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au.\*:("HUANG HCW")

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GENERATION OF INTERFACE STATES DUE TO EMISSION OF LEAKAGE ELECTRONS FROM SILICON SUBSTRATE INTO SILICON DIOXIDE.HUANG HCW.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 30; NO 10; PP. 533-535; BIBL. 16 REF.Article

RING FORMATION OF KIRKENDALL VOIDS IN PB-ALLOY THIN-FILM DIFFUSION COUPLES = FORMATION D'ANNEAUX DE CAVITES KIRKENDALL DANS LES COUPLES DE DIFFUSION DE COUCHES MINCES D'ALLIAGES DE PLOMBHUANG HCW.1982; APPLIED PHYSICS LETTERS; ISSN 0003-6951; USA; DA. 1982; VOL. 41; NO 8; PP. 724-726; BIBL. 8 REF.Article

OXYGEN-DOPED PB-IN-AU FILMS SUITABLE FOR JOSEPHSON TUNNEL JUNCTION BASE ELECTRODESHUANG HCW; MURAKAMI M.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 7; PP. 4826-4833; BIBL. 21 REF.Article

PREPARATION OF PB-BI FILM BY ALLOY EVAPORATION. I: FILM COMPOSITION CONTROL = PREPARATION D'UNE COUCHE MINCE PB-BI PAR EVAPORATION D'ALLIAGE. I: CONTROLE DE LA COMPOSITION DE LA COUCHEHUANG HCW; GILBERT BL.1982; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 91; NO 3; PP. 201-209; BIBL. 13 REF.Article

CONTACTLESS MEASUREMENT OF SCHOTTKY BARRIER HEIGHTS USING SECONDARY ELECTRONSHUANG HCW; HO PS.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 41; NO 5; PP. 482-484; BIBL. 10 REF.Article

SCHOTTKY BARRIER HEIGHT MEASUREMENT BY ELECTRON-BEAM INDUCED VOLTAGEHUANG HCW; ALIOTTA CF; HO PS et al.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 41; NO 1; PP. 54-56; BIBL. 10 REF.Article

EFFECT OF RESIDUAL GASES ON SURFACE MORPHOLOGY AND MICROSTRUCTURE OF PB-IN-AU FILMS DEPOSITED AT 95 KHUANG HCW; BAKER JM; SERRANO CM et al.1981; J. VAC. SCI. TECHNOL.; ISSN 0022-5355; USA; DA. 1981; VOL. 19; NO 1; PP. 72-79; BIBL. 9 REF.Article

THERMAL STRAIN IN LEAD THIN FILMS. II: EFFECTS OF MULTIPLE CYCLING TO 4.2 K = DEFORMATION THERMIQUE DANS DES COUCHES MINCES DE PHASE II. EFFETS DE CYCLAGES MULTIPLES JUSQU'A 4,2 KMURAKAMI M; ANGELILLO J; HUANG HCW et al.1979; THIN SOLID FILMS; NLD; DA. 1979; VOL. 60; NO 1; PP. 1-9; BIBL. 16 REF.Article

HIGH-RELIABILITY PB-ALLOY JOSEPHSON JUNCTIONS FOR INTEGRATED CIRCUITSHUANG HCW; SURYADEVAR BASAVAIAH; KIRCHER CJ et al.1980; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1980; VOL. 27; NO 10; PP. 1979-1987; BIBL. 32 REF.Article

FABRICATION PROCESS FOR JOSEPHSON INTEGRATED CIRCUITSGREINER JH; KIRCHER CJ; KLEPNER SP et al.1980; I.B.M. J. RES. DEVELOP.; USA; DA. 1980; VOL. 24; NO 2; PP. 195-205; BIBL. 39 REF.Article

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