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MEASUREMENT OF X-RAY INTEGRATED INTENSITY WITH DIAGNOSTIC IDENTIFICATION OF PEAK AND BACKGROUNDMATHIESON AM.1983; ACTA CRYSTALLOGRAPHICA. SECTION A. CRYSTAL PHYSICS, DIFFRACTION, THEORETICAL AND GENERAL CRYSTALLOGRAPHY; ISSN 0567-7394; DNK; DA. 1983; VOL. 39; NO 1; PP. 79-83; BIBL. 5 REF.Article

DETERMINATION DE L'INTENSITE INTEGREE EN STEP-SCANNINGRIGOULT J.1979; J. APPL. CRYSTALLOGR.; DNK; DA. 1979; VOL. 12; NO 1; PP. 116-118; ABS. ENG; BIBL. 3 REF.Article

ON THE DERIVATION OF INTEGRATED REFLECTED ENERGY FORMULAEKALMAN ZH.1979; ACTA CRYSTALLOGR., A; DNK; DA. 1979; VOL. 35; NO 4; PP. 634-641; BIBL. 2 REF.Article

LORENTZ FACTORS FOR LARGE-MOSAIC CRYSTALSAXE JD; HASTINGS JB.1983; ACTA CRYSTALLOGRAPHICA. SECTION A. CRYSTAL PHYSICS, DIFFRACTION, THEORETICAL AND GENERAL CRYSTALLOGRAPHY; ISSN 0567-7394; DNK; DA. 1983; VOL. 39; NO 4; PP. 593-594; BIBL. 3 REF.Article

OPTIMIZATION OF THE MEASURING TIME IN DIFFRACTION INTENSITY MEASUREMENTS.SZABO P.1978; ACTA CRYSTALLOGR., A; DNK; DA. 1978; VOL. 34; NO 4; PP. 551-553; BIBL. 5 REF.Article

AN EXPERIMENTAL INVESTIGATION OF THE TRUNCATION ERRORS INCURRED IN SINGLE-CRYSTAL DIFFRACTOMETRY.DENNE WA.1977; ACTA CRYSTALLOGR., A; DANEM.; DA. 1977; VOL. 33; NO 3; PP. 438-440; BIBL. 10 REF.Article

INFLUENCE OF POLARIZATION OF THE INCIDENT BEAM ON INTEGRATED INTENSITIES IN X-RAY ENERGY-DISPERSIVE DIFFRACTOMETRY.OLSEN JS; BURAS B; JENSEN T et al.1978; ACTA CRYSTALLOGR., A; DANEM.; DA. 1978; VOL. 34; NO 1; PP. 84-87; BIBL. 12 REF.Article

EXTENSION-FREE MEASUREMENTS WITH PLANE-POLARIZED X-RAYS.MATHIESON AML.1977; ACTA CRYSTALLOGR., B; DANEM.; DA. 1977; VOL. 33; NO 1; PP. 133-136; BIBL. 21 REF.Article

BEITRAG ZUM ROENTGENOGRAPHISCHEN NACHWEIS VON PHASEN MIT GERINGEN VOLUMENANTEILEN. = CONTRIBUTION A LA MISE EN EVIDENCE PAR RX DE PHASES AVEC DES PARTICIPATIONS VOLUMIQUES FAIBLESOETTEL H; HAASE I.1977; KRISTALL U. TECH.; DTSCH.; DA. 1977; VOL. 12; NO 8; PP. 841-848; ABS. ANGL.; BIBL. 6 REF.Article

NON-CENTROSYMMETRIC EFFECTS IN THE INTEGRATED TWO-BEAM BRAGG INTENSITY NEAR A THREE-BEAM POINTJURETSCHKE HJ.1982; PHYS. LETT. SECT. A; ISSN 0375-9601; NLD; DA. 1982; VOL. 92; NO 4; PP. 183-185; BIBL. 14 REF.Article

METHODE D'ETUDE PAR DIFFRACTION DE RAYONS X DES STRUCTURES CRISTALLINES DANS LE CAS DE MULTIPLETS DE DIFFRACTION NON RESOLUSTKACHEV SP.1982; KRISTALLOGRAFIJE; ISSN 0023-4761; SUN; DA. 1982; VOL. 27; NO 4; PP. 664-667; BIBL. 3 REF.Article

EFFECTS OF DISLOCATION DENSITY ON INTEGRATED INTENSITY OF X-RAY SCATTERING BY SILICON CRYSTALS IN LAUE GEOMETRYOLEKHNOVICH NM; KARPEI AL; OLEKHNOVICH AI et al.1983; ACTA CRYSTALLOGRAPHICA. SECTION A. CRYSTAL PHYSICS, DIFFRACTION, THEORETICAL AND GENERAL CRYSTALLOGRAPHY; ISSN 0567-7394; DNK; DA. 1983; VOL. 39; NO 1; PP. 116-122; BIBL. 16 REF.Article

