Pascal and Francis Bibliographic Databases


Search results

Your search

au.\*:("HURRELL, J. P")

Results 1 to 4 of 4

  • Page / 1

Selection :

  • and

Low frequency 1/f noise measurements in YBa2Cu3O7 thin films and the implications for HTS IR detectorsLACOE, R. C; HURRELL, J. P; SPRINGER, K et al.IEEE transactions on magnetics. 1991, Vol 27, Num 2, pp 2832-2835, issn 0018-9464, 4 p., p.4Conference Paper

A new technique for the characterization of cesium beam tube performanceHURRELL, J. P; JOHNSON, W. A; KARUZA, S. K et al.IEEE transactions on ultrasonics, ferroelectrics, and frequency control. 1987, Vol 34, Num 6, pp 602-606, issn 0885-3010Article

A complementary metal oxide semiconductor proces in epitaxially regrown silicon over oxideLEUNG, D. L; COLE, R. C; COBERT, D. M et al.Journal of the Electrochemical Society. 1991, Vol 138, Num 12, pp 3771-3777, issn 0013-4651Article

Thin epitaxial silicon regrowth using ion implantation amorphization techniquesCOLE, R. C; KNUDSEN, J. F; BOWMAN, R. C. JR et al.Journal of the Electrochemical Society. 1988, Vol 135, Num 4, pp 974-979, issn 0013-4651Article

  • Page / 1