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HIGH-SPEED ELECTROSTATIC RECORDING FOR FACSIMILESKIMURA M; KONDO I; HORIE M et al.1981; FUJITSU SCI. TECH. J.; ISSN 0016-2523; JPN; DA. 1981; VOL. 17; NO 1; PP. 73-86; BIBL. 6 REF.Article

SOME RESULTS OF THE INTERPRETATION OF HIGH RESOLUTION IMAGERY DATA FROM NOAA SPACECRAFT.SALTER PRS.1977; WEATHER; G.B.; DA. 1977; VOL. 32; NO 6; PP. 208-220; BIBL. 8 REF.Article

HOCHAUFLOESENDE MAGNETISCHE KERURESONANZ IM FESTKOERPER. = RESONANCE MAGNETIQUE NUCLEAIRE A HAUTE RESOLUTION DANS LES SOLIDESPFEIFER H.1977; SITZ.-BER. AKAD. WISSENSCH. D.D.R., MATH. NATURWISSENSCH. TECH.; DTSCH.; DA. 1977; NO 14; PP. 39-59; BIBL. 31 REF.Article

HIGH RESOLUTION SHADOWING FOR ELECTRON MICROSCOPY BY SPUTTER DEPOSITION.ADACHI K; HOJOU K; KATOH M et al.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 2; NO 1; PP. 17-29; BIBL. 21 REF.Article

A PRACTICAL PROCEDURE FOR ALIGNMENT OF A HIGH RESOLUTION ELECTRON MICROSCOPEZEMLIN F.1979; ULTRAMICROSCOPY; NLD; DA. 1979; VOL. 4; NO 2; PP. 241-245; BIBL. 3 REF.Article

THE CORE STRUCTURE OF EXTRINSIC STACKING FAULTS IN SILICON.KRIVANEK GL; MAHER DM.1978; APPL. PHYS. LETTERS; U.S.A.; DA. 1978; VOL. 32; NO 8; PP. 451-453; BIBL. 23 REF.Article

HIGH-RESOLUTION POLYMER SEPARATIONS IN A FOUR-PASS HAIRPIN THERMAL FIELD-FLOW FRACTIONATION COLUMNGIDDINGS JC; MARTIN M; MYERS MN et al.1981; J. POLYM. SCI., POLYM. PHYS. ED.; ISSN 0098-1273; USA; DA. 1981; VOL. 19; NO 5; PP. 815-828; BIBL. 16 REF.Article

PERFORMANCE OF PENETRATION COLOR CRTS IN SINGLE-ANODE AND DUAL ANODE CONFIGURATIONSSPENCER GR.1981; PROC. SOC. INF. DISP.; ISSN 0036-1496; USA; DA. 1981; VOL. 22; NO 1; PP. 15-17Article

HIGH RESOLUTION IMAGING OF FILTERED ULTRASONIC ECHO RESPONSESHOLASEK E; JENNINGS WD; PURNELL EW et al.1980; ACOUST. IMAG.; USA; DA. 1980; VOL. 8; PP. 547-563; BIBL. 9 REF.Conference Paper

HIGH-RESOLUTION RAINBOW HOLOGRAPHIC PROCESSYU FTS; RUTERBUSCH PH; ZHUANG SL et al.1980; OPT. LETTERS; USA; DA. 1980; VOL. 5; NO 10; PP. 443-445; BIBL. 21 REF.Article

THE APPLICATION OF 500-MHZ 1H-NMR SPECTROSCOPY FOR THE STRUCTURE ELUCIDATION OF N-ACETYLLACTOSAMINE TYPE ASPARAGINE-BOUND CARBOHYDRATE CHAINS OF GLYCOPROTEINSVAN HALBEEK H; DORLAND L; VLIEGENTHART JFG et al.1980; F.E.B.S. LETTERS; NLD; DA. 1980; VOL. 114; NO 1; PP. 11-16; BIBL. 9 REF.Article

ETUDE DE LA LOCALISATION DES POLYPHOSPHATES CHEZ LES MICROORGANISMES PAR 31P-NMR-145,78 MHZ A HAUTE RESOLUTIONOSTROVSKIJ DN; SEPETOV NF; RESHETNYAK VI et al.1980; BIOKHIMIJA; SUN; DA. 1980; VOL. 45; NO 3; PP. 517-525; ABS. ENG; BIBL. 12 REF.Article

