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THE COMBINED EFFECT OF SI AND P ON THE OXIDATION OF IRON AND THE CAMECA STUDIES OF THE OXIDE SCALE.POMPE R; SVEDUNG I; VANNERBERG NG et al.1976; SCAND. J. METALLURGY; SWED.; DA. 1976; VOL. 5; NO 6; PP. 258-261; BIBL. 6 REF.Article

SURFACE CHARACTERIZATION BY ION MICROPROBE ANALYSER.STEWART IM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 367-373; BIBL. 4 REF.Conference Paper

BREVET SONDE IONIQUE POUR MESURE DE DEBIT MASSIQUE OU DE VITESSE D'UN FLUIDE EN ECOULEMENT1978; ; FRA; DA. 1978-12-29; FR/A1/2.389.103; DEP.78-11145/1978-04-14; PR. US/790.560/1977-04-25Patent

DIE IONENEMPFINDLICHE SONDE-EIN DIAGNOSTISCHES INSTRUMENT IN DER PLASMAPHYSIK = SONDE SENSIBLE AUX IONS; UN INSTRUMENT DE DIAGNOSTIC EN PHYSIQUE DES PLASMASPINNEKAMP FW.1980; ; GIT; ISSN 0016-3538; DEU; DA. 1980; VOL. 24; NO 10; PP. 918-921; BIBL. 2 REF.Article

ESSAIS D'IDENTIFICATION DES OXYDES DE FER AU MOYEN DU MICROANALYSEUR A SONDE IONIQUENAMDAR IRANI R.1978; CENTRE DOCUMENT. SIDER., CIRC. INFORM. TECH.; FRA; DA. 1978; VOL. 35; NO 7-8; PP. 1461-1467; BIBL. 3 REF.Article

MEASUREMENT OF RANGE DISTRIBUTIONS OF ZINC AND NITROGEN IONS IN MULTIPLE-LAYER SUBSTRATES WITH THE SECONDARY ION MICROPROBEMUELLER G; TRAPP M; SCHIMKO R et al.1979; PHYS. STATUS SOLIDI, A; DDR; DA. 1979; VOL. 51; NO 1; PP. 87-93; ABS. GER; BIBL. 10 REF.Article

DETECTION OF SPUTTER CONTAMINATION AND SPUTTER ETCH RESIDUE BY ION MICROPROBE ANALYSISANDREWS JM; KATE LE; COLBY JW et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 67; NO 2; PP. 325-340; BIBL. 20 REF.Article

A HIGH-INTENSITY SCANNING ION PROBE WITH SUBMICROMETER SPOT SIZESELIGER RL; WARD JW; WANG V et al.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 5; PP. 310-312; BIBL. 7 REF.Article

QUANTITATIVE ANALYSIS OF HIGH TEMPERATURE ALLOYS WITH AN ION MICROANALYZER.OKAZIMA Y; AIZAWA Y.1977; MASS SPECTROSC.; JAP.; DA. 1977; VOL. 25; NO 1; PP. 91-97; BIBL. 8 REF.Article

QUANTITATIVE ION PROBE MEASUREMENT USING MATRIX ION SPECIES RATIOS.GANJEI JD; LETA DP; MORRISON GH et al.1978; ANAL. CHEM.; U.S.A.; DA. 1978; VOL. 50; NO 2; PP. 285-290; BIBL. 10 REF.Article

THE DETERMINATION OF HYDROGEN CONCENTRATION IN SILICATES USING ION-BEAM SPECTROCHEMICAL ANALYSIS (IBSCA) = DETERMINATION DE LA CONCENTRATION DE L'HYDROGENE DANS LES SILICATES EN EMPLOYANT L'ANALYSE SPECTROCHIMIQUE PAR RAYONNEMENT IONIQUE (IBSCA)MCLAREN AC; PAYLING R.1980; PHYS. CHEM. MINER.; ISSN 0342-1791; DEU; DA. 1980; VOL. 5; NO 4; PP. 315-326; BIBL. 10 REF.; 4 TAB. ; TABL./ILL.Article

CONTRIBUTION A L'ETUDE ET A LA MISE AU POINT D'UN CAPTEUR A IONISATION POUR LA MESURE DE DEBIT D'AIRLECOMTE JACKIE.1979; ; FRA; DA. 1979; 150 P.: ILL.; 30 CM; BIBL. 26 REF.; TH. 3EME CYCLE: ELECTROTECHN./PARIS 6/1979Thesis

THE INFLUENCE OF CHARGE TRANSFER ON ION PROBE MEASUREMENTS OF LASER-PRODUCED PLASMASTALLENTS GJ; LUTHER DAVIES B.1982; JOURNAL OF PHYSICS D: APPPLIED PHYSICS; ISSN 0022-3727; GBR; DA. 1982; VOL. 15; NO 10; PP. L125-L128; BIBL. 10 REF.Article

