THERMAL EXPANSION NEAR A CRITICAL SOLUTION POINTGREER SC; HOCKEN R.1975; J. CHEM. PHYS.; U.S.A.; DA. 1975; VOL. 63; NO 12; PP. 5067-5072; BIBL. 28 REF.Article

INDEX OF REFRACTION IN THE CRITICAL REGION.HOCKEN R; STEEL G.1973; PHYS. REV., A; U.S.A.; DA. 1973; VOL. 8; NO 2; PP. 887-898; BIBL. 32 REF.Article

A DIFFERENTIAL TRANSFORMER AS A POSITION DETECTOR IN A MAGNETIC DENSIMETER.GREER SC; MOLDOVER MR; HOCKEN R et al.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 11; PP. 1462-1463; BIBL. 9 REF.Article

VERSATILE CELLS FOR OPTICAL STUDIES IN FLUIDS.HOCKEN R; MOLDOVER MR; MUTH E et al.1975; REV. SCI. INSTRUM.; U.S.A.; DA. 1975; VOL. 46; NO 12; PP. 1699-1700Article

Atomic-scale precision motion control stage (the Angstrom Stage)HOLMES, M; TRUMPET, D; HOCKEN, R et al.CIRP annals. 1995, Vol 44, Num 1, pp 455-460, issn 0007-8506Article

Scanning tunneling microscopy bit making on highly oriented pyrolytic graphite : initial resultsMILLER, J. A; HOCKEN, R. J.Journal of applied physics. 1990, Vol 68, Num 2, pp 905-907, issn 0021-8979Article

Automatic laser tracking interferometer system for robot metrologyLAU, K; HOCKEN, R. J; HAIGHT, W. C et al.Precision engineering. 1986, Vol 8, Num 1, pp 3-8, issn 0141-6359Article

Robot performance measurements using automatic laser tracking techniquesLAU, K; HOCKEN, R; HAYNES, L et al.Robotics and computer-integrated manufacturing. 1985, Vol 2, Num 3-4, pp 227-236, issn 0736-5845Conference Paper

Characterization and compensation of dynamic errors of a scanning coordinate measuring machinePEREIRA, P. H; HOCKEN, R. J.Precision engineering. 2007, Vol 31, Num 1, pp 22-32, issn 0141-6359, 11 p.Article

The long-range scanning stage : a novel platform for scanned-probe microscopyHOLMES, M; HOCKEN, R; TRUMPER, D et al.Precision engineering. 2000, Vol 24, Num 3, pp 191-209, issn 0141-6359Article

Magnetic bearing stage for photolithographyWILLIAMS, M. E; TRUMPER, D. L; HOCKEN, R et al.CIRP annals. 1993, Vol 42, Num 1, pp 607-610, issn 0007-8506Article

Analysis of linear and nonlinear chatter in millingMINIS, I; YANUSHEVSKY, R; TEMBO, A et al.CIRP annals. 1990, Vol 39, Num 1, pp 459-462, issn 0007-8506, 4 p.Article

X-ray calibrated tunneling system utilizing a dimensionally stable nanometer positionerMILLER, J. A; HOCKEN, R; SMITH, S. T et al.Precision engineering. 1996, Vol 18, Num 2-3, pp 95-102, issn 0141-6359Article

Noncontacting optical probeFANG-SHENG JING; HARTMAN, A. W; HOCKEN, R. J et al.Review of scientific instruments. 1987, Vol 58, Num 5, pp 864-868, issn 0034-6748Article

Error compensation of coordinate measuring machinesZHANG, G; VEALE, R; CHARLTON, T et al.CIRP annals. 1985, Vol 34, Num 1, pp 445-448, issn 0007-8506Article

Alignment uncertainties in ideal indentation styliELLIS, J. D; SMITH, S. T; HOCKEN, R. J et al.Precision engineering. 2008, Vol 32, Num 3, pp 207-214, issn 0141-6359, 8 p.Article

Optical metrology of surfacesHOCKEN, R. J; CHAKRABORTY, N; BROWN, C et al.CIRP annals. 2005, Vol 54, Num 2, pp 705-719, issn 0007-8506, 15 p.Conference Paper

Self-calibration : Reversal, redundancy, error separation, and 'absolute testing'EVANS, C. J; HOCKEN, R. J; ESTLER, W. T et al.CIRP annals. 1996, Vol 45, Num 2, pp 617-634, issn 0007-8506Article

Replication of micro and nano surface geometriesHANSEN, H. N; HOCKEN, R. J; TOSELLO, G et al.CIRP annals. 2011, Vol 60, Num 2, pp 695-714, issn 0007-8506, 20 p.Conference Paper

Atomic force microscope for accurate dimensional metrologyMAZZEO, A. D; STEIN, A. J; TRUMPER, D. L et al.Precision engineering. 2009, Vol 33, Num 2, pp 135-149, issn 0141-6359, 15 p.Article

A portable three-dimensional stylus profile measuring instrumentBADAMI, V. G; SMITH, S. T; RAJA, J et al.Precision engineering. 1996, Vol 18, Num 2-3, pp 147-156, issn 0141-6359Article

Tolerancing for functionWEILL, R; CLEMENT, A; TRUMPOLD, H et al.CIRP annals. 1988, Vol 37, Num 2, pp 603-610, issn 0007-8506Article