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ELECTRON TRAPPING NOISE IN SOS MOS FIELD-EFFECT TRANSISTORS OPERATED IN THE LINEAR REGION.HSU ST.1977; R.C.A. REV.; U.S.A.; DA. 1977; VOL. 38; NO 2; PP. 226-237; BIBL. 13 REF.Article

OBSERVATIONS OF ELECTRON AND HOLE TRANSPORT THROUGH THIN SIO2 FILMSHSU ST.1981; RCA REV.; ISSN 0033-6831; USA; DA. 1981; VOL. 42; NO 3; PP. 434-440; BIBL. 6 REF.Article

A COS/MOS LINEAR AMPLIFIER STAGE.HSU ST.1976; R.C.A. REV.; U.S.A.; DA. 1976; VOL. 37; NO 1; PP. 136-148; BIBL. 5 REF.Article

EFFECTS OF A NONUNIFORM ELECTRIC FIELD ON ULTRASONIC AMPLIFICATION IN SOLIDSHSU ST.1973; I.E.E.E. TRANS. SONICS ULTRASON.; U.S.A.; DA. 1973; VOL. 20; NO 1; PP. 6-8; BIBL. 15 REF.Serial Issue

ALUMINIUM-SOS SCHOTTKY DIODES.HSU ST.1977; R.C.A. REV.; U.S.A.; DA. 1977; VOL. 38; NO 4; PP. 533-541; BIBL. 4 REF.Article

MOBILITY OF CURRENT CARRIERS IN SILICON-ON SAPPHIRE (SOS) FILMS.HSU ST; SCOTT JH JR.1975; R.C.A. REV.; U.S.A.; DA. 1975; VOL. 36; NO 2; PP. 240-253; BIBL. 13 REF.Article

LOW-NOISE INTEGRATED SILICON-GATE FET AMPLIFIER.BOOORNARD A; HERRMANN E; HSU ST et al.1975; I.E.E.E. J. SOLID-STATE CIRCUITS; U.S.A.; DA. 1975; VOL. 10; NO 6; PP. 542-544; BIBL. 6 REF.Article

THE INFLUENCE OF BIASING CIRCUITS ON PHOTOMULTIPLIER TUBE OUT-PUT NAISE SPECTRA AND TRANSFER FUNCTIONSKERNS DV JR; CHEN TM; HSU ST et al.1973; I.E.E.E. TRANS. ELECTRON. DEVICES; U.S.A.; DA. 1973; VOL. 20; NO 4; PP. 341-347; BIBL. 5 REF.Serial Issue

THE EFFECT OF VACCINATION WITH A LIVE ATTENUATED STRAIN OF JAPANESE ENCEPHALITIS VIRUS ON STILLBIRTHS IN SWINE IN TAIWANHSU ST; CHANG LC; LIN SY et al.1972; BULL. ORGANIS. MOND. SANTE; SUISSE; DA. 1972; VOL. 46; NO 4; PP. 465-471; ABS. FR.; BIBL. 13REF.Serial Issue

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