Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("ION MICROPROBE")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 268

  • Page / 11

Export

Selection :

  • and

THE COMBINED EFFECT OF SI AND P ON THE OXIDATION OF IRON AND THE CAMECA STUDIES OF THE OXIDE SCALE.POMPE R; SVEDUNG I; VANNERBERG NG et al.1976; SCAND. J. METALLURGY; SWED.; DA. 1976; VOL. 5; NO 6; PP. 258-261; BIBL. 6 REF.Article

AN AUTOMATED SCANNING ION MICROBEAM SYSTEMREQUICHA FERREIRA LF; CALVERT JM.1981; NUCL. INSTRUM. METHODS PHYS. RES.; ISSN 502936; NLD; DA. 1981; VOL. 188; NO 1; PP. 177-183; BIBL. 18 REF.Article

SURFACE CHARACTERIZATION BY ION MICROPROBE ANALYSER.STEWART IM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 367-373; BIBL. 4 REF.Conference Paper

ESSAIS D'IDENTIFICATION DES OXYDES DE FER AU MOYEN DU MICROANALYSEUR A SONDE IONIQUENAMDAR IRANI R.1978; CENTRE DOCUMENT. SIDER., CIRC. INFORM. TECH.; FRA; DA. 1978; VOL. 35; NO 7-8; PP. 1461-1467; BIBL. 3 REF.Article

On the optimization of ion microprobesZHIFENG SHAO; WANG, Y. L.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1990, Vol 8, Num 1, pp 95-99, issn 0734-211X, 5 p.Article

SCANNING MICROBEAM USING A LIQUID METAL ION SOURCEISHITANI T; TAMURA H; TODOKORO H et al.1982; J. VAC. SCI. TECHNOL.; ISSN 0022-5355; USA; DA. 1982; VOL. 20; NO 1; PP. 80-83; BIBL. 11 REF.Article

DETECTION OF SPUTTER CONTAMINATION AND SPUTTER ETCH RESIDUE BY ION MICROPROBE ANALYSISANDREWS JM; KATE LE; COLBY JW et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 67; NO 2; PP. 325-340; BIBL. 20 REF.Article

QUANTITATIVE ANALYSIS OF HIGH TEMPERATURE ALLOYS WITH AN ION MICROANALYZER.OKAZIMA Y; AIZAWA Y.1977; MASS SPECTROSC.; JAP.; DA. 1977; VOL. 25; NO 1; PP. 91-97; BIBL. 8 REF.Article

IMPROVEMENT OF THE DETECTION LIMIT OF CARBON IN METAL ALLOYS BY ION MICROPROBE ANALYSISBESKE HE; HOLZBRECHER H; RADEMACHER L et al.1980; MIKROCHIM. ACTA; AUT; DA. 1980; VOL. PT.; NO 5/6; PP. 409-416; BIBL. 6 REF.Article

APPLICATIONS OF THE ION MICROPROBE TO GEOCHEMISTRY AND COSMOCHEMISTRYSHIMIZU N; HART SR.1982; ANNU. REV. EARTH PLANET. SCI.; ISSN 0084-6597; USA; DA. 1982; VOL. 10; PP. 483-526; BIBL. 3 P.Article

A FURTHER STEP TOWARDS THREE-DIMENSIONAL ELEMENTAL ANALYSIS OF SOLIDSRUEDENAUER FG; STEIGER W.1981; MIKROCHIM. ACTA; AUT; DA. 1981; VOL. PT.; NO 5/6; PP. 375-389; BIBL. 9 REF.Article

USE OF ION MICROANALYZER IN THE ANALYSIS OF PASSIVE LAYERS ON STAINLESS STEELOKASIMA Y; AIZAWA Y; SUGAWARA Y et al.1978; BULL. CHEM. SOC. JAP.; JPN; DA. 1978; VOL. 51; NO 8; PP. 2298-2301; BIBL. 14 REF.Article

