SURFACE CHARACTERIZATION BY ION MICROPROBE ANALYSER.STEWART IM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 367-373; BIBL. 4 REF.Conference Paper

MEASUREMENT OF RANGE DISTRIBUTIONS OF ZINC AND NITROGEN IONS IN MULTIPLE-LAYER SUBSTRATES WITH THE SECONDARY ION MICROPROBEMUELLER G; TRAPP M; SCHIMKO R et al.1979; PHYS. STATUS SOLIDI, A; DDR; DA. 1979; VOL. 51; NO 1; PP. 87-93; ABS. GER; BIBL. 10 REF.Article

DETECTION OF SPUTTER CONTAMINATION AND SPUTTER ETCH RESIDUE BY ION MICROPROBE ANALYSISANDREWS JM; KATE LE; COLBY JW et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 67; NO 2; PP. 325-340; BIBL. 20 REF.Article

A HIGH-INTENSITY SCANNING ION PROBE WITH SUBMICROMETER SPOT SIZESELIGER RL; WARD JW; WANG V et al.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 5; PP. 310-312; BIBL. 7 REF.Article

QUANTITATIVE ANALYSIS OF HIGH TEMPERATURE ALLOYS WITH AN ION MICROANALYZER.OKAZIMA Y; AIZAWA Y.1977; MASS SPECTROSC.; JAP.; DA. 1977; VOL. 25; NO 1; PP. 91-97; BIBL. 8 REF.Article

QUANTITATIVE ION PROBE MEASUREMENT USING MATRIX ION SPECIES RATIOS.GANJEI JD; LETA DP; MORRISON GH et al.1978; ANAL. CHEM.; U.S.A.; DA. 1978; VOL. 50; NO 2; PP. 285-290; BIBL. 10 REF.Article

INFLUENCE PERTURBATRICE DE FAIBLES QUANTITES DE CALCIUM SUR LE FRITTAGE D'AGGLOMERES DE COBALT = PERTURBING EFFECT OF SMALL AMOUNTS OF CA ON THE SINTERING DE CO ORE SINTERDESSIEUX R; POZARNIK F; CIZERON G et al.1980; ANN. CHIM.; FRA; DA. 1980; VOL. 5; NO 5; PP. 389-396; ABS. ENG; BIBL. 4 REF.Article

LEAD ISOTOPE ZONING IN GALENA; AN ION MICROPROBE STUDY OF A GALENA CRYSTAL FROM THE BUICK MINE, SOUTHEAST MISSOURI = ZONALITE DES ISOTOPES DU PLOMB DANS UNE GALENE: ETUDE PAR MICROSONDE IONIQUE D'UN CRISTAL DE GALENE DE LA MINE BUICK, MISSOURI SUD ESTHART STANLEY R; SHIMIZU NOBUMICHI; SVERJENSKY DIMITRI A et al.1981; ECON. GEOL. BULL. SOC. ECON. GEOL.; ISSN 0361-0128; USA; DA. 1981-11; VOL. 76; NO 7; PP. 1873-1878; BIBL. 14 REF.; 1 ANAL.; 3 TAB. ; ILL.Article

SURFACE SEGREGATION OF NI-CU ALLOY IN NITROGEN AND OXYGEN: AN ATOM-PROBE FIELD-ION MICROSCOPE STUDY = SEGREGATION EN SURFACE DE L'ALLIAGE NI-CU DANS L'AZOTE ET L'OXYGENE: ETUDE PAR MICROSCOPIE IONIQUE A EMISSION DE CHAMP AVEC SONDE ATOMIQUETSONG TT; NG YS; MCLANE SB JR et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 12; PP. 6189-6191; BIBL. 15 REF.Article

ETUDE DE LA REALISATION ET DES PROPRIETES DES SOURCES D'IONS A METAL LIQUIDEOHANA RENE.1980; ; FRA; DA. 1980; 86 P.-PL.; 30 CM; BIBL. 57 REF.; TH. DOCT.-ING./PARIS 11/1980Thesis

THE GAS ION PROBE: A NOVEL INSTRUMENT FOR ANALYZING CONCENTRATION PROFILES OF GASES IN SOLIDSKIKO J; MULLER HW; BUCHLER K et al.1979; INTERNATION. J. MASS SPECTROM. ION PHYS.; NDL; DA. 1979; VOL. 29; NO 2; PP. 87-100; BIBL. 29 REF.Article

OXYDATION DES SURFACES DE RUPTURE PAR FATIGUE A BASSES VITESSESBENOIT D; LIEURADE HP; MANDAR IRANI R et al.1979; ; FRA; DA. 1979; IRSID.RE-612; 17 P.; BIBL. 12 REF.Report

ETUDE DE L'ETAT DE SURFACE DES TOLES A FROID PAR MICROSONDE IONIQUE, SPECTROSCOPIE AUGER ET SPECTROSCOPIE DE PHOTO-ELECTRONSINOUE Y; MAEDA S; KOBAYASHI H et al.1978; TETSU TO HAGANE, J. IRON STEEL INST. JAP.; JPN; DA. 1978; VOL. 64; NO 8; PP. A159-A162; BIBL. 6 REF.Article

INFLUENCE DE LA PREMIERE COUCHE SUPERFICIELLE DES TOLES GALVANISEES SUR LEUR APTITUDE A LA PHOSPHATATIONMAEDA S; ASAI T; HIGUCHI M et al.1978; TETSU TO HAGANE, J. IRON STEEL INST. JAP.; JPN; DA. 1978; VOL. 64; NO 8; PP. A139-A142; BIBL. 2 REF.Article

SAMPLING ERROR IN ION MICROPROBE ANALYSIS.SCILLA GJ; MORRISON GH.1977; ANAL. CHEM.; U.S.A.; DA. 1977; VOL. 49; NO 11; PP. 1529-1536; BIBL. 28 REF.Article

DETERMINATION OF ION TEMPERATURE BY DATA FROM SPHERICAL ION TRAPS.KOUTIEV IS; KARADIMOV MD.1976; C.R. ACAD. BULG. SCI.; BULG.; DA. 1976; VOL. 29; NO 6; PP. 837-839; BIBL. 6 REF.Article

MICROANALYZERS USING SECONDARY ION EMISSIONSLODZIAN G.1980; ADV. ELECTRON. ELECTRON. PHYS., SUPPL.; USA; DA. 1980; NO 13; SUPPL.; PP. 1-44; BIBL. 36 REF.Article

ETUDE EXPERIMENTALE ET MODELISATION DE L'ALLUMAGE DES PROPULSEURS A PROPERGOL SOLIDETHEBAULT P; GUERNIGOU J; MENTRE PG et al.1980; EXPLOSIFS ET PYROTECHNIE. APPLICATIONS SPATIALES. COLLOQUE INTERNATIONAL/1979/TOULOUSE; FRA; PARIS: ESA; DA. 1980; PP. 29-40; BIBL. 7 REF.Conference Paper

QUANTIFICATION OF SIMS DATA. RESULTS, PROBLEMS AND PROMISES.CHRISTIE WH; SMITH DH; EBY RE et al.1978; INTERNATION. LAB.; USA; DA. 1978; PP. 9-22; (9 P.); BIBL. 24 REF.Article

AN ION MICROPROBE STUDY OF THE TENSILE FAILURE OF A PT-RH-W ALLOY.CHRISTIE WH; SMITH DH; INOUYE H et al.1976; J. RADIOANAL. CHEM.; SWITZ.; DA. 1976; VOL. 32; NO 1; PP. 85-97; BIBL. 30 REF.; (INT. NUCL. AT. ACT. ANAL. CONF. ANNU. MEET. ANAL. CHEM. NUCL. TECHNOL. 19; GATLINBURG, TENN.; 1975)Conference Paper

OBSERVATIONS ON THE GRAIN-BOUNDARY OF AL₂O₃ BICRYSTALS = OBSERVATIONS SUR LE JOINT DE GRAINS DE BICRISTAUX DE AL₂O₃MARUYAMA O; KOMATSU W.1979; CERAMURGIA INTERNATION.; ITA; DA. 1979; VOL. 5; NO 2; PP. 51-55; BIBL. 14 REF.Article

COMPUTERIZED IMAGE PROCESSING FOR EVALUATION OF SAMPLING ERROR IN ION MICROPROBE ANALYSIS.DRUMMER DM; FASSETT JD; MORRISON GH et al.1978; ANAL. CHIM. ACTA; NLD; DA. 1978; VOL. 100; PP. 15-22; BIBL. 5 REF.Article

ANALYSE QUANTITATIVE DE PHOSPHORE ET ARSENIC DANS LE SILICIUM A L'AIDE D'UN MICROANALYSEUR IONIQUETSUYAMA H; HASHIMOTO N.1977; MASS SPECTROSC.; JAP.; DA. 1977; VOL. 25; NO 4; PP. 351-362; ABS. ANGL.; BIBL. 9 REF.Article

SURFACE ANALYSIS OF INSULATING MATERIALS BY MEANS OF AN ION MICROPROBE ANALYZER.NAKAMURA K; HIRAHARA Y; SHIBATA A et al.1976; MASS. SPECTROSC.; JAP.; DA. 1976; VOL. 24; NO 2; PP. 163-172; BIBL. 10 REF.Article

IMMA APPLICATIONS TO ION IMPLANTATION IN SILICON-ON-SAPPHIREPANCHOLY RK; YU TAK YOUNG M.1980; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1980; VOL. 27; NO 12; PP. 2256-2261; BIBL. 11 REF.Article