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AN INTERFEROMETRIC HEAT FLUX MEASURING DEVICESERNAS V; FLETCHER LS; JONES JA et al.1972; I.S.A. TRANS.; U.S.A.; DA. 1972; VOL. 11; NO 4; PP. 346-357; BIBL. 5 REF.Serial Issue

DUAL HOLOGRAM INTERFEROMETRYHAVENER G; RADLEY RJ JR.1972; OPTO-ELECTRONICS; G.B.; DA. 1972; VOL. 4; NO 4; PP. 349-357; BIBL. 2 REF.Serial Issue

ONE-DIMENSIONAL STELLAR AND SOLAR SPECKLE INTERFEROMETRY.AIME C; RODDIER F.1977; OPT. COMMUNIC.; NETHERL.; DA. 1977; VOL. 21; NO 3; PP. 435-438; BIBL. 16 REF.Article

THE MICROSTRUCTURE OF POLISHED OPTICAL SURFACES.EASTMAN J; BAUMEISTER P.1974; OPT. COMMUNIC.; NETHERL.; DA. 1974; VOL. 12; NO 4; PP. 418-420; BIBL. 11 REF.Article

PRACTICAL INTERPRETATION OF HOLOGRAPHIC INTERFEROGRAMSABRAMSON N.1973; OPTIK; DTSCH.; DA. 1973; VOL. 37; NO 3; PP. 337-346; ABS. ALLEM.; BIBL. 4 REF.Serial Issue

ULTRASONIC SURFACE WAVE DETECTION BY OPTICAL INTERFEROMETRYPALMER CH.1973; J. ACOUST. SOC. AMER.; U.S.A.; DA. 1973; VOL. 53; NO 3; PP. 948-949; BIBL. 3 REF.Serial Issue

ZUR GENAUIGKEIT DER MESSUNGEN KLEINER OPTISCHER DREHUNGEN MIT EINEM RINGINTERFEROMETER. = PRECISION DE LA MESURE DE PETITES ROTATIONS OPTIQUE AVEC UN INTERFEROMETRE ANNULAIREZANDER K.1974; OPT. ACTA; G.B.; DA. 1974; VOL. 21; NO 10; PP. 793-799; ABS. ANGL. FR.; BIBL. 3 REF.Article

PHASE CHARACTERISTIC FUNCTION OF HOLOGRAPHIC IMAGES OF OBJECTS IN PARABOLIC MOTIONBHATNAGAR GS; CHOPRA KN; MAGGO JN et al.1973; APPL. OPT.; U.S.A.; DA. 1973; VOL. 12; NO 4; PP. 887-888; BIBL. 5 REF.Serial Issue

MESURE PAR UNE METHODE INTERFEROMETRIQUE DE L'AMPLITUDE DES OSCILLATIONS DE LONGUEUR D'ONDE PLUS GRANDE QUE CELLE DE LA LUMIEREZASLAVSKAYA VR.1972; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1972; NO 5; PP. 202-203; BIBL. 1 REF.Serial Issue

DENSITOMETRIE PAR INTERFEROMETRIEDE BAZELAIRE E; CHAMBARET JP.sdIN: TRAIT. IMAGES. JOURN. ETUD. CENT. NATL. ETUD. SPAT.; PARIS; S.L.; DA. S.D.; PP. 239-244; ABS. ANGLConference Paper

MESURE INTERFERENTIELLE DES PETITS ECARTS PAR RAPPORT A UN ACIDE DONNEZUBAKOV VG; MANUKYAN ZH B.1975; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1975; VOL. 42; NO 10; PP. 5-9; BIBL. 8 REF.Article

DETERMINATION INTERFEROMETRIQUE DE L'INDICE DE REFRACTIONDROZDOVSKIJ VB; MIKHAJLYUK IP; RARANSKIJ ND et al.1974; UKRAIN. FIZ. ZH.; S.S.S.R.; DA. 1974; VOL. 19; NO 8; PP. 1391-1392; BIBL. 5 REF.Article

INCREASED CONTRAST IN HOLOGRAPHIC INTERFEROMETRYLANDRY MJ; HESSEL KR.1973; APPL. OPT.; U.S.A.; DA. 1973; VOL. 12; NO 2; PP. 417-418; BIBL. 1 REF.Serial Issue

