DIFFERENTIAL REFLECTOMETRY AND ITS APPLICATION TO THE STUDY OF ALLOYS, ORDERING, CORROSION, AND SURFACE PROPERTIESHUMMEL RE.1983; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1983; VOL. 76; NO 1; PP. 11-44; BIBL. 88 REF.Article

OBSERVATIONS ON THE ELECTROMIGRATION IN VARIOUS THIN FILMS OF GROUP I-IVHUMMEL RE.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 1; PP. 175-178; BIBL. 24 REF.Serial Issue

DIFFERENTIAL REFLECTOMETRY OF SPUTTERED SILVER-ALUMINUM FILMS BETWEEN 1.6 AND 6.2 EV = REFLECTOMETRIE DIFFERENTIELLE DE COUCHES MINCES PULVERISEES DE AG-AL ENTRE 1,6 ET 6,2 EVHUMMEL RE.1981; OPT. COMMUN.; ISSN 0030-4018; USA; DA. 1981; VOL. 39; NO 1-2; PP. 55-58; BIBL. 16 REF.Article

USE OF THE DIFFERENTIAL REFLECTOMETER IN METALLOGRAPHYHUMMEL RE.1982; PRAKT. METALLOGR.; DEU; DA. 1982-05; VOL. 19; NO 5; PP. 280-287; BIBL. 14 REF.Article

REFLECTIVITY OF SILVER- AND ALUMINIUM-BASED ALLOYS FOR SOLAR REFLECTORSHUMMEL RE.1981; SOL. ENERGY; ISSN 0038-092X; USA; DA. 1981; VOL. 27; NO 6; PP. 449-455; BIBL. 34 REF.Article

ACTIVATION ENERGY FOR ELECTROTRANSPORT IN THIN SILVER AND GOLD FILMSHUMMEL RE; GEIER HJ.1975; THIN SOLID FILMS; NETHERL.; DA. 1975; VOL. 25; NO 2; PP. 335-342; BIBL. 20 REF.Article

DER EINFLUSS DER NAHORDNUNG IN KUPFER-ALUMINIUM-LEGIERUNGEN AUF ELEKTRISCHE UND OPTISCHE EIGENSCHAFTEN = THE INFLUENCE OF SHORT RANGE ORDER ON ELECTRICAL AND OPTICAL PROPERTIES OF COPPER-ALUMINIUM ALLOYSGEROLD V; HUMMEL RE.1981; Z. METALLKD.; DEU; DA. 1981-11; VOL. 72; NO 11; PP. 761-764; BIBL. 32 REF.Article

ON THE CONTROVERSY ABOUT THE DIRECTION OF ELECTROTRANSPORT IN THIN GOLD FILMS.HUMMEL RE; DEHOFF RJ.1975; APPL. PHYS. LETTERS; U.S.A.; DA. 1975; VOL. 27; NO 2; PP. 64-66; BIBL. 12 REF.Article

OPTICAL PROPERTIES AND ELECTRONIC STRUCTURE OF DILUTE CU-AU, CU-ZN, CU-AL, CU-GA, CU-SI, CU-GE, CU-SN, AND CU-AS ALLOYS.NASTASI ANDREWS RJ; HUMMEL RE.1977; PHYS. REV., B; U.S.A.; DA. 1977; VOL. 16; NO 10; PP. 4314-4323; BIBL. 33 REF.Article

ACTIVATION ENERGY FOR ELECTROTRANSPORT IN THIN ALUMINIUM FILMS BY RESISTANCE MEASUREMENTSHUMMEL RE; DEHOFF RT; GEIER HJ et al.1976; J. PHYS. CHEM. SOLIDS; G.B.; DA. 1976; VOL. 37; NO 1; PP. 73-80; BIBL. 25 REF.Article

DIFFERENTIAL REFLECTOMETRY OF CORROSION PRODUCTS OF COPPER = REFLECTOMETRIE DIFFERENTIELLE DES PRODUITS DE CORROSION DU CUSHANLEY CW; HUMMEL RE; VERINK ED JR et al.1980; CORROS. SCI.; ISSN 0010-938X; USA; DA. 1980; VOL. 20; NO 4; PP. 481-487; BIBL. 12 REF.Article

THERMAL GROOVING, THERMOTRANSPORT AND ELECTROTRANSPORT IN DOPED AND UNDOPED THIN GOLD FILMS = RAINURAGE THERMIQUE, THERMODIFFUSION ET ELECTRODIFFUSION DANS DES COUCHES MINCES D'OR DOPEES ET NON DOPEESHUMMEL RE; DEHOFF RT; MATTS GOHO S et al.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 78; NO 1; PP. 1-14; BIBL. 19 REF.Article

INTERPRETATION OF COMPOSITIONAL MODULATION SPECTRA TO DETERMINE SOME OPTICAL PROPERTIES OF ALLOYS.ENDERLEIN R; HUMMEL RE; ANDREWS JB et al.1978; PHYS. STATUS SOLIDI, B; DDR; DA. 1978; VOL. 88; NO 1; PP. 173-178; ABS. GER; BIBL. 7 REF.Article