SURFACE CHARACTERIZATION BY ION MICROPROBE ANALYSER.STEWART IM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 367-373; BIBL. 4 REF.Conference Paper

SCANNING MICROBEAM USING A LIQUID METAL ION SOURCEISHITANI T; TAMURA H; TODOKORO H et al.1982; J. VAC. SCI. TECHNOL.; ISSN 0022-5355; USA; DA. 1982; VOL. 20; NO 1; PP. 80-83; BIBL. 11 REF.Article

DETECTION OF SPUTTER CONTAMINATION AND SPUTTER ETCH RESIDUE BY ION MICROPROBE ANALYSISANDREWS JM; KATE LE; COLBY JW et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 67; NO 2; PP. 325-340; BIBL. 20 REF.Article

QUANTITATIVE ANALYSIS OF HIGH TEMPERATURE ALLOYS WITH AN ION MICROANALYZER.OKAZIMA Y; AIZAWA Y.1977; MASS SPECTROSC.; JAP.; DA. 1977; VOL. 25; NO 1; PP. 91-97; BIBL. 8 REF.Article

APPLICATIONS OF THE ION MICROPROBE TO GEOCHEMISTRY AND COSMOCHEMISTRYSHIMIZU N; HART SR.1982; ANNU. REV. EARTH PLANET. SCI.; ISSN 0084-6597; USA; DA. 1982; VOL. 10; PP. 483-526; BIBL. 3 P.Article

QUANTITATIVE ION PROBE MEASUREMENT USING MATRIX ION SPECIES RATIOS.GANJEI JD; LETA DP; MORRISON GH et al.1978; ANAL. CHEM.; U.S.A.; DA. 1978; VOL. 50; NO 2; PP. 285-290; BIBL. 10 REF.Article

ION BEAM-TARGET INTERACTIONS IN ION MICROPROBE ANALYSISUNILSON GC.1982; INT. J. MASS SPECTROM. ION PHYS.; ISSN 0020-7381; NLD; DA. 1982; VOL. 42; NO 1-2; PP. 51-61; BIBL. 45 REF.Article

PROTONENMIKROSONDE AM ROSSENDORFER TANDEMGENERATOR = MICROSONDE A PROTONS AU GENERATEUR TANDEM DE ROSSENDORFGERSCH HU; GRAMBOLE D; HERRMANN F et al.1982; EXPERIMENTELLE TECHNIK DER PHYSIK; ISSN 0014-4924; DDR; DA. 1982; VOL. 30; NO 3; PP. 227-234; ABS. RUS/ENG; BIBL. 13 REF.Article

SYSTEME DE FORMATION DES FAISCEAUX DE PROTONS DE DIMENSIONS DE L'ORDRE DU MICRONANDRIANOV SN; DYMNIKOV AD; OSETINSKIJ GM et al.1982; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1982; NO 1; PP. 39-40; BIBL. 9 REF.Article

INFLUENCE PERTURBATRICE DE FAIBLES QUANTITES DE CALCIUM SUR LE FRITTAGE D'AGGLOMERES DE COBALT = PERTURBING EFFECT OF SMALL AMOUNTS OF CA ON THE SINTERING DE CO ORE SINTERDESSIEUX R; POZARNIK F; CIZERON G et al.1980; ANN. CHIM.; FRA; DA. 1980; VOL. 5; NO 5; PP. 389-396; ABS. ENG; BIBL. 4 REF.Article

Off-line data evaluation of elemental maps obtained from scanning nuclear microprobe analyses. DiscussionLÖVESTAM, N. E. G; SWIETLICKI, E; LEGGE, G et al.Scanning microscopy. 1992, Vol 6, Num 3, pp 607-624, issn 0891-7035Article

Positive mass identification on an ion microprobe mass analyser by use of a digital squarer moduleGRIES, W. H; RAWSTHORNE, E. D; STRYDOM, H. J et al.International journal of mass spectrometry and ion processes. 1984, Vol 59, Num 3, pp 339-342Article

Influence de l'effet de cratère sur l'émission d'ions dans l'analyse par couchesCHAJKOVSKIJ, EH. F; PROTSENKO, A. N.Žurnal tehničeskoj fiziki. 1985, Vol 55, Num 1, pp 158-161, issn 0044-4642Article

MICROANALYZERS USING SECONDARY ION EMISSIONSLODZIAN G.1980; ADV. ELECTRON. ELECTRON. PHYS., SUPPL.; USA; DA. 1980; NO 13; SUPPL.; PP. 1-44; BIBL. 36 REF.Article

