUR DEFOKUSSIERUNGSABHAENGIGKEIT DER ELEKTRONENMIKROSKOPISCHEN NETZEBENENABBILDUNG. = VARIATION EN FONCTION DE LA DEFOCALISATION DE L'IMAGE DES PLANS RETICULAIRES EN MICROSCOPIE ELECTRONIQUEHEYDENREICH J; PASEMANN M; WERNER P et al.1977; KRISTALL U. TECH.; DTSCH.; DA. 1977; VOL. 12; NO 10; PP. 1069-1077; ABS. ANGL.; BIBL. 8 REF.Article

ELECTRON OPTICAL INVESTIGATION OF GROWTH-INDUCED INHOMOGENEITIES OF SYNTHETIC HG2CL2 MONOCRYSTALSRAMLAU R; REICHE M; HEYDENREICH J et al.1982; CRYST. RES. TECHNOL. (1979); ISSN 0232-1300; DDR; DA. 1982; VOL. 17; NO 4; PP. 417-423; ABS. GER; BIBL. 9 REF.Article

UNTERSUCHUNG DUENNER ISOLATORSCHICHTEN IN SANDWICH-ANORDNUNGEN MIT DEM ELEKTRONENSPIEGEL-MIKROSKOP = ETUDE A L'AIDE D'UN MICROSCOPE ELECTRONIQUE A MIROIR DE COUCHES MINCES ISOLANTES DISPOSEES EN SANDWICHHEYDENREICH J; GODEHARDT R; VESTER J et al.1978; KRISTALL U. TECH.; DEU; DA. 1978; VOL. 13; NO 4; PP. 355-361; ABS. ENG; BIBL. 17 REF.Article

STRUCTURE INVESTIGATIONS OF PYROPHYLLITE BY HIGH-RESOLUTION ELECTRON MICROSCOPY = ETUDES DE LA STRUCTURE DE PYROPHYLLITE PAR MICROSCOPIE ELECTRONIQUE HAUTE RESOLUTIONWERNER P; HILLEBRAND R; HEYDENREICH J et al.1982; ELECTRON MICROSCOPY 1982 (2). INTERNATIONAL CONGRESS. 10/1982/HAMBURG; DEU; FRANKFURT/M.: DTSCH. GES. ELEKTRONEN-MIKROSKOPIE; DA. 1982; PP. 31-32; BIBL. 5 REF.; ILL.Conference Paper

Simulation of the carrier diffusion process for the interpretation of EBIC profilesWERNER, U; HEYDENREICH, J.Crystal research and technology (1979). 1988, Vol 23, Num 1, pp 85-95, issn 0232-1300Article

COMBINED SCANNING (EBIC) AND TRANSMISSION ELECTRON MICROSCOPIC INVESTIGATIONS OF DISLOCATIONS IN SEMICONDUCTORSBLUMTRITT H; GLEICHMANN R; HEYDENREICH J et al.1979; PHYS. STATUS SOLIDI (A), APPL. PHYS.; ISSN 0031-8965; DDR; DA. 1979; VOL. 55; NO 2; PP. 611-620; ABS. GER; BIBL. 14 REF.Article

Scanning deep level transient spectroscopyBREITENSTEIN, O; HEYDENREICH, J.Techniques of physics. 1989, Num 12, pp 339-371, issn 0308-5392Article

A crystalline test specimen for checking the performance of high-resolution electron microscopesSCHOLZ, R; HEYDENREICH, J.Ultramicroscopy. 1984, Vol 13, Num 4, pp 407-413, issn 0304-3991Article

Analytical electron microscopy of materials = Microscopie électronique analytique des matériauxHEYDENREICH, J; RECHNER, W.Mikrochimica acta (1966. Print). 1987, Vol 1, Num 1-6, pp 93-113, issn 0026-3672Conference Paper

A simple Monte Carlo simulation of the electrontarget interaction on the basis of an empirical scattering formulaWERNER, U; HEYDENREICH, J.Ultramicroscopy. 1984, Vol 15, Num 1-2, pp 17-27, issn 0304-3991Article

ABBILDUNGSERSCHEINUNGEN AN ISOLATORSCHICHTEN IM ELEKTRONENSPIEGELMIKROSKOP UNTER STATIONAEREN AUFLADUNGSBEDINGUNGEN. = APPARITION D'IMAGES DE COUCHES ISOLANTES DANS UN MICROSCOPE ELECTRONIQUE A MIROIR SOUS DES CONDITIONS STATIONNAIRES DE CHARGEMENTWEIDNER G; WEISSMANTEL C; HERBERGER J et al.1975; KRISTALL U. TECH.; DTSCH.; DA. 1975; VOL. 10; NO 3; PP. 285-293; ABS. ANGL.; BIBL. 13 REF.Article

On the spatial resolution of local DLTS investigations using focused electron or laser beam excitationBREITENSTEIN, O; HEYDENREICH, J; HEISER, T et al.Optik (Stuttgart). 1992, Vol 92, Num 2, pp 74-82, issn 0030-4026Article

Simulation of HREM images for models of amorphous solids to evaluate the possibilities of structure interpretationSCHEERSCHMIDT, K; HILLEBRAND, R; HEYDENREICH, J et al.Optik (Stuttgart). 1987, Vol 77, Num 3, pp 115-121, issn 0030-4026Article

Interfacial reaction barriers during thin-film solid-state reactions : the crystallographic origin of kinetic barriers at the NiS2/Si(111) interface : High-resolution electron microscopy of semiconductor interfacesHESSE, D; WERNER, P; MATTHEIS, R et al.Applied physics. A, Solids and surfaces. 1993, Vol 57, Num 5, pp 415-425, issn 0721-7250Article

New morphological types of CuSi precipitates in silicon and their electrical effectsGLEICHMANN, R; BLUMTRITT, H; HEYDENREICH, J et al.Physica status solidi. A. Applied research. 1983, Vol 78, Num 2, pp 527-538, issn 0031-8965Article

Crystallographic HREM studies of small CdTe crystallitesHILLEBRAND, R; HOFMEISTER, H; SCHEERSCHMIDT, K et al.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 252-258, issn 0304-3991Article

HREM contrast interpretation of pseudo-symmetric structure regions in nanocrystalline germaniumNEUMANN, W; HOFMEISTER, H; HEYDENREICH, J et al.Physica status solidi. A. Applied research. 1994, Vol 146, Num 1, pp 437-448, issn 0031-8965Article

  • Page / 3