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A STRUCTURAL DEFECT OF NATURAL MAGNETIC OBSERVED IN AN ELECTRON MICROSCOPE LATTICE IMAGE.HORIUCHI S; MATSUI Y; KATO K et al.1975; JAP. J. APPL. PHYS.; JAP.; DA. 1975; VOL. 14; NO 11; PP. 1837-1838; BIBL. 9 REF.Article

THE DIRECT OBSERVATION OF THE STRUCTURE OF REAL CRYSTALS BY LATTICE IMAGINGALLPRESS JG; SANDERS JV.1973; J. APPL. CRYSTALLOGR.; DENM.; DA. 1973; VOL. 6; NO 3; PP. 165-190; BIBL. 2 P.Serial Issue

LATTICE IMAGING OF FAULTED DIPOLES IN SILICONSPENCE JCH; KOLAR H.1979; PHILOS. MAG., A; GBR; DA. 1979; VOL. 39; NO 1; PP. 59-63; BIBL. 13 REF.Article

CALCULATED IMAGES OF CRYSTAL LATTICES BY AXIAL ILLUMINATION WITH 1 MEV ELECTRONS.BOURRET A; DESSEAUX J; RENAULT A et al.1975; ACTA CRYSTALLOGR, A; DANEM.; DA. 1975; VOL. 31; NO 6; PP. 746-752; BIBL. 11 REF.Article

TEM OBSERVATIONS ON GRAIN BOUNDARIES IN SINTERED SILICONFOLL H; AST D.1979; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1979; VOL. 40; NO 5; PP. 589-610; BIBL. 21 REF.Article

AN INTRODUCTION TO CRYSTAL LATTICE IMAGING WITH THE ELECTRON MICROSCOPE.PARSONS JR.1978; MATER. RES. BULL.; USA; DA. 1978; VOL. 13; NO 5; PP. 399-405; BIBL. 4 REF.Article

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EFFECT OF ABSORPTION ON LATTICE IMAGESPIROUZ P.1979; OPTIK; DEU; DA. 1979; VOL. 54; NO 1; PP. 69-74; ABS. GER; BIBL. 7 REF.Article

OBSERVATIONS OF CRYSTAL STRUCTURE IMAGES OF SILICON.IZUI K; FURUNO S; OTSU H et al.1977; J. ELECTRON MICR.; JAP.; DA. 1977; VOL. 26; NO 2; PP. 129-132; BIBL. 5 REF.Article

EFFECTS OF SPHERICAL ABERRATION AND ACCELERATING VOLTAGE ON ATOMIC RESOLUTION IN MOLECULAR IMAGES.UYEDA N; ISHIZUKA K.1974; J. ELECTRON MICR.; JAP.; DA. 1974; VOL. 23; NO 2; PP. 79-88; BIBL. 14 REF.Article

LATTICE IMAGES OF DISLOCATIONS IN THE FERROELECTRIC MATERIAL BA₂BI₄TI₅O₁₈.HUTCHISON JL; ANDERSON JS; RAO CNR et al.1975; NATURE; G.B.; DA. 1975; VOL. 255; NO 5509; PP. 541-542; BIBL. 3 REF.Article

LATTICE IMAGING1972; IN: 30TH ANNU. MEET. 1ST PAC. REG. CONF. ELECTRON MICROSC. LOS ANGELES, CALIF., 1972. PROC.; BATON ROUGE; CLAITOR'S PUBL. DIV.; DA. 1972; PP. 548-571; BIBL. DISSEM.Conference Proceedings

LATTICE IMAGES1971; IN: 29TH ANNU. MEET. ELECTRON MICROSC. SOC. AMERICA PROC. BOSTON, MASS., 1971; BATON ROUGE; CLAITOR'S PUBL. DIV.; DA. 1971; PP. 160-169; BIBL. DISSEM.Conference Proceedings

HIGH-RESOLUTION ELECTRON MICROSCOPE OBSERVATIONS OF B''''-ALUMINA PREPARED IN A NA₂O-MGO-AL₂O₃ SYSTEMMATSUI Y; HORIUCHI S; OHTA T et al.1980; J. SOLID STATE CHEM.; GBR; DA. 1980; VOL. 32; NO 2; PP. 181-184; BIBL. 15 REF.Article

STRUCTURE AND "OXIDATION BEHAVIOR" OF W₂₄O₇₀, A NEW MEMBER OF THE (103) CS SERIES OF TUNGSTEN OXIDESSUNDBERG M.1980; J. SOLID STATE CHEM.; ISSN 0022-4596; GBR; DA. 1980; VOL. 35; NO 1; PP. 120-127; BIBL. 23 REF.Article

TWO NEW LONG-PERIOD STRUCTURES RELATED TO BETA -ALUMINABOVIN JO; O'KEEFFE M.1980; J. SOLID STATE CHEM.; GBR; DA. 1980; VOL. 33; NO 1; PP. 37-41; BIBL. 14 REF.Article

A HIGH VOLTAGE ELECTRON MICROSCOPE CONSTRUCTED FOR OBSERVING HIGH-RESOLUTION CRYSTAL STRUCTURE IMAGES.HORIUCHI S; MATSUI Y; BANDO Y et al.1978; J. ELECTRON MICR.; JPN; DA. 1978; VOL. 27; NO 1; PP. 39-48; BIBL. 24 REF.Article

IMAGE RETICULAIRE EN MICROSCOPIE ELECTRONIQUE A HAUTE RESOLUTIONHASHIMOTO H; ENDOH H.1976; OYO BUTURI; JAP.; DA. 1976; VOL. 45; NO 2; PP. 104-124; ABS. ANGL.; BIBL. 2 P.Article

ELECTRON-DIFFRACTION AND ELECTRON-MICROSCOPIC OBSERVATION OF THE PSEUDO BINARY TIO₂-V₂O₃ SYSTEM.KOSUGE K; KACHI S.1975; CHEM. SCRIPTA; SUEDE; DA. 1975; VOL. 8; NO 2; PP. 70-83; BIBL. 23 REF.Article

LATTICE RESOLUTION IN AN ELECTRON-BEAM SENSITIVE POLYMER.DOBB MG; HINDELER AM; JOHNSON DJ et al.1975; NATURE; G.B.; DA. 1975; VOL. 253; NO 5488; PP. 189-190; BIBL. 11 REF.Article

HIGH RESOLUTION ELECTRON MICROSCOPY STUDY OF GEASSESIEGRIST T; WESSICKEN R.1982; MATER. RES. BULL.; ISSN 0025-5408; USA; DA. 1982; VOL. 17; NO 3; PP. 351-354; BIBL. 4 REF.Article

LATTICE-IMAGING ON INTERGROWTH STRUCTURES OF SILICON CARBIDESINGH SR; SINGH G.1980; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1980; VOL. 36; NO 5; PP. 779-784; BIBL. 15 REF.Article