USE OF ION MICROANALYZER IN THE ANALYSIS OF PASSIVE LAYERS ON STAINLESS STEELOKASIMA Y; AIZAWA Y; SUGAWARA Y et al.1978; BULL. CHEM. SOC. JAP.; JPN; DA. 1978; VOL. 51; NO 8; PP. 2298-2301; BIBL. 14 REF.Article

INFLUENCE PERTURBATRICE DE FAIBLES QUANTITES DE CALCIUM SUR LE FRITTAGE D'AGGLOMERES DE COBALT = PERTURBING EFFECT OF SMALL AMOUNTS OF CA ON THE SINTERING DE CO ORE SINTERDESSIEUX R; POZARNIK F; CIZERON G et al.1980; ANN. CHIM.; FRA; DA. 1980; VOL. 5; NO 5; PP. 389-396; ABS. ENG; BIBL. 4 REF.Article

LEAD ISOTOPE ZONING IN GALENA; AN ION MICROPROBE STUDY OF A GALENA CRYSTAL FROM THE BUICK MINE, SOUTHEAST MISSOURI = ZONALITE DES ISOTOPES DU PLOMB DANS UNE GALENE: ETUDE PAR MICROSONDE IONIQUE D'UN CRISTAL DE GALENE DE LA MINE BUICK, MISSOURI SUD ESTHART STANLEY R; SHIMIZU NOBUMICHI; SVERJENSKY DIMITRI A et al.1981; ECON. GEOL. BULL. SOC. ECON. GEOL.; ISSN 0361-0128; USA; DA. 1981-11; VOL. 76; NO 7; PP. 1873-1878; BIBL. 14 REF.; 1 ANAL.; 3 TAB. ; ILL.Article

SURFACE SEGREGATION OF NI-CU ALLOY IN NITROGEN AND OXYGEN: AN ATOM-PROBE FIELD-ION MICROSCOPE STUDY = SEGREGATION EN SURFACE DE L'ALLIAGE NI-CU DANS L'AZOTE ET L'OXYGENE: ETUDE PAR MICROSCOPIE IONIQUE A EMISSION DE CHAMP AVEC SONDE ATOMIQUETSONG TT; NG YS; MCLANE SB JR et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 12; PP. 6189-6191; BIBL. 15 REF.Article

ETUDE DE LA REALISATION ET DES PROPRIETES DES SOURCES D'IONS A METAL LIQUIDEOHANA RENE.1980; ; FRA; DA. 1980; 86 P.-PL.; 30 CM; BIBL. 57 REF.; TH. DOCT.-ING./PARIS 11/1980Thesis

THE GAS ION PROBE: A NOVEL INSTRUMENT FOR ANALYZING CONCENTRATION PROFILES OF GASES IN SOLIDSKIKO J; MULLER HW; BUCHLER K et al.1979; INTERNATION. J. MASS SPECTROM. ION PHYS.; NDL; DA. 1979; VOL. 29; NO 2; PP. 87-100; BIBL. 29 REF.Article

OXYDATION DES SURFACES DE RUPTURE PAR FATIGUE A BASSES VITESSESBENOIT D; LIEURADE HP; MANDAR IRANI R et al.1979; ; FRA; DA. 1979; IRSID.RE-612; 17 P.; BIBL. 12 REF.Report

ETUDE DE L'ETAT DE SURFACE DES TOLES A FROID PAR MICROSONDE IONIQUE, SPECTROSCOPIE AUGER ET SPECTROSCOPIE DE PHOTO-ELECTRONSINOUE Y; MAEDA S; KOBAYASHI H et al.1978; TETSU TO HAGANE, J. IRON STEEL INST. JAP.; JPN; DA. 1978; VOL. 64; NO 8; PP. A159-A162; BIBL. 6 REF.Article

INFLUENCE DE LA PREMIERE COUCHE SUPERFICIELLE DES TOLES GALVANISEES SUR LEUR APTITUDE A LA PHOSPHATATIONMAEDA S; ASAI T; HIGUCHI M et al.1978; TETSU TO HAGANE, J. IRON STEEL INST. JAP.; JPN; DA. 1978; VOL. 64; NO 8; PP. A139-A142; BIBL. 2 REF.Article

SAMPLING ERROR IN ION MICROPROBE ANALYSIS.SCILLA GJ; MORRISON GH.1977; ANAL. CHEM.; U.S.A.; DA. 1977; VOL. 49; NO 11; PP. 1529-1536; BIBL. 28 REF.Article

DETERMINATION OF ION TEMPERATURE BY DATA FROM SPHERICAL ION TRAPS.KOUTIEV IS; KARADIMOV MD.1976; C.R. ACAD. BULG. SCI.; BULG.; DA. 1976; VOL. 29; NO 6; PP. 837-839; BIBL. 6 REF.Article

MICROANALYZERS USING SECONDARY ION EMISSIONSLODZIAN G.1980; ADV. ELECTRON. ELECTRON. PHYS., SUPPL.; USA; DA. 1980; NO 13; SUPPL.; PP. 1-44; BIBL. 36 REF.Article

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