DIGITAL IMAGE PROCESSING FOR IMAGE QUANTIFICATION IN ION MICROSCOPE ANALYSIS = TRAITEMENT NUMERIQUE DES IMAGES POUR LA QUANTIFICATION DE L'IMAGE EN ANALYSE PAR MICROSCOPIE IONIQUEDRUMMER DM; MORRISON GH.1980; ANAL. CHEM. (WASH.); ISSN 0003-2700; USA; DA. 1980; VOL. 52; NO 13; PP. 2147-2152; BIBL. 33 REF.Article

SUR LA MESURE DES RAPPORTS D'EMISSION DE DIFFERENTS ELEMENTS AVEC L'ANALYSEUR IONIQUE MUNI D'UN DEFLECTEUR ELECTROSTATIQUEDENNEBOUY R; SLODZIAN G.1978; J. MICR. SPECTROSC. ELECTRON.; FRA; DA. 1978; VOL. 3; NO 5; PP. 451-455; ABS. ENGArticle

PLENARY LECTURE: ION MICROSCOPY AND SURFACE ANALYSIS.MORRISON GH.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 351-366; BIBL. 27 REF.Conference Paper

EFFECTS OF LOCAL FIELD VARIATIONS ON THE CONTRAST OF A FIELD-ION MICROSCOPEHOMEIER HHH; KINGHAM DR.1983; JOURNAL OF PHYSICS D: APPLIED PHYSICS; ISSN 0022-3727; GBR; DA. 1983; VOL. 16; NO 6; PP. L115-L120; BIBL. 8 REF.Article

ERZEUGUNG EINER IONEN-MIKROSONDE MITTELS FELDIONISATION UND EMISSIONSLINSE. = REALISATION D'UN MICROANALYSEUR IONIQUE REALISE PAR IONISATION DE CHAMP ET UNE LENTILLE A EMISSIONSCHWARZER R; GAUKLER KH.1978; VAKUUM-TECH.; DTSCH.; DA. 1978; VOL. 27; NO 1; PP. 2-5; ABS. ANGL. FR.; BIBL. 18 REF.Article

CW MONOENERGETIC CS⁺ ION SOURCE BY PHOTOIONIZATIONDREYFUS RW.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 36; NO 7; PP. 495-497; BIBL. 15 REF.Article

PROCEDE D'ETUDE DE LA SOUFFLURE RADIATIVE DANS UN MICROSCOPE IONIQUE A EMISSION CHAMPDRANOVA ZH I; MIKHAJLOVSKIJ IM; SUVOROV AL et al.1980; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1980; NO 3; PP. 225-228; BIBL. 8 REF.Article

THE PROJECTION GEOMETRY OF THE FIELD-ION IMAGE.SOUTHWORTH HN; WALLS JM.1978; SURF. SCI.; NLD; DA. 1978; VOL. 75; NO 1; PP. 129-140; BIBL. 13 REF.Article

MICROSCOPE AUTO-IONIQUEBOBKOV AF; VASIL'EV VA; KUZNETSOV B YA et al.1978; PRIBORY TEKH. EKSPER.; SUN; DA. 1978; NO 3; PP. 213-216; BIBL. 6 REF.Article

REALISATION D'UNE SOURCE IONIQUE ADAPTEE A LA MICROSCOPIE CORPUSCULAIRE.COMMUNAY PH.1976; J. PHYS. R; G.B.; DA. 1976; VOL. 9; NO 10; PP. 829-832; ABS. ANGL.; BIBL. 21 REF.Article

THE MEASUREMENT AND CALCULATION OF LOOP TEMPERATURES IN AN FIMMORIKAWA H; KOZAKAI M; TERAO T et al.1982; J. VAC. SCI. TECHNOL.; ISSN 0022-5355; USA; DA. 1982; VOL. 21; NO 1; PP. 95-99; BIBL. 5 REF.Article

THE METAL-TO-METAL INTERFACE AND ITS EFFECT ON ADHESION AND FRICTION.BUCKLEY DH.1977; J. COLLOID INTERFACE SCI.; U.S.A.; DA. 1977; VOL. 58; NO 1; PP. 36-53; BIBL. 26 REF.; (INT. CONF. COLLOIDS SURF.; SAN JUAN, P.R.: 1976)Conference Paper