MOIRE TOPOGRAPHYTAKASAKI H.1973; APPL. OPT.; U.S.A.; DA. 1973; VOL. 12; NO 4; PP. 845-850; BIBL. 4 REF.Serial Issue

A DIRECT APPROACH TO REDUCE RECORDING TIME IN STROBOSCOPIC HOLOGRAPHIC INTERFEROMETRYVIKRAM CS.1973; NOUV. REV. OPT.; FR.; DA. 1973; VOL. 4; NO 3; PP. 147-149; ABS. FR.; BIBL. 9 REF.Serial Issue

OPTICAL ANALYSIS OF INTERNAL STRAINS IN LASER RODS USING INTERFEROMETRYDEB KK.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 24; PP. 4146-4147; BIBL. 16 REF.Article

SIMPLE METHOD OF PRODUCING A VARIABLE FREQUENCY SINE-WAVE GRATINGMURTY MVRK; SHUKLA RP.1979; OPT. ENGNG; USA; DA. 1979; VOL. 18; NO 5; PP. 526-528; BIBL. 2 REF.Article

DU ROLE DE LA CONTRAINTE TANGENTIELLE DANS LA MESURE DES CONTRAINTES NORMALES PAR UNE METHODE INTERFERENTIELLESHARTS AA.1979; INZ.-FIZ. Z.; ISSN 0021-0285; BYS; DA. 1979; VOL. 37; NO 3; PP. 479-482; ABS. ENG; BIBL. 6 REF.Article

MEASUREMENTS OF REFRACTIVE INDEXES OF GASES EXTENDED IN THE VACUUM ULTRAVIOLET AND REVISED VALUES FOR KRYPTON.BIDEAU MEHU A; GUERN Y; ABJEAN R et al.1976; OPT. COMMUNIC.; NETHERL.; DA. 1976; VOL. 16; NO 1; PP. 186-189; BIBL. 15 REF.Article

CONTROLE D'UNE SURFACE ASPHERIQUE D'APRES LES ANNEAUX D'INTERFERENCESHAPOCHKIN BA; KOMRAKOV BM.1976; IZVEST. VYSSH. UCHEBN. ZAVED., PRIBOROSTR.; S.S.S.R.; DA. 1976; VOL. 19; NO 3; PP. 115-120; BIBL. 2 REF.Article

PHYSIKALISCHE GRUNDLAGEN NEUERER INTERFEROMETRISCHER METHODEN. = PRINCIPES PHYSIQUES DE NOUVELLES METHODES INTERFEROMETRIQUESRUDER H.1976; MITT. ASTR. GESELLSCH.; DTSCH.; DA. 1976; NO 40; PP. 23-26; BIBL. 22 REF.Article

DERIVATION OF ONE DIMENSIONAL REFRACTIVE-INDEX PROFILES FROM INTERFEROGRAMS.MCLARNON FR; MULLER RH; TOBIAS CW et al.1975; J. OPT. SOC. AMER.; U.S.A.; DA. 1975; VOL. 65; NO 9; PP. 1011-1018; BIBL. 16 REF.Article

SOME OBSERVATIONS ON THE DIRECT COMPARISON OF THE GEOMETRY OF TWO OBJECTS USING SPECKLE PATTERN INTERFEROMETRIC COUNTOURING.JONES R; BUTTERS JN.1975; J. PHYS. E; G.B.; DA. 1975; VOL. 8; NO 3; PP. 231-234; BIBL. 5 REF.Article

SPHERICAL ABERRATION MEASUREMENT WITH SHEARING INTERFEROMETER USING FOURIER IMAGING AND MOIRE METHOD.YOKOZEKI S; OHNISHI K.1975; APPL. OPT.; U.S.A.; DA. 1975; VOL. 14; NO 3; PP. 623-627; BIBL. 6 REF.Article

MESURE DE L'AMPLITUDE DES VIBRATIONS ANGULAIRES A L'AIDE D'UN INTERFEROMETREMENCHIKOV VM.1975; IZMERITEL. TEKH.; S.S.S.R.; DA. 1975; NO 2; PP. 48; BIBL. 5 REF.Article

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