QUANTITATIVE ION PROBE MEASUREMENT USING MATRIX ION SPECIES RATIOS.GANJEI JD; LETA DP; MORRISON GH et al.1978; ANAL. CHEM.; U.S.A.; DA. 1978; VOL. 50; NO 2; PP. 285-290; BIBL. 10 REF.Article

ION BEAM-TARGET INTERACTIONS IN ION MICROPROBE ANALYSISUNILSON GC.1982; INT. J. MASS SPECTROM. ION PHYS.; ISSN 0020-7381; NLD; DA. 1982; VOL. 42; NO 1-2; PP. 51-61; BIBL. 45 REF.Article

PROTONENMIKROSONDE AM ROSSENDORFER TANDEMGENERATOR = MICROSONDE A PROTONS AU GENERATEUR TANDEM DE ROSSENDORFGERSCH HU; GRAMBOLE D; HERRMANN F et al.1982; EXPERIMENTELLE TECHNIK DER PHYSIK; ISSN 0014-4924; DDR; DA. 1982; VOL. 30; NO 3; PP. 227-234; ABS. RUS/ENG; BIBL. 13 REF.Article

SYSTEME DE FORMATION DES FAISCEAUX DE PROTONS DE DIMENSIONS DE L'ORDRE DU MICRONANDRIANOV SN; DYMNIKOV AD; OSETINSKIJ GM et al.1982; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1982; NO 1; PP. 39-40; BIBL. 9 REF.Article

INFLUENCE PERTURBATRICE DE FAIBLES QUANTITES DE CALCIUM SUR LE FRITTAGE D'AGGLOMERES DE COBALT = PERTURBING EFFECT OF SMALL AMOUNTS OF CA ON THE SINTERING DE CO ORE SINTERDESSIEUX R; POZARNIK F; CIZERON G et al.1980; ANN. CHIM.; FRA; DA. 1980; VOL. 5; NO 5; PP. 389-396; ABS. ENG; BIBL. 4 REF.Article

A method of mounting multiple otoliths for beam-based microchemical analysesDONOHOE, Christopher J; ZIMMERMAN, Christian E.Environmental biology of fishes. 2010, Vol 89, Num 3-4, pp 473-477, issn 0378-1909, 5 p.Conference Paper

Off-line data evaluation of elemental maps obtained from scanning nuclear microprobe analyses. DiscussionLÖVESTAM, N. E. G; SWIETLICKI, E; LEGGE, G et al.Scanning microscopy. 1992, Vol 6, Num 3, pp 607-624, issn 0891-7035Article

Positive mass identification on an ion microprobe mass analyser by use of a digital squarer moduleGRIES, W. H; RAWSTHORNE, E. D; STRYDOM, H. J et al.International journal of mass spectrometry and ion processes. 1984, Vol 59, Num 3, pp 339-342Article

Effect of a field-limiting method in a micro-area analysis by SIMSTAKAHASHI, K; WATANABE, K; TAKANO, A et al.Bunseki Kagaku. 1991, Vol 40, Num 11, pp 863-866, issn 0525-1931Article

Etude de l'optique d'un spectromètre de masse adapté à une microsonde ionique = Study of optics of a mass spectrometer adjusted to a ion microprobeCOSTA DE BEAUREGARD, François.1984, 191 pThesis

Influence de l'effet de cratère sur l'émission d'ions dans l'analyse par couchesCHAJKOVSKIJ, EH. F; PROTSENKO, A. N.Žurnal tehničeskoj fiziki. 1985, Vol 55, Num 1, pp 158-161, issn 0044-4642Article

MICROANALYZERS USING SECONDARY ION EMISSIONSLODZIAN G.1980; ADV. ELECTRON. ELECTRON. PHYS., SUPPL.; USA; DA. 1980; NO 13; SUPPL.; PP. 1-44; BIBL. 36 REF.Article

QUANTIFICATION OF SIMS DATA. RESULTS, PROBLEMS AND PROMISES.CHRISTIE WH; SMITH DH; EBY RE et al.1978; INTERNATION. LAB.; USA; DA. 1978; PP. 9-22; (9 P.); BIBL. 24 REF.Article

  • Page / 11