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Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA 2004)Chung, Steve S.International Symposium on the Physical & Failure Analysis of Integrated Circuits. 2004, isbn 0-7803-8454-7, 1Vol, 326 p., isbn 0-7803-8454-7Conference Proceedings

International Conference on Design & Test of Integrated Systems in Nanoscale TechnologyMASMOUDI, Mohamed; RENOVELL, Michel; GIRARD, Patrick et al.International journal of electronics. 2008, Vol 95, Num 3, issn 0020-7217, 128 p.Conference Proceedings

22nd IEEE VLSI test symposium (Napa Valley CA, 25-29 April 2004)IEEE VLSI test symposium. 2004, isbn 0-7695-2134-7, 1Vol, XXVII-406 p, isbn 0-7695-2134-7Conference Proceedings

Conception d'ASIC: avant tout une affaire de formationMesures (1983). 1989, pp 21-22, issn 0755-219X, 2 p., no. specArticle

Cost and performance in integrated circuit creation (Santa Clara CA, 27-28 February 2003)Wong, Alfred K.K; Monahan, Kevin M.SPIE proceedings series. 2003, isbn 0-8194-4848-6, VII, 186 p, isbn 0-8194-4848-6Conference Proceedings

SUR LA QUESTION DE LA MICROMINIATURISATION COMPLEXE DES DISPOSITIFS HFIRLIN AV; KEMPA YA M.1976; POLUPROVODN. TEKH. MIKROELEKTRON., U.S.S.R.; S.S.S.R.; DA. 1976; NO 24; PP. 4-20; BIBL. 19 REF.Article

ASIC: dépasser les choix techniquesPEYRUCAT, J.-F.Mesures (1983). 1989, pp 18-19, issn 0755-219X, 2 p., no. specArticle

Electrical Overstress of Integrated CircuitsKASCHANI, K. T; GÄRTNER, R.Microelectronics and reliability. 2014, Vol 54, Num 11, pp 2410-2416, issn 0026-2714, 7 p.Article

Optimisation of on-chip design-for-test infrastructure for maximal multi-site test throughputGOEL, S. K; MARINISSEN, E. J.IEE proceedings. Computers and digital techniques. 2005, Vol 152, Num 3, pp 442-456, issn 1350-2387, 15 p.Article

Design and process integration for microelectronic manufacturing II (Santa Clara CA, 26-27 February 2004)Liebmann, Lars W.SPIE proceedings series. 2004, isbn 0-8194-5292-0, XVIII, 302 p, isbn 0-8194-5292-0Conference Proceedings

Monolithic integrated mm-wave circuits on high resistivity siliconSCHÖLLHORN, Claus; KASPER, Erich.Recent research developments in microwave theory & techniques Vol. 2 - 2004. Recent research developments in microwave theory & techniques. 2004, pp 155-182, isbn 81-7895-150-9, 28 p.Book Chapter

How to select adhesives for hybrid circuit assemblyLEFEVER, D. W.Electri.onics. 1985, Vol 31, Num 3, pp 23-26, issn 0745-4309Article

Verification of complex analog and RF IC designsHENRY CHANG; KUNDERT, Ken.Proceedings of the IEEE. 2007, Vol 95, Num 3, pp 622-639, issn 0018-9219, 18 p.Article

Input offset compensation scheme with reduced sensitivity to charge injection and leakageRAMIREZ-ANGULO, J; GARIMELLA, A; GARIMELLA, L. M. K et al.Electronics Letters. 2006, Vol 42, Num 6, pp 340-341, issn 0013-5194, 2 p.Article

Pair balance-based test scheduling for SOCsYU HU; HAN, Yin-He; LI, Hua-Wei et al.Asian test symposium. 2004, pp 236-241, isbn 0-7695-2235-1, 1Vol, 6 p.Conference Paper

Design guidelines to implement Six Sigma in assembly process yield of area array solder interconnect packagesCHUNHO KIM; BALDWIN, Daniel F.Proceedings - