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MODIFICATIONS TO THE CAMECA ION ANALYSERJACKSON CK.1978; J. MICR. SPECTROSC. ELECTRON.; FRA; DA. 1978; VOL. 3; NO 5; PP. 491-493; BIBL. 1 REF.Article

DIGITAL IMAGE PROCESSING FOR IMAGE QUANTIFICATION IN ION MICROSCOPE ANALYSIS = TRAITEMENT NUMERIQUE DES IMAGES POUR LA QUANTIFICATION DE L'IMAGE EN ANALYSE PAR MICROSCOPIE IONIQUEDRUMMER DM; MORRISON GH.1980; ANAL. CHEM. (WASH.); ISSN 0003-2700; USA; DA. 1980; VOL. 52; NO 13; PP. 2147-2152; BIBL. 33 REF.Article

SUR LA MESURE DES RAPPORTS D'EMISSION DE DIFFERENTS ELEMENTS AVEC L'ANALYSEUR IONIQUE MUNI D'UN DEFLECTEUR ELECTROSTATIQUEDENNEBOUY R; SLODZIAN G.1978; J. MICR. SPECTROSC. ELECTRON.; FRA; DA. 1978; VOL. 3; NO 5; PP. 451-455; ABS. ENGArticle

PLENARY LECTURE: ION MICROSCOPY AND SURFACE ANALYSIS.MORRISON GH.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 351-366; BIBL. 27 REF.Conference Paper

FIELD-ION IMAGE CONTRAST: THE GAS DISTRIBUTION HYPOTHESIS RE-EXAMINED.DUFFELL J; FORBES RG.1978; J. PHYS. D; GBR; DA. 1978; VOL. 11; NO 9; PP. L123-L125; BIBL. 8 REF.Article

LA MICROANALYSE IONIQUE APPLIQUEE A L'ETUDE DES SEMICONDUCTEURS1978; TELONDE; FRA; DA. 1978; NO 2; PP. 32-33Article

UNE OPTIQUE DE TRANSFERT POUR LE MICROANALYSEUR IONIQUESLODZIAN G.1978; J. MICR. SPECTROSC. ELECTRON.; FRA; DA. 1978; VOL. 3; NO 5; PP. 447-449; ABS. ENG; BIBL. 2 REF.Article

PLENARY LECTURE: SURFACE ANALYSIS AT THE ATOMIC LEVEL USING THE ATOM-PROBE.MULLER EW; KRISHNASWAMY SV.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 21-48; BIBL. 2 P. 1/2Conference Paper

EFFECTS OF LOCAL FIELD VARIATIONS ON THE CONTRAST OF A FIELD-ION MICROSCOPEHOMEIER HHH; KINGHAM DR.1983; JOURNAL OF PHYSICS D: APPLIED PHYSICS; ISSN 0022-3727; GBR; DA. 1983; VOL. 16; NO 6; PP. L115-L120; BIBL. 8 REF.Article

ERZEUGUNG EINER IONEN-MIKROSONDE MITTELS FELDIONISATION UND EMISSIONSLINSE. = REALISATION D'UN MICROANALYSEUR IONIQUE REALISE PAR IONISATION DE CHAMP ET UNE LENTILLE A EMISSIONSCHWARZER R; GAUKLER KH.1978; VAKUUM-TECH.; DTSCH.; DA. 1978; VOL. 27; NO 1; PP. 2-5; ABS. ANGL. FR.; BIBL. 18 REF.Article

CW MONOENERGETIC CS+ ION SOURCE BY PHOTOIONIZATIONDREYFUS RW.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 36; NO 7; PP. 495-497; BIBL. 15 REF.Article

PROCEDE D'ETUDE DE LA SOUFFLURE RADIATIVE DANS UN MICROSCOPE IONIQUE A EMISSION CHAMPDRANOVA ZH I; MIKHAJLOVSKIJ IM; SUVOROV AL et al.1980; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1980; NO 3; PP. 225-228; BIBL. 8 REF.Article

THE PROJECTION GEOMETRY OF THE FIELD-ION IMAGE.SOUTHWORTH HN; WALLS JM.1978; SURF. SCI.; NLD; DA. 1978; VOL. 75; NO 1; PP. 129-140; BIBL. 13 REF.Article

MICROSCOPE AUTO-IONIQUEBOBKOV AF; VASIL'EV VA; KUZNETSOV B YA et al.1978; PRIBORY TEKH. EKSPER.; SUN; DA. 1978; NO 3; PP. 213-216; BIBL. 6 REF.Article

REALISATION D'UNE SOURCE IONIQUE ADAPTEE A LA MICROSCOPIE CORPUSCULAIRE.COMMUNAY PH.1976; J. PHYS. R; G.B.; DA. 1976; VOL. 9; NO 10; PP. 829-832; ABS. ANGL.; BIBL. 21 REF.Article

RADIOACTIVE ION MICROSCOPYSCHWEIKERT EA; JOHNSON SA; THURSTON EL et al.1980; NATURWISSENSCHAFTEN; ISSN 0028-1042; DEU; DA. 1980; VOL. 67; NO 5; PP. 254-255; BIBL. 9 REF.Article

MICROSCOPE A AUTODESORPTIONNIKONENKOV NV; KHLYNTSEV VP; POTAPOV LP et al.1980; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1980; NO 3; PP. 221-223; BIBL. 6 REF.Article

MICROSCOPE A AUTO-IONISATION AVEC UNE SOURCE D'ATOMES ACCELERESDRANOVA ZH I; KSENOFONTOV VA; KUL'KO VB et al.1980; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1980; NO 6; PP. 166-167; BIBL. 5 REF.Article

THE MEASUREMENT AND CALCULATION OF LOOP TEMPERATURES IN AN FIMMORIKAWA H; KOZAKAI M; TERAO T et al.1982; J. VAC. SCI. TECHNOL.; ISSN 0022-5355; USA; DA. 1982; VOL. 21; NO 1; PP. 95-99; BIBL. 5 REF.Article

THE METAL-TO-METAL INTERFACE AND ITS EFFECT ON ADHESION AND FRICTION.BUCKLEY DH.1977; J. COLLOID INTERFACE SCI.; U.S.A.; DA. 1977; VOL. 58; NO 1; PP. 36-53; BIBL. 26 REF.; (INT. CONF. COLLOIDS SURF.; SAN JUAN, P.R.: 1976)Conference Paper

DETERMINATION OF HOMOGENEITY OF STANDARD MATERIALS BY ION MICROSCOPYVAN CRAEN M; VAN ESPEN P; ADAMS F et al.1981; MIKROCHIM. ACTA; ISSN 0026-3672; USA; DA. 1981; VOL. 1; NO 5-6; PP. 373-386; ABS. GER; BIBL. 10 REF.Conference Paper

COMPUTERS IN FIELD ION MICROSCOPY (REVIEW)SUVOROV AL; RAZINKOVA TL; SOKOLOV AG et al.1980; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1980-09-16; VOL. 61; NO 1; PP. 11-52; BIBL. 146 REF.Article

THE SIMULATION OF FIM DESORPTION PATTERNS = SIMULATION DE DIAGRAMMES DE DESORPTION EN MICROSCOPIE IONIQUE A EMISSION DE CHAMPMOORE AJW.1981; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1981; VOL. 43; NO 3; PART. 1; PP. 803-814; BIBL. 7 REF.Article

FEM AND FIM STUDY OF THE WORK FUNCTION OF STEPPED METAL SURFACES = ETUDE PAR MICROSCOPIES IONIQUE ET ELECTRONIQUE A EFFET DE CHAMP DU TRAVAIL DE SORTIE DE SURFACES METALLIQUES COMPORTANT DES CRANSKNOR Z.1979; COLLECT. CZECH. CHEM. COMMUNIC.; ISSN 0010-0765; CSK; DA. 1979; VOL. 44; NO 12; PP. 3434-3440; BIBL. 37 REF.Article

ETUDE ET REALISATION D'UNE SONDE A ATOMES ASSOCIEE A UN MICROSCOPE IONIQUE A CHAMP = STUDY AND REALIZATION OF AN ATOMIC MICROPHOBE ASSOCIATED WITH A FIELD ION MICROSCOPEGALLOT J.sd; FRA; DA. S.D.; DGRST/77 7 0710; 28 P.; 30 CM; BIBL. 13 REF.; ACTION CONCERTEE: METALLURGIEReport

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