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First evidence of tyre debris characterization at the nanoscale by focused ion beamMILANI, M; PUCILLO, F. P; BALLERINI, M et al.Materials characterization. 2004, Vol 52, Num 4-5, pp 283-288, issn 1044-5803, 6 p.Article
Fabrication and modification of photonic structures with focused ion beamCALLEGARI, Victor; NELLEN, Philipp M; BRÖNNIMANN, Rolf et al.Praktische Metallographie. 2007, Vol 44, Num 5, pp 239-243, issn 0032-678X, 5 p.Article
Proceedings of the 14th International Conference on Surface Modification of Materials by Ion Beams, SMMIB'05, Kuşadasi, 4-9 September, 2005OZTARHAN, Ahmet; BAGLIN, John E. E; BROWN, Ian G et al.Surface & coatings technology. 2007, Vol 201, Num 19-20, issn 0257-8972, 671 p.Conference Proceedings
Low energy nuclear cross sections in metalsKASAGI, Jirohta.Surface & coatings technology. 2007, Vol 201, Num 19-20, pp 8574-8578, issn 0257-8972, 5 p.Conference Paper
Focused Ion Beam : A Versatile Technique for the Fabrication of Nano-DevicesSANTSCHI, Christian; PRZYBYLSKA, Joanna; GUILLAUMEE, Mickael et al.Praktische Metallographie. 2009, Vol 46, Num 3, pp 154-156, issn 0032-678X, 3 p.Article
Automated X-ray elemental analysis in three dimensions using a dual beam-focused Ion beam systemSCHAFFER, Miroslava; WAGNER, Julian; SCHRÖTTNER, Hartmuth et al.Praktische Metallographie. 2007, Vol 44, Num 5, pp 248-250, issn 0032-678X, 3 p.Article
InstrumentationTAPPER, U. A. S; MALMQVIST, K. G.Analytical chemistry (Washington, DC). 1991, Vol 63, Num 14, issn 0003-2700, 715 A-725 AArticle
Nanometer-scale columns in GaAs fabricated by angled chlorine ion-beam-assisted etchingGOODHUE, W. D; PANG, S. W; JOHNSON, G. D et al.Applied physics letters. 1987, Vol 51, Num 21, pp 1726-1728, issn 0003-6951Article
Focused ion beam mjicro-and nanoengineering : Focused ion beam microscopy and micromachiningLANGFORD, Richard M; NELLEN, Philipp M; GIERAK, Jacques et al.MRS bulletin. 2007, Vol 32, Num 5, pp 417-423, issn 0883-7694, 7 p.Article
Raman scattering studies on the C60 films deposited by ionized cluster beam deposition (ICBD) techniqueSHI, Y; FAN, X. J; GUO, H. X et al.Solid state communications. 1996, Vol 99, Num 6, pp 445-450, issn 0038-1098, 5 p.Article
Sample rocking and rotation in ion beam etchingTAGG, M. A; SMITH, R; WALLS, J. M et al.Journal of materials science. 1986, Vol 21, Num 1, pp 123-130, issn 0022-2461Article
3D ion multi-beam processing with CHARPAN PMLP tool and with a single ion beam FIB tool, optimized with the 'IonRevSim' softwareZAITSEV, S; SVINTSOV, A; EBM, C et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7271, issn 0277-786X, isbn 978-0-8194-7524-4 0-8194-7524-6, 72712P.1-72712P.8, 2Conference Paper
Focused ion beam microscopy and micromachining : Focused ion beam microscopy and micromachiningVOLKERT, C. A; MINOR, A. M.MRS bulletin. 2007, Vol 32, Num 5, pp 389-395, issn 0883-7694, 7 p.Article
Divergence measurements for characterization of the micropatterning quality of broad ion beamsHUTH, C; SCHEER, H.-C; SCHNEEMANN, B et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1990, Vol 8, Num 6, pp 4001-4010, issn 0734-2101Article
Faisceaux d'ions: Théorie et mise en oeuvreFORTUNA, Franck; OLIVIERO, Erwan; RUAULT, Marie-Odile et al.Techniques de l'ingénieur. Matériaux métalliques. 2009, Vol MB3, Num M4395, issn 1762-8733, M4395.1-M4395.23Article
PIC simulation of N2 and C2H2 plasma behavior around plural objectsMIYAGAWA, Y; NAKADATE, H; TANAKA, M et al.Surface & coatings technology. 2007, Vol 201, Num 19-20, pp 8414-8419, issn 0257-8972, 6 p.Conference Paper
Simulation simplifiée de l'extraction et de la focalisation d'un faisceau extrait d'une optique multiouverture = Simplified simulation of extraction and focusing of a beam extracted from a multiaperture opticsCOSTE, P; AUBERT, J.Le Vide, les couches minces. 1993, Vol 49, Num 266, pp 87-100, issn 0223-4335Article
Treatment of edge beams in a focusing self-magnetically B○÷-insulated ion diodeWESTERMANN, T; BAUER, W.Laser and particle beams (Print). 1992, Vol 10, Num 3, pp 539-547, issn 0263-0346Article
A note on the adaptive optimal control of ion accelerator facilitiesTUANHUA HUANG.IEEE transactions on nuclear science. 1990, Vol 37, Num 3, pp 1461-1467, issn 0018-9499, 7 p., 1Article
Production of a highly ionized ion beam by a plasma focusHIRANO, K; YAMAMOTO, T; SHIMODA, K et al.Journal of the Physical Society of Japan. 1989, Vol 58, Num 10, pp 3591-3599, issn 0031-9015, 9 p.Article
Quantification of SIMS on titanium carbidesBRAULT, G; MONCOFFRE, N; PIVIN, J. C et al.Surface and interface analysis. 1989, Vol 14, Num 9, pp 537-542, issn 0142-2421, 6 p.Conference Paper
Proceedings of the 15th International Conference on Surface Modification of Materils by Ion BeamsKOTHARI, D. C; BAGLIN, John E. E; ENSINGER, W et al.Surface & coatings technology. 2009, Vol 203, Num 17-18, issn 0257-8972, 472 p.Conference Proceedings
Lonenstrahlpräparation : ein treffliches Werkzeug zur Charakterisierung der Zwischenprodukte des schmelzpulvermetallurgischen Aluminiumschäumverfahrens = Ion Beam Preparation : an Excellent Instrument for the Characterization of the Byproducts of the Melt Powder Metallurgical Aluminum Foam ProcessHÖHN, Sören; OBENAUS, Peter; HOHLFELD, Jörg et al.Praktische Metallographie. 2008, Vol 45, Num 3, pp 122-134, issn 0032-678X, 13 p.Article
Damage effects of 1 MeV proton bombardment in PVDC polymeric filmPARADA, M. A; DE ALMEIDA, A; VOLPE, P. N et al.Surface & coatings technology. 2007, Vol 201, Num 19-20, pp 8052-8054, issn 0257-8972, 3 p.Conference Paper
Amorphous-crystal silicon interfaces : structure and movement under ion beam irradiationBATTAGLIA, A; PRIOLO, F; RIMINI, E et al.Applied surface science. 1992, Vol 56-58, pp 577-588, issn 0169-4332, bConference Paper