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kw.\*:("HIGH VOLTAGE ELECTRON MICROSCOPE")

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EXPERIENCES IN SITU DANS LE MICROSCOPE 1MV. I: METHODES PHYSIQUES = IN SITU EXPERIMENTS IN 1MV MICROSCOP. I PHYSICAL METHODSVALLE R; GENTY B; MARRAUD A et al.1980; RECH. AEROSP.; ISSN 0034-1223; FRA; DA. 1980; NO 1; PP. 39-61; ABS. ENG; BIBL. 56 REF.Article

SCHERZER'S FORMULA AND THE CORRECTION OF SPIRAL DISTORTION IN THE ELECTRON MICROSCOPE.MARAI FZ; MULVEY T.1977; ULTRAMICROSCOPY; NETHERL.; DA. 1977; VOL. 2; NO 2-3; PP. 187-192; BIBL. 7 REF.Article

NOUVEAU TYPE DE LENTILLE MAGNETIQUE POUR MICROSCOPE ELECTRONIQUE.BALLADORE JL; MURILLO R.1977; J. MICR. SPECTROSC. ELECTRON.; FR.; DA. 1977; VOL. 2; NO 3; PP. 211-222; ABS. ANGL.; BIBL. 11 REF.Article

WHAT CAN BE DONE WITH HIGH VOLTAGE ELECTRON MICROSCOPY.JOUFFREY B.1980; LECTURE NOTES PHYS.; DEU; DA. 1980; NO 112; PP. 402-414; BIBL. 68 REF.Conference Paper

CONVERGENT BEAM ELECTRON MICROSCOPY AT ACCELERATING VOLTAGES ABOVE 200 KV.RACKHAM GM; RICKARDS GK.1977; OPTIK; DTSCH.; DA. 1977; VOL. 47; NO 2; PP. 223-226; ABS. ALLEM.; BIBL. 9 REF.; (DGA O/NTG-TAG. VERARBEITUNG OPT. INF. BER.; NUERNBERG; 1976)Conference Paper

ACCELERATOR SYSTEM FOR 1-MV STEM.MARSH GE.1977; REV. SCI. INSTRUM.; U.S.A.; DA. 1977; VOL. 48; NO 7; PP. 841-843; BIBL. 10 REF.Article

AN ENERGY FILTER FOR HIGH VOLTAGE ELECTRON MICROSCOPY.ZANCHI G; SEVELY J; JOUFFREY B et al.1977; J. MICR. SPECTROSC. ELECTRON.; FR.; DA. 1977; VOL. 2; NO 2; PP. 95-104; H.T. 3; BIBL. 15 REF.Article

QUANTITATIVE TENSILE-TILTING STAGES FOR THE HIGH VOLTAGE ELECTRON MICROSCOPE.MESSERSCHMIDT U; APPEL F.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 1; NO 3; PP. 223-230; BIBL. 13 REF.Article

A CONVENTIONAL LENS FOR A 5 MV ELECTRON MICROSCOPE.STROJNIK A; PASSOW C.1978; OPTIK; DTSCH.; DA. 1978; VOL. 50; NO 2; PP. 169-173; ABS. ALLEM.; BIBL. 12 REF.Article

DAS 1000-KILOVOLT-ELEKTRONENMIKROSKOP DER ORGANISATION FUER ANGEWANDTE NATURWISSENSCHAFTLICHE UNTERSUCHUNGEN "TNO" IN APELDOORN, NIEDERLAND. = LE MICROSCOPE ELECTRONIQUE DE 1000 KV DE L'ORGANISATION POUR LES RECHERCHES DANS LES SCIENCES DE LA NATURE TNO A APELDOORN, HOLLANDEZEEDIJK HB; VAN ZUYLEN P.1977; MIKROSKOPIE; OESTERR.; DA. 1977; VOL. 33; NO 5-6; PP. 158-167; ABS. ANGL.; BIBL. 10 REF.Article

UN NOUVEAU CRYOSTAT POUR LE MICROSCOPE ELECTRONIQUE SUPRACONDUCTEUR 400 KV.LABERRIGUE A; BALOSSIER G; GENOTEL D et al.1976; REV. PHYS. APPL.; FR.; DA. 1976; VOL. 11; NO 5; PP. 685-687; ABS. ANGL.; BIBL. 3 REF.Article

DER NEUE TREND IN DER TRANSMISSIONS-ELEKTRONENMIKROSKOPIE: 200 KV STATT 100 KV = LE NOUVEAU MARCHE DANS LA MICROSCOPIE ELECTRONIQUE PAR TRANSMISSION: 200 KV A LA PLACE DE 100 KVWILLIG V.1979; G. I. T., FACHZ. LAB.; DEU; DA. 1979; VOL. 23; NO 1; PP. 40-41Article

