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INDUSTRIAL METROLOGY : Engineering precision : MetrologyHARDING, Kevin.Nature photonics (Print). 2008, Vol 2, Num 11, pp 667-669, issn 1749-4885, 3 p.Article

Three-dimensional imaging, optical metrology, and inspection V (Boston MA, 19-20 September 1999)Harding, Kevin G.SPIE proceedings series. 1999, isbn 0-8194-3428-0, IX, 224 p, isbn 0-8194-3428-0Conference Proceedings

Two- and three-dimensional vision systems for inspection, control, and metrology II (Philadelphia PA, 26-27 October 2004)Harding, Kevin G.SPIE proceedings series. 2004, isbn 0-8194-5559-8, VII, 188 p, isbn 0-8194-5559-8Conference Proceedings

Latest optical methods for industrial dimensional metrologyHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 600001.1-600001.14, issn 0277-786X, isbn 0-8194-6024-9, 1VolConference Paper

3D profilometry: Next requests from the industrial view pointHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 785513.1-785513.11Conference Paper

Three-dimensional imaging and laser-based systems for metrology and inspection III (Pittsburgh PA, 14-15 October 1997)Harding, Kevin G; Svetkoff, Donald J.SPIE proceedings series. 1997, isbn 0-8194-2636-9, IX, 218 p, isbn 0-8194-2636-9Conference Proceedings

Nanometrology device standards for scanning probe microscopes and processes for their fabrication and usageMOECK, Peter.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60000Q.1-60000Q.8, issn 0277-786X, isbn 0-8194-6024-9, 1VolConference Paper

Optical metrology and inspection for industrial applications (18-20 October 2010, Beijing, China)Harding, Kevin; Huang, Peisen S; Yoshizawa, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 1 vol, isbn 978-0-8194-8385-0Conference Proceedings

Two- and three-dimensional methods for inspection and metrology III (24-26 October 2005, Boston, Massachusetts, USA)Harding, Kevin G.Proceedings of SPIE, the International Society for Optical Engineering. 2005, issn 0277-786X, isbn 0-8194-6024-9, 1Vol, pagination multiple, isbn 0-8194-6024-9Conference Proceedings

Challenges and opportunities for 3D optical metrology : what is needed today from an industry perspectiveHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660F.1-70660F.8, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

Phase shift based measurements using a pocket LCD projectorWILLIAMS, Yana; HARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 78550E.1-78550E.8Conference Paper

Comparison of projection means for structured light systemsHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 74320S.1-74320S.10Conference Paper

Shiny parts measurement using color separationQINGYING HU; HARDING, Kevin G; XIAOMING DU et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60000D.1-60000D.8, issn 0277-786X, isbn 0-8194-6024-9, 1VolConference Paper

Camera-based 10KHz distance gageABRAMOVICH, Gil; HARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660G.1-70660G.8, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

Sub-micron feature surface mapping interferometer for hard-to-access locationsABRAMOVICH, Gil; HARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 813303.1-813303.8Conference Paper

Surface sensitivity reduction in laser triangulation sensorsDANESHPANAH, Mehdi; HARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 81330O.1-81330O.9Conference Paper

A hand held triangulation sensor for small features measurementABRAMOVICH, Gil; HARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 78550F.1-78550F.9Conference Paper

Geometric errors in 3D optical metrology systemsHARDING, Kevin; NAFIS, Chris.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 706603.1-706603.8, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

High-speed triangulation-based point sensing using phase detectionHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 81330B.1-81330B.9Conference Paper

Method for the evaluation of 3D non-contact, measurement systemsHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 81330F.1-81330F.11Conference Paper

3D measurements using a programmable projector and a gratingHARDING, Kevin; DEMUTH, Russ; TAIT, Robert et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60000C.1-60000C.7, issn 0277-786X, isbn 0-8194-6024-9, 1VolConference Paper

Dimensional optical metrology and inspection for practical applications (222-23 August 2011, San Diego, California, United States)Harding, Kevin G; Huang, Peisen S; Yoshizawa, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 1 vol, isbn 978-0-8194-8743-8Conference Proceedings

Two- and three-dimensional methods for inspection and metrology VI (10-11 August 2008, San Diego, California, USA)Huang, Peisen S; Yoshizawa, Tōru; Harding, Kevin G et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1Vol, various pagings, isbn 978-0-8194-7286-1 0-8194-7286-7Conference Proceedings

Performance evaluation of different depth from defocus (DFD) techniquesTAO XIAN; SUBBARAO, Murali.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 600009.1-600009.13, issn 0277-786X, isbn 0-8194-6024-9, 1VolConference Paper

Liquid crystal grating for profilometry using structured lightYOSHIZAWA, Toru; FUJITA, Hiroo.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 60000H.1-60000H.10, issn 0277-786X, isbn 0-8194-6024-9, 1VolConference Paper

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