EXPERIMENTAL DETERMINATION OF THE TOTAL INTEGRATED INTENSITY OF VARIOUS DOUBLETS OF CS ABSORPTION SERIES UNDER VARIOUS PRESSURES OF FOREIGN GASESGILBERT DE; SHANG YI CH'EN.1981; J. QUANT. SPECTROSC. RADIAT. TRANSFER; ISSN 0022-4073; GBR; DA. 1981; VOL. 25; NO 6; PP. 501-504; BIBL. 6 REF.Article

ON THE ASYMMETRIC LIMITS FOR THE SCATTERING OF X-RAYS FROM IMPERFECT CRYSTALS IN THE BRAGG CASEWILKINS SW.1980; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1980; VOL. 36; NO 1; PP. 143-146; BIBL. 21 REF.Article

POLARIZATION RATIO OF A DIFFRACTED-BEAM MONOCHROMATOR IN X-RAY POWDER DIFFRACTOMETRYALTREE WILLIAMS S; JORDAN B.1980; ANAL. CHEM. (WASH.); ISSN 0003-2700; USA; DA. 1980; VOL. 52; NO 8; PP. 1296-1300; BIBL. 14 REF.Article

RAMAN INTENSITIES OF STRETCH ORIENTED POLYETHYLENE AND PERDEUTEROPOLYETHYLENE. I: EXPERIMENTSMASETTI G; ABBATE S; GUSSONI M et al.1980; J. CHEM. PHYS.; ISSN 0021-9606; USA; DA. 1980; VOL. 73; NO 9; PP. 4671-4679; BIBL. 18 REF.Article

STATISTICAL DYNAMICAL THEORY OF CRYSTAL DIFFRACTION. II: INTENSITY DISTRIBUTION AND INTEGRATED INTENSITY IN THE LANE CASESKATO N.1980; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1980; VOL. 36; NO 5; PP. 770-778; BIBL. 9 REF.Article

MESURE DES INTENSITES INTEGREES DES BANDES INFRAROUGES DES SUBSTANCES CRISTALLINES DANS UNE MATRICE DE POLYETHYLENEROZENBERG M SH; YAKINA VA.1980; ZH. PRIKL. SPEKTROSK.; BYS; DA. 1980; VOL. 32; NO 4; PP. 669-674; ABS. ENG; BIBL. 9 REF.Article

ON NUCLEAR SPIN STATISTICS IN ROTATIONAL TRANSITION INTENSITIES IN TETRAHEDRAL AB4 MOLECULESROSENBERG A; SUSSKIND J.1979; CAN. J. PHYS.; ISSN 0008-4204; CAN; DA. 1979; VOL. 57; NO 8; PP. 1081-1089; ABS. FRE; BIBL. 29 REF.Article

THE EFFECT OF NEUTRON IRRADIATION ON THE LATTICE PARAMETER AND ANOMALOUS X-RAY TRANSMISSION OF SILICONBALDWIN TO; THOMAS JE; HALDEMAN JK et al.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 5; PP. 3748-3751; BIBL. 9 REF.Article

INFRARED INTENSITIES, POLAR TENSORS, AND ATOMIC POPULATION DENSITIES IN MOLECULES.KING WT; MAST GB.1976; J. PHYS. CHEM.; U.S.A.; DA. 1976; VOL. 80; NO 22; PP. 2521-2525; BIBL. 54 REF.Article

ANATOMY OF A BRAGG REFLEXION AND AN IMPROVED PRESCRIPTION FOR INTEGRATED INTENSITYMATHIESON AM.1982; ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS. DIFFR. THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1982; VOL. 38; NO 3; PP. 378-387; BIBL. 16 REF.Article

POLARIZATION OF MOKALPHA -RADIATION OF THE BRAGG DIFFRACTION IN REAL SILICON CRYSTALSOLEKHNOVICH NM; KARPEI AL; MARKOVICH VL et al.1978; KRISTALL U. TECH.; DDR; DA. 1978; VOL. 13; NO 12; PP. 1463-1469; BIBL. 7 REF.Article

NAEHERUNGSVERFAHREN FUER DIE INTEGRALDARSTELLUNG VON BEUGUNGSINTENSITAETEN GESTOERTER KRISTALLE = PROCEDE D'APPROXIMATION POUR LA REPRESENTATION INTEGRALE DES INTENSITES DE DIFFRACTION DE CRISTAUX PERTURBESCARL S; SCHEERSCHMIDT K.1978; KRISTALL U. TECH.; DDR; DA. 1978; VOL. 13; NO 9; PP. 1135-1140; ABS. ENG; BIBL. 2 REF.Article

SIMPLE ISOTOPIC PRODUCT RULES VALID FOR ABSOLUTE AND INTEGRATED INFRARED INTENSITIES.ALIX AJP.1976; J. MOLEC. STRUCT.; NETHERL.; DA. 1976; VOL. 33; NO 1; PP. 137-139; BIBL. 11 REF.Article

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