A CONSTANT-LOAD TENSILE DEVICE FOR AN ULTRA-HIGH VOLTAGE ELECTRON MICROSCOPE AND ITS APPLICATIONS TO MATERIALS SCIENCE.TABATA T; NAKAJIMA Y; FUJITA H et al.1977; JAP. J. APPL. PHYS.; JAP.; DA. 1977; VOL. 16; NO 11; PP. 2011-2015; BIBL. 16 REF.Article

CAPACITIVE MEASUREMENTS OF SLOW FLUCTUATIONS IN HIGH-VOLTAGE SUPPLIES FOR ELECTRON MICROSCOPES.RUST HP; WEISS K; ZILSKE P et al.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 1; PP. 71-73Article

OPTIMUM CONDITIONS FOR STRAINING EXPERIMENTS IN THE HVEMMARTIN JL; KUBIN LP.1979; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1979; VOL. 56; NO 2; PP. 487-494; ABS. FRE; BIBL. 26 REF.Article

ETUDE DU COMPORTEMENT VIBRATOIRE D'UN MICROSCOPE ELECTRONIQUE A HAUTE TENSION (3,5 MV)MAINY DOMINIQUE.1978; ; FRA; DA. 1978; 612; 209 P.; 30 CM.; BIBL. 67 REF.; TH. DOCT.-ING./TOULOUSE 3/1978Thesis

ON PROSPECTS OF HIGH VOLTAGE MICROWAVE MICROSCOPES.PASSOW C.1976; OPTIK; DTSCH.; DA. 1976; VOL. 46; NO 4; PP. 501-504; ABS. ALLEM.; BIBL. 6 REF.Article

HIGH RESOLUTION ELECTRON MICROSCOPE1979; MEASUR. AND CONTROL; GBR; DA. 1979; VOL. 12; NO 8; PP. 324Article

NEW APPLICATIONS AND EXTENSIONS OF THE UNIQUE ADVANTAGES OF HVEM FOR PHYSICAL AND MATERIALS RESEARCH.FISHER RM; IMURA T.1978; ULTRAMICROSCOPY; NLD; DA. 1978; VOL. 3; NO 1; PP. 3-18; BIBL. 1 REF.Article

AN IMPROVED SCANNING SYSTEM FOR A HIGH-VOLTAGE ELECTRON MICROSCOPE.STROJNIK A; SPARROW TG.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 5; PP. 502-504; BIBL. 12 REF.Article

ETUDE DU COMPORTEMENT VIBRATOIRE D'UN MICROSCOPE ELECTRONIQUE A HAUTE TENSION. II: ETUDE EXPERIMENTALEMAINY D; CATHELINAUD R; PINNA H et al.1980; J. MICR. SPECTROSC. ELECTRON.; FRA; DA. 1980; VOL. 5; NO 1; PP. 13-21; ABS. ENG; BIBL. 9 REF.Article

COMPTAGE DES ELECTRONS PAR UN DETECTEUR SI(LI). APPLICATION A L'ENREGISTREMENT DES SPECTRES DE PERTES D'ENERGIE D'ELECTRONS EN MICROSCOPIE ELECTRONIQUE A HAUTE TENSION.PINNA H; KIHN Y; SEVELY J et al.1978; J. MICR. SPECTROSC. ELECTRON.; FR.; DA. 1978; VOL. 3; NO 1; PP. 1-14; ABS. ANGL.; BIBL. 13 REF.Article

A TECHNIQUE FOR THE DETECTION OF IONS IN HIGH VOLTAGE ELECTRON MICROSCOPES.MCKINLEY GV.1978; RAD. EFFECTS; G.B.; DA. 1978; VOL. 36; NO 1-2; PP. 29-33; BIBL. 13 REF.Article

IMPROVEMENTS IN ELECTRON MICROSCOPY BY APPLICATION OF SUPERCONDUCTIVITY.DIETRICH I; FOX F; KNAPEK E et al.1977; ULTRAMICROSCOPY; NETHERL.; DA. 1977; VOL. 2; NO 2-3; PP. 241-249; BIBL. 8 REF.Article

INDIRECT MEASUREMENTS OF RELATIVE HUMIDITY IN A SIDE ENTRY ENVIRONMENTAL STAGE.CANTINO ME; JOHNSON DE.1977; ULTRAMICROSCOPY; NETHERL.; DA. 1977; VOL. 2; NO 4; PP. 409-412; BIBL. 4 REF.Article

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