ECONOMIC CHOICE OF COMPONENT TOLERANCESILUMOKA A; SPENCE R.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 25-26; PP. 979-980; BIBL. 2 REF.Article

A SENSITIVITY-BASED APPROACH TO TOLERANCE ASSIGNMENTILUMOKA A; SPENCE R.1982; IEE PROC., G; ISSN 0143-7089; GBR; DA. 1982; VOL. 129; NO 4; PP. 139-149; BIBL. 18 REF.Article

A modular neural network approach to microelectronic circuit yield optimizationILUMOKA, A. A.Microelectronics and reliability. 1998, Vol 38, Num 4, pp 571-580, issn 0026-2714Article

A tolerance analysis approach to network scheduling for engineering project managementILUMOKA, A. A.International journal of production research. 1987, Vol 25, Num 4, pp 531-547, issn 0020-7543Article

A comparison of deterministic and statistical sampling techniques for quality analysis of integrated circuitsILUMOKA, A. A.Quality and reliability engineering international. 1993, Vol 9, Num 6, pp 489-499, issn 0748-8017Article

Off-line quality control via yield constrained variability minimization in circuit designILUMOKA, A. A.Quality and reliability engineering international. 1991, Vol 7, Num 5, pp 417-423, issn 0748-8017Article

VARIABILITY REDUCTION: STATISTICALLY BASED ALGORITHMS FOR REDUCTION OF PERFORMANCE VARIABILITY OF ELECTRICAL CIRCUITSILUMOKA A; MARATOS N; SPENCE R et al.1982; IEE PROC., G; ISSN 0143-7089; GBR; DA. 1982; VOL. 129; NO 4; PP. 169-180; BIBL. 31 REF.Article

Efficient and accurate crosstalk prediction via neural net-based topological decomposition of 3-D interconnectILUMOKA, A. A.IEEE transactions on advanced packaging. 2001, Vol 24, Num 3, pp 268-276, issn 1521-3323Conference Paper