QUANTIFICATION OF SIMS DATA. RESULTS, PROBLEMS AND PROMISES.CHRISTIE WH; SMITH DH; EBY RE et al.1978; INTERNATION. LAB.; USA; DA. 1978; PP. 9-22; (9 P.); BIBL. 24 REF.Article

AN ION MICROPROBE STUDY OF THE TENSILE FAILURE OF A PT-RH-W ALLOY.CHRISTIE WH; SMITH DH; INOUYE H et al.1976; J. RADIOANAL. CHEM.; SWITZ.; DA. 1976; VOL. 32; NO 1; PP. 85-97; BIBL. 30 REF.; (INT. NUCL. AT. ACT. ANAL. CONF. ANNU. MEET. ANAL. CHEM. NUCL. TECHNOL. 19; GATLINBURG, TENN.; 1975)Conference Paper

SURFACE SEGREGATION OF NI-CU ALLOY IN NITROGEN AND OXYGEN: AN ATOM-PROBE FIELD-ION MICROSCOPE STUDY = SEGREGATION EN SURFACE DE L'ALLIAGE NI-CU DANS L'AZOTE ET L'OXYGENE: ETUDE PAR MICROSCOPIE IONIQUE A EMISSION DE CHAMP AVEC SONDE ATOMIQUETSONG TT; NG YS; MCLANE SB JR et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 12; PP. 6189-6191; BIBL. 15 REF.Article

ETUDE DE LA REALISATION ET DES PROPRIETES DES SOURCES D'IONS A METAL LIQUIDEOHANA RENE.1980; ; FRA; DA. 1980; 86 P.-PL.; 30 CM; BIBL. 57 REF.; TH. DOCT.-ING./PARIS 11/1980Thesis

OXYDATION DES SURFACES DE RUPTURE PAR FATIGUE A BASSES VITESSESBENOIT D; LIEURADE HP; MANDAR IRANI R et al.1979; ; FRA; DA. 1979; IRSID.RE-612; 17 P.; BIBL. 12 REF.Report

ETUDE DE L'ETAT DE SURFACE DES TOLES A FROID PAR MICROSONDE IONIQUE, SPECTROSCOPIE AUGER ET SPECTROSCOPIE DE PHOTO-ELECTRONSINOUE Y; MAEDA S; KOBAYASHI H et al.1978; TETSU TO HAGANE, J. IRON STEEL INST. JAP.; JPN; DA. 1978; VOL. 64; NO 8; PP. A159-A162; BIBL. 6 REF.Article

INFLUENCE DE LA PREMIERE COUCHE SUPERFICIELLE DES TOLES GALVANISEES SUR LEUR APTITUDE A LA PHOSPHATATIONMAEDA S; ASAI T; HIGUCHI M et al.1978; TETSU TO HAGANE, J. IRON STEEL INST. JAP.; JPN; DA. 1978; VOL. 64; NO 8; PP. A139-A142; BIBL. 2 REF.Article

SAMPLING ERROR IN ION MICROPROBE ANALYSIS.SCILLA GJ; MORRISON GH.1977; ANAL. CHEM.; U.S.A.; DA. 1977; VOL. 49; NO 11; PP. 1529-1536; BIBL. 28 REF.Article

OBSERVATIONS ON THE GRAIN-BOUNDARY OF AL₂O₃ BICRYSTALS = OBSERVATIONS SUR LE JOINT DE GRAINS DE BICRISTAUX DE AL₂O₃MARUYAMA O; KOMATSU W.1979; CERAMURGIA INTERNATION.; ITA; DA. 1979; VOL. 5; NO 2; PP. 51-55; BIBL. 14 REF.Article

COMPUTERIZED IMAGE PROCESSING FOR EVALUATION OF SAMPLING ERROR IN ION MICROPROBE ANALYSIS.DRUMMER DM; FASSETT JD; MORRISON GH et al.1978; ANAL. CHIM. ACTA; NLD; DA. 1978; VOL. 100; PP. 15-22; BIBL. 5 REF.Article

ANALYSE QUANTITATIVE DE PHOSPHORE ET ARSENIC DANS LE SILICIUM A L'AIDE D'UN MICROANALYSEUR IONIQUETSUYAMA H; HASHIMOTO N.1977; MASS SPECTROSC.; JAP.; DA. 1977; VOL. 25; NO 4; PP. 351-362; ABS. ANGL.; BIBL. 9 REF.Article