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COMPUTERS IN FIELD ION MICROSCOPY (REVIEW)SUVOROV AL; RAZINKOVA TL; SOKOLOV AG et al.1980; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1980-09-16; VOL. 61; NO 1; PP. 11-52; BIBL. 146 REF.Article

THE SIMULATION OF FIM DESORPTION PATTERNS = SIMULATION DE DIAGRAMMES DE DESORPTION EN MICROSCOPIE IONIQUE A EMISSION DE CHAMPMOORE AJW.1981; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1981; VOL. 43; NO 3; PART. 1; PP. 803-814; BIBL. 7 REF.Article

FEM AND FIM STUDY OF THE WORK FUNCTION OF STEPPED METAL SURFACES = ETUDE PAR MICROSCOPIES IONIQUE ET ELECTRONIQUE A EFFET DE CHAMP DU TRAVAIL DE SORTIE DE SURFACES METALLIQUES COMPORTANT DES CRANSKNOR Z.1979; COLLECT. CZECH. CHEM. COMMUNIC.; ISSN 0010-0765; CSK; DA. 1979; VOL. 44; NO 12; PP. 3434-3440; BIBL. 37 REF.Article

PRODUCTION DE BANDES DE CONTRASTE LORS DE L'EVAPORATION PAR UN CHAMP ELECTRIQUE D'UN ECHANTILLON DANS UN MICROSCOPE IONIQUESYUTKIN NN; VYATKIN NN; FEDOROVA EG et al.1978; ZH. TEKH. FIZ.; SUN; DA. 1978; VOL. 48; NO 7; PP. 1471-1473; BIBL. 6 REF.Article

BEHAVIOR AND PROPERTIES OF SINGLE ATOMS ON METAL SURFACESTSONG TT; COWAN PL.1978; C.R.C. CRIT. REV. SOLID STATE MATER. SCI.; USA; DA. 1978; VOL. 7; NO 4; PP. 289-316; BIBL. 77 REF.Article

INFLUENCE DES DISLOCATIONS SUR LA FORMATION DU CONTRASTE STRIE AU MICROSCOPE IONIQUE A EMISSION DE CHAMPMIKHAJLOVSKIJ IM; GEJSHERIK VS; DRANOVA ZH I et al.1977; FIZ. TVERD. TELA; S.S.S.R.; DA. 1977; VOL. 19; NO 4; PP. 1116-1121; BIBL. 14 REF.Article

A CONTROLLED SPECIMEN PREPARATION TECHNIQUE FOR INTERFACE STUDIES WITH ATOM-PROBE FIELD-ION MICROSCOPYHENJERED A; NORDEN H.1983; JOURNAL OF PHYSICS E: SCIENTIFIC INSTRUMENTS; ISSN 0022-3735; GBR; DA. 1983; VOL. 16; NO 7; PP. 617-619; BIBL. 5 REF.Article

ON THE ELECTRIC FIELD DISTRIBUTION WITHIN THE FIELD ION MICROSCOPE AND NEAR THE SURFACE OF FIELD EMITTERSGIPSON GS; YANNITELL DW; EATON HC et al.1979; J. PHYS. D; GBR; DA. 1979; VOL. 12; NO 7; PP. 987-996; BIBL. 18 REF.Article

STRUCTURE AND INITIAL PRECIPITATION IN A RAPIDLY SOLIDIFIED NICKEL SUPERALLOYWOOD JV; MILLS PF; BINGHAM JK et al.1979; METALLURG. TRANS. A; USA; DA. 1979; VOL. 10; NO 5; PP. 575-584; BIBL. 27 REF.Article

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THE IMAGING PROCESS IN FIELD ION MICROSCOPY FROM THE FEM TO THE ATOM-PROBE.MULLER EW.1976; C.R.C. CRIT. REV. SOLID STATE SCI.; U.S.A.; DA. 1976; VOL. 6; NO 2; PP. 85-109; BIBL. 2 P. 1/2Article

FIELD-ION MICROSCOPY. A REVIEW OF BASIC PRINCIPLES AND SELECTED APPLICATIONSPANITZ JA.1982; JOURNAL OF PHYSICS E: SCIENTIFIC INSTRUMENTS; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 12; PP. 1281-1294; BIBL. 3 P.Article