ADAPTATION OF U.K. TELETEXT SYSTEM FOR 525/60 OPERATIONCROWTHER GO.1980; IEEE TRANS. CONSUM. ELECTRON.; ISSN 0098-3063; USA; DA. 1980; VOL. 26; NO 3; PP. 587-599; BIBL. 6 REF.Article

INFLUENCE OF THE SPATIAL COHERENCE OF THE BACKGROUND NOISE ON HIGH RESOLUTION PASSIVE METHODSBIENVENU G.1979; ICASSP 79. INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH AND SIGNAL PROCESSING/1979/WASHINGTON DC; USA; NEW YORK: IEEE; DA. 1979; PP. 306-309; BIBL. 4 REF.Conference Paper

QUALITY OF MASS AND INTENSITY MEASUREMENTS FROM A HIGH PERFORMANCE MASS SPECTROMETERKILBURN KD; LEWIS PH; UNDERWOOD JG et al.1979; ANAL. CHEM.; USA; DA. 1979; VOL. 51; NO 9; PP. 1421-1425; BIBL. 6 REF.Article

OBSERVATIONS OF CRYSTAL STRUCTURE IMAGES OF SILICON.IZUI K; FURUNO S; OTSU H et al.1977; J. ELECTRON MICR.; JAP.; DA. 1977; VOL. 26; NO 2; PP. 129-132; BIBL. 5 REF.Article

ROTATIONAL SPIN ECHOES AND HIGH RESOLUTION NMR IN POWDERS.MARICQ M; WAUGH JS.1977; CHEM. PHYS. LETTERS; NETHERL.; DA. 1977; VOL. 47; NO 2; PP. 327-329; BIBL. 11 REF.Article

STRUCTURE ANALYSIS OF A NEW TYPE OF VANADIUM OXIDE BY HIGH RESOLUTION ELECTRON MICROSCOPY.FUJIYOSHI Y; ISHIZUKA K; UYEDA N et al.1977; J. ELECTRON MICR.; JAP.; DA. 1977; VOL. 26; NO 1; PP. 47-49; BIBL. 4 REF.Article

CARACTERISTIQUES D'EXPOSITION DE MATERIAUX PHOTOGRAPHIQUES HAUTE RESOLUTION A L'HALOGENURE D'ARGENT POUR L'ENREGISTREMENT DES HOLOGRAMMES TRIDIMENSIONNELS A L'AIDE D'UN LASER A IMPULSIONVORZOBOVA ND; STASEL'KO DI.1977; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1977; VOL. 44; NO 4; PP. 69-71; BIBL. 8 REF.Article

RAMAN SPECTROMETRY WITH HIGH SENSITIVITYFREEMAN JJ; HEAVISIDE J; HENDRA PJ et al.1981; APPL. SPECTROSC.; ISSN 0003-7028; USA; DA. 1981; VOL. 35; NO 2; PP. 196-202; BIBL. 22 REF.Article

HIGH-RESOLUTION LATTICE IMAGING IN RADIATION SENSITIVE MATERIALSHOWITT DG.1980; J. ULTRASTRUCT. RES.; USA; DA. 1980; VOL. 70; NO 2; PP. 181-185; BIBL. 8 REF.Article

MEASURING CAMERA-TUBE RESOLUTION WITH THE RCA P200 TEST CHARTNEUHAUSER RG.1980; SMPTE J.; ISSN 0036-1682; USA; DA. 1980; VOL. 89; NO 2; PP. 97-100; BIBL. 2 REF.Article

A HIGH-RESOLUTION SECTION TOPOGRAPH TECHNIQUE APPLICABLE TO SYNCHROTON RADIATION SOURCESMAI ZHEN HONG; MARDIX S; LANG AR et al.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 2; PP. 180-187; BIBL. 21 REF.Article

AN/APS-116 PERISCOPE DETECTING RADARSMITH JM; LOGAN RH.1980; I.E.E.E. TRANS. AEROSPACE ELECTRON. SYST.; USA; DA. 1980; VOL. 16; NO 1; PP. 66-73; BIBL. 3 REF.Article

HIGH RESOLUTION ELECTRON MICROSCOPE1979; MEASUR. AND CONTROL; GBR; DA. 1979; VOL. 12; NO 8; PP. 324Article

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