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Cathodoluminescence des cristaux de KBr et KBr-Tl à 300 KPOPOV, A. I.Optika i spektroskopiâ. 1988, Vol 65, Num 6, pp 1389-1392, issn 0030-4034Article

Switch-on transient of shallow-profile bipolar transistorsDUAN-LEE TANG, D.I.E.E.E. transactions on electron devices. 1985, Vol 32, Num 11, pp 2224-2226, issn 0018-9383Article

Concentration effects in temperature quenching of impurity-center luminescenceYUROV, V. M; MURZAKHMETOV, M. K; KUKETAEV, T. A et al.Optika i spektroskopiâ. 1989, Vol 67, Num 6, pp 1398-1399, issn 0030-4034, 2 p.Article

The deconvolution of sputter-etching surface concentration measurements to determine impurity depth profilesCARTER, G; KATARDJIEV, I. V; NOBES, M. J et al.Surface and interface analysis. 1989, Vol 14, Num 9, pp 511-523, issn 0142-2421, 13 p.Article

Particularités de la cinétique des défauts radiatifs dans les semiconducteurs en présence d'atomes d'impuretéVERNER, I. V; TSUKANOV, V. V.Žurnal tehničeskoj fiziki. 1985, Vol 55, Num 11, pp 2236-2238, issn 0044-4642Article

The role of impurity dispersion and hardness anisotropy studies in NaCl:Sm crystalsNARASIMHA REDDY, K; SUBBA RAO, U. V; HARI BABU, V et al.Crystal research and technology (1979). 1984, Vol 19, Num 1, pp 121-126, issn 0232-1300Article

Edge-localized-mode -induced transport of impurity density, energy, and momentumWADE, M. R; BURRELL, K. H; LEONARD, A. W et al.Physical review letters. 2005, Vol 94, Num 22, pp 225001.1-225001.4, issn 0031-9007Article

Out-diffusion of silver from InPTUCK, B; CHAOUI, R.Journal of physics. D, Applied physics (Print). 1984, Vol 17, Num 2, pp 379-385, issn 0022-3727Article

Study of impurity profiles in siliconERANNA, G; KAKATI, D.Journal of the Electrochemical Society. 1983, Vol 130, Num 12, pp 2502-2504, issn 0013-4651Article

Théorie des jonctions SNS avec des impuretés non magnétiques de concentration arbitraire pour les températures voisines de la température critiqueSAVCHENKO, S. M; SVIDZINSKIJ, A. V.Teoretičeskaâ i matematičeskaâ fizika. 1983, Vol 56, Num 2, pp 288-300, issn 0564-6162Article

A formula for the concentration profile of a buried layer with back diffusionSHIER, J. S.I.E.E.E. transactions on electron devices. 1985, Vol 32, Num 6, pp 1142-1143, issn 0018-9383Article

Ballistic and overshoot electron transport in bulk semiconductors and in submicronic devicesGHIS, A; CONSTANT, E; BOITTIAUX, B et al.Journal of applied physics. 1983, Vol 54, Num 1, pp 214-221, issn 0021-8979Article

Concentration-fluctuation model of a doped semiconductor in the nonmetallic regime. II: Excitation spectrumRIKLUND, R; CHAO, K. A.Physical review. B, Condensed matter. 1984, Vol 29, Num 6, pp 3456-3462, issn 0163-1829Article

On models of phosphorus diffusion in siliconHU, S. M; FAHEY, P; DUTTON, R. W et al.Journal of applied physics. 1983, Vol 54, Num 12, pp 6912-6922, issn 0021-8979Article

Oxygen and carbon measurements on silicon slices by the IR methodSTALLHOFER, P; HUBER, D.Solid state technology. 1983, Vol 26, Num 8, pp 233-237, issn 0038-111XArticle

HOMOGENEITY OF SOLIDS: A PROPOSAL FOR QUANTITATIVE DEFINITIONINCZEDY J.1982; TALANTA (OXF.); ISSN 0039-9140; GBR; DA. 1982; VOL. 29; NO 7; PP. 643-645; BIBL. 3 REF.Article

IMPURITY STRIATIONS IN MELT-GROWN CRYSTALSALEKSANDROVSKII AL; POSMYKIEWICZ P.1982; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1982; VOL. 74; NO 1; PP. K23-K26; BIBL. 6 REF.Article

LUMINESCENCE DE L'ARSENIURE DE GALLIUM EPITAXIQUE FORTEMENT DOPE PAR LE SILICIUMKOVALENKO VF; PROKHOROVICH AV.1982; FIZIKA I TEHNIKA POLUPROVODNIKOV; ISSN 0015-3222; SUN; DA. 1982; VOL. 16; NO 11; PP. 2064-2065; BIBL. 4 REF.Article

DETERMINATION OF THE BORON CONCENTRATION IN A-SI: H FILMS BY NUCLEAR REACTION METHODCHEVALLIER J; BEYER W.1981; SOLID STATE COMMUN.; ISSN 0038-1098; USA; DA. 1981; VOL. 40; NO 7; PP. 771-773; BIBL. 14 REF.Article

CHARGE AND MASS TRANSFER INVOLVING HYDROGEN IN MGO CRYSTALS THERMOCHEMICALLY REDUCED AT HIGH TEMPERATURESCHEN Y; GONZALEZ R; SCHOW OE et al.1983; PHYSICAL REVIEW. B: CONDENSED MATTER; ISSN 0163-1829; USA; DA. 1983; VOL. 27; NO 2; PP. 1276-1282; BIBL. 18 REF.Article

AN EXPLANATION FOR THE ANOMALOUS IMPURITY CONCENTRATIONS IN SI AS MEASURED BY THE HALL EFFECTNEUMARK GF; SCHRODER DK.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 2; PP. 855-858; BIBL. 19 REF.Article

INVESTIGATION OF THE IMPURITY PROFILES BY MEANS OF THE SCANNING ELECTRON MICROPROBE (SEM)OELGART G; WAGNER G.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 59; NO 1; PP. 43-50; ABS. GER; BIBL. 8 REF.Article

DETERMINATION OF ABSOLUTE INTERNAL QUANTUM EFFICIENCIES OF PHOTOLUMINESCENCE IN GALLIUM ARSENIDE.METTLER K.1977; SIEMENS FORSCH.-U. ENTWICKL.-BER.; DTSCH.; DA. 1977; VOL. 6; NO 3; PP. 152-155; BIBL. 14 REF.Article

SINK STRENGTHS FOR HIGH CONCENTRATIONS OF COMPETING SINKSSCHROEDER K; FELDERHOF BU.1982; J. NUCL. MATER.; ISSN 0022-3115; NLD; DA. 1982; VOL. 105; NO 1; PP. 11-13; BIBL. 9 REF.Article

A PHOTOLUMINESCENCE STUDY OF BERYLLIUM-DOPED GAAS GROWN BY MOLECULAR BEAM EPITAXYSCOTT GB; DUGGAN G; DAWSON P et al.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 11; PP. 6888-6895; BIBL. 28 REF.Article

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