DETECTION IN THE VACUUM ULTRAVIOLET.HUNTER WR.1976; ELECTRO-OPT. SYST. DESIGN; U.S.A.; DA. 1976; VOL. 8; NO 7; PP. 44-46; BIBL. 7 REF.Article

EFFECTS OF DETECTOR NON-LINEARITY ON CALIBRATION AND DATE REDUCTION OF ROTATING-ANALYSER ELLIPSOMETERS.HUNTER WR.1976; J. OPT. SOC. AMER.; U.S.A.; DA. 1976; VOL. 66; NO 2; PP. 94-97; BIBL. 12 REF.Article

ON-BLAZE SCANNING MONOCHROMATOR FOR THE VACUUM ULTRAVIOLETHUNTER WR.1982; APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 9; PP. 1634-1642; BIBL. 11 REF.Article

OPTICAL CONTAMINATION: ITS PREVENTION IN XUV SPECTROGRAPHS FLOWN BY THE U.S. NAVAL RESEARCH LABORATORY IN THE APOLLO TELESCOPE MOUNT.HUNTER WR.1977; APPL. OPT.; U.S.A.; DA. 1977; VOL. 16; NO 4; PP. 909-916; BIBL. 11 REF.Article

MEASUREMENT OF OPTICAL PROPERTIES OF MATERIALS IN THE VACUUM ULTRAVIOLET SPECTRAL REGIONHUNTER WR.1982; APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 12; PP. 2103-2114; BIBL. 53 REF.Article

ULTRAVIOLETHUNTER WR.1979; ELECTRO-OPT. SYST. DESIGN; USA; DA. 1979; VOL. 11; NO 9; PP. 72-74Article

DESIGN CRITERIA FOR REFLECTION POLARIZERS AND ANALYZERS IN THE VACUUM ULTRAVIOLET.HUNTER WR.1978; APPL. OPT.; U.S.A.; DA. 1978; VOL. 17; NO 8; PP. 1259-1270; BIBL. 26 REF.Article

STATUS OF THE EXTREME UV TECHNOLOGY.HUNTER WR.1976; ELECTRO-OPT. SYST. DESIGN; U.S.A.; DA. 1976; VOL. 8; NO 1; PP. 18-19; BIBL. 4 REF.Article

VARIATION OF BLAZE OF CONCAVE DIFFRACTION GRATINGSHUTLEY MC; HUNTER WR.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 2; PP. 245-250; BIBL. 5 REF.Article

OPTICAL AND PHYSICAL PROPERTIES OF DIFFRACTION GRATINGS FOR THE V.U.V. AND SOFT X-RAY REGIONNAMIOKA T; HUNTER WR.1978; J. PHYS., COLLOQ.; FRA; DA. 1978; VOL. 39; NO 4; PP. 167-187; ABS. FRE; BIBL. 60 REF.Conference Paper

REFLECTION POLARIZERS FOR THE VACUUM ULTRAVIOLET USING AL+MGF₂ MIRRORS AND AN MGF₂ PLATE.HASS G; HUNTER WR.1978; APPL. OPT.; U.S.A.; DA. 1978; VOL. 17; NO 1; PP. 76-82; BIBL. 28 REF.Article

THIN ALUMINUM FILTERS FOR USE ON THE APOLLO TELESCOPE MOUNT XUV SPECTROGRAPHS.SCHUMACHER RJ; HUNTER WR.1977; APPL. OPT.; U.S.A.; DA. 1977; VOL. 16; NO 4; PP. 904-908; BIBL. 7 REF.Article

THE USE OF EVAPORATED FILMS FOR SPACE APPLICATIONS. EXTREME ULTRAVIOLET ASTRONOMY AND TEMPERATURE CONTROL OF SATELLITESHASS G; HUNTER WR.1978; PHYS. THIN FILMS; USA; DA. 1978; VOL. 10; PP. 71-166; BIBL. 3 P.Article

REFLECTANCE OF EVAPORATED RUTHENIUM FILMS FROM 300 A TO 50 MU M = REFLECTANCE DE COUCHES DE RUTHENIUM EVAPORE DE 300 A A 50 MU MHASS G; HUNTER WR.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 14; PP. 2334-2335; BIBL. 11 REF.Article

