ASTRO SPECKLE INTERFEROMETRY: A SIMPLE MODIFICATION RESOLVING THE PHASE PROBLEMHUISER AMJ.1982; OPTIK (STUTTG.); ISSN 0030-4026; DEU; DA. 1982; VOL. 61; NO 4; PP. 433-436; ABS. GER; BIBL. 4 REF.Article

A PROCEDURE TO CORRECT THE IMAGES OF ASTRONOMICAL OBJECTS FOR THE DISTORTIONS DUE TO ATMOSPHERIC TURBULENCEHUISER AMJ.1982; OPTICS COMMUNICATIONS; ISSN 0030-4018; NLD; DA. 1982; VOL. 42; NO 4; PP. 226-230; BIBL. 10 REF.Article

A NEW MOTIVATION FOR OFF-AXIS HOLOGRAPHY IN ELECTRON MICROSCOPY.GREENAWAY AH; HUISER AMJ.1976; OPTIK; DTSCH.; DA. 1976; VOL. 45; NO 3; PP. 299-304; ABS. ALLEM.; BIBL. 5 REF.Article

ON THE PROBLEM OF PHASE RETRIEVAL IN ELECTRON MICROSCOPY FROM IMAGE AND DIFFRACTION PATTERN. II. ON THE UNIQUENESS AND STABILITY.HUISER AMJ; FERWERDA HA.1976; OPTIK; DTSCH.; DA. 1976; VOL. 46; NO 4; PP. 407-420; ABS. ALLEM.; BIBL. 11 REF.Article

ELECTROMAGNETIC SCATTERING BY PERFECTLY CONDUCTING ROUGH SURFACES; FACET MODELHUISER AMJ; BALTES HP.1981; OPT. COMMUN.; ISSN 0030-4018; NLD; DA. 1981; VOL. 40; NO 1; PP. 1-4; BIBL. 6 REF.Article

A PROCEDURE TO DETERMINE THE SPATIAL COHERENCE OF A WAVE FIELDHUISER AMJ; HOENDERS BJ.1981; OPT. ACTA; ISSN 0030-3909; GBR; DA. 1981; VOL. 28; NO 9; PP. 1273-1276; ABS. FRE/GER; BIBL. 5 REF.Article

OPTIMAL DETECTION IN SCANNING ELECTRON MICROSCOPYHUISER AMJ; VAN TOORN P.1982; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1982; VOL. 15; NO 5; PP. 747-755; BIBL. 8 REF.Article

PROPOSALS FOR SOLVING THE PHASE RETRIEVAL PROBLEM FOR SEMI-WEAK OBJECTS FROM NOISY ELECTRON MICROGRAPHSVAN TOORN P; HUISER AMJ; FERWERDA HA et al.1978; OPTIK; DEU; DA. 1978; VOL. 51; NO 3; PP. 309-326; ABS. GER; BIBL. 11 REF.Article

THE PROBLEM OF PHASE RETRIEVAL IN LIGHT AND ELECTRON MICROSCOPY OF STRONG OBJECTS.DRENTH AJJ; HUISER AMJ; FERWERDA HA et al.1975; OPT. ACTA; G.B.; DA. 1975; VOL. 22; NO 7; PP. 615-628; ABS. FR. ALLEM.; BIBL. 14 REF.Article

NUMERICAL SOLUTION OF ELECTROMAGNETIC SCATTERING PROBLEMS. CASE OF PERFECTLY CONDUCTING CYLINDERSHUISER AMJ; QUATTROPANI A; BALTES HP et al.1981; OPT. COMMUN.; ISSN 0030-4018; NLD; DA. 1981; VOL. 37; NO 5; PP. 307-310; BIBL. 7 REF.Article

ON PHASE RETRIEVAL IN ELECTRON MICROSCOPY FROM IMAGE AND DIFFRACTION PATTERN.HUISER AMJ; DRENTH AJJ; FERWERDA HA et al.1976; OPTIK; DTSCH.; DA. 1976; VOL. 45; NO 4; PP. 303-316; ABS. ALLEM.; BIBL. 9 REF.Article

ENCODING OF INFORMATION IN INVERSE OPTICAL PROBLEMSFIDDY MA; ROSS G; NIETO VESPERINAS M et al.1982; OPT. ACTA; ISSN 0030-3909; GBR; DA. 1982; VOL. 29; NO 1; PP. 23-40; ABS. FRE/GER; BIBL. 26 REF.Article

REFRACTIVE INDEX OF THE FLY RHABDOMEREBEERSMA DGM; HOENDERS BJ; HUISER AMJ et al.1982; J. OPT. SOC. AM. (1930); ISSN 0030-3941; USA; DA. 1982; VOL. 72; NO 5; PP. 583-588; BIBL. 22 REF.Article