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Two- and three-dimensional methods for inspection and metrology V (11-12 September 2007, Boston, Massachusetts, USA)Huang, Peisen S.Proceedings of SPIE, the International Society for Optical Engineering. 2008, issn 0277-786X, isbn 978-0-8194-6922-9, 1 v. (various pagings), isbn 978-0-8194-6922-9Conference Proceedings

Absolute phase retrieval for 3D shape measurement by the Fourier transform methodHONG GUO; HUANG, Peisen S.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 676204.1-676204.10, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

Mobile shearography in applicationsKALMS, Michael.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 67620K.1-67620K.9, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

Hybrid interferometric, structured light method for surface mappingHARDING, Kevin; ABRAMOVICH, Gil.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 67620F.1-67620F.9, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

Recent trends in white-light interferometryKITAGAWA, Katsuichi.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 638201.1-638201.10, issn 0277-786X, isbn 0-8194-6480-5, 1VolConference Paper

Two- and three-dimensional methods for inspection and metrology IV (1-3 October, 2006, Boston, Massachusetts, USA)Huang, Peisen S.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6480-5, 1Vol, various pagings, isbn 0-8194-6480-5Conference Proceedings

Optical metrology and inspection for industrial applications (18-20 October 2010, Beijing, China)Harding, Kevin; Huang, Peisen S; Yoshizawa, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 1 vol, isbn 978-0-8194-8385-0Conference Proceedings

Phase shifting shadow moiré using the Carré algorithmHUANG, Peisen S; HONG GUO.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660B.1-70660B.7, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

On improving the accuracy of structured light systemsHUANG, Peisen S; XU HAN.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 63820H.1-63820H.8, issn 0277-786X, isbn 0-8194-6480-5, 1VolConference Paper

3-D shape measurement by use of a modified Fourier transform methodHONG GUO; HUANG, Peisen S.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, pp 70660E.1-70660E.8, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1VolConference Paper

Network-based Production Quality ControlKWON, Yongiin; TSENG, Bill; CHIOU, Richard et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 67620G.1-67620G.10, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

3D profilometry: Next requests from the industrial view pointHARDING, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 785513.1-785513.11Conference Paper

The Research of On-line Inspection Method of Printed Matter Based on Optical Information ProcessingWANG JIA.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 78551T.1-78551T.6Conference Paper

Applications of a MEMS scanner to profile measurementYOSHIZAWA, Toru; WAKAYAMA, Toshitaka; TAKANO, Hiroshi et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 67620B.1-67620B.5, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

Dimensional optical metrology and inspection for practical applications (222-23 August 2011, San Diego, California, United States)Harding, Kevin G; Huang, Peisen S; Yoshizawa, Toru et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8133, issn 0277-786X, isbn 978-0-8194-8743-8, 1 vol, isbn 978-0-8194-8743-8Conference Proceedings

Two- and three-dimensional methods for inspection and metrology VI (10-11 August 2008, San Diego, California, USA)Huang, Peisen S; Yoshizawa, Tōru; Harding, Kevin G et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7066, issn 0277-786X, isbn 978-0-8194-7286-1 0-8194-7286-7, 1Vol, various pagings, isbn 978-0-8194-7286-1 0-8194-7286-7Conference Proceedings

Optimized scattering compensation for time-of-flight cameraMURE-DUBOIS, James; HIIGLI, Heinz.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 67620H.1-67620H.10, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

Optical FMCW Interference -a New Technology for Optical MetrologyGANG ZHENG.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 78550Q.1-78550Q.7Conference Paper

3-D Data Merging using HoloimageSONG ZHANG; YAU, Shing-Tung.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 676209.1-676209.9, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

Improved feature descriptors for 3-D surface matchingSKELLY, Luke J; SCLAROFF, Stan.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 67620A.1-67620A.12, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

Single Image Depth Edges Classification using a Red, Green and Blue LightMATTHIAS, Voigt; FELIX, Ospald; VISVANATHAN, Ramesh et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 676205.1-676205.10, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

Multi-resolution 3D measurement using a hybrid fringe projection and moire approachHARDING, Kevin; QINGYING HU.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 63820K.1-63820K.8, issn 0277-786X, isbn 0-8194-6480-5, 1VolConference Paper

PEM-Based Polarimeters For Industrial ApplicationsBAOLIANG WANG.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7855, issn 0277-786X, isbn 978-0-8194-8385-0, 785502.1-785502.14Conference Paper

Optical inspection and metrology for non-optics industries (3-4 August 2009, San Diego, California, United States)Huang, Peisen S; Yoshizawa, Tōru; Harding, Kevin G et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7432, issn 0277-786X, isbn 978-0-8194-7722-4 0-8194-7722-2, 1 vol, isbn 978-0-8194-7722-4 0-8194-7722-2Conference Proceedings

A ray tracing approach to inverse pattern profilometryPUTZ, Veronika; ZAGAR, Bernhard G.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 67620I.1-67620I.12, issn 0277-786X, isbn 978-0-8194-6922-9Conference Paper

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