TRANSMITTANCE OF CULTURED CRYSTALLINE QUARTZ IN THE VACUUM ULTRAVIOLET BEFORE AND AFTER ELECTRON IRRADIATIONHASS G; HUNTER WR.1978; APPL. OPT.; USA; DA. 1978; VOL. 17; NO 15; PP. 2310-2315; BIBL. 9 REF.Article

CLEANING OF CONTAMINATED CHANNEL ELECTRON MULTIPLIER ARRAYSHARLOW FE; HUNTER WR.1972; APPL. OPT.; U.S.A.; DA. 1972; VOL. 11; NO 11; PP. 2719-2720; BIBL. 8 REF.Serial Issue

REFLECTANCE AND PREPARATION OF FRONT SURFACE MIRRORS FOR USE AT VARIOUS ANGLES OF INCIDENCE FROM THE ULTRAVIOLET TO THE FAR INFRAREDHASS G; HEANEY JB; HUNTER WR et al.1982; PHYSICS OF THIN FILMS; ISSN 0079-1970; USA; DA. 1982; VOL. 12; PP. 1-51; BIBL. 81 REF.Article

A TRANSMISSION LINE MODEL FOR SILICIDED DIFFUSIONS: IMPACT ON THE PERFORMANCE OF VLSI CIRCUITSSCOTT DB; HUNTER WR; SHICHIJO H et al.1982; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1982; VOL. 29; NO 4; PP. 651-661; BIBL. 23 REF.Article

MULTIPLATE RESONANT REFLECTORS FOR THE VACUUM ULTRAVIOLETHUNTER WR; HUTCHINSON MHR; JONES MRO et al.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 5; PP. 770-772; BIBL. 8 REF.Article

ON THE USE OF CLASSICAL AND CONICAL DIFFRACTION MOUNTINGS FOR XUV GRATINGSNEVIERE M; MAYSTRE D; HUNTER WR et al.1978; J. OPT. SOC. AMER.; USA; DA. 1978; VOL. 68; NO 8; PP. 1106-1113; BIBL. 17 REF.Article

OPTICAL PROPERTIES OF EVAPORATED FILMS OF ZNS IN THE VACUUM ULTRAVIOLET FROM 160 TO 2000 AHUNTER WR; ANGEL DW; HASS G et al.1978; J. OPT. SOC. AMER.; USA; DA. 1978; VOL. 68; NO 10; PP. 1319-1322; BIBL. 17 REF.Article

A TRANSMISSION LINE MODEL FOR SILICIDED DIFFUSIONS: IMPACT ON THE PERFORMANCE OF VLSI CIRCUITSSCOTT DB; HUNTER WR; SHICHIJO H et al.1982; IEEE J. SOLID-STATE CIRCUITS; ISSN 0018-9200; USA; DA. 1982; VOL. 17; NO 2; PP. 281-291; BIBL. 23 REF.Article

OPTICAL GRATING EVALUATOR: A DEVICE FOR DETAILED MEASUREMENT OF DIFFRACTION GRATING EFFICIENCIES IN THE VACUUM ULTRAVIOLET.MICHELS DJ; MIKES TL; HUNTER WR et al.1974; APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 5; PP. 1223-1229; BIBL. 11 REF.Article

THE IMPACT OF SCALING LAWS ON THE CHOICE OF N-CHANNEL OR P-CHANNEL FOR MOS VLSICHATTERJEE PK; HUNTER WR; HOLLOWAY TC et al.1980; I.E.E.E. ELECTRON DEVICE LETT.; USA; DA. 1980; VOL. 1; NO 10; PP. 220-223; BIBL. 15 REF.Article

LOCATION OF TRAPPED CHARGE IN ALUMINIUM-IMPLANTED SIO₂.DIMARIA DJ; YOUNG DR; HUNTER WR et al.1978; I.B.M. J. RES. DEVELOP.; USA; DA. 1978; VOL. 22; NO 3; PP. 289-293; BIBL. 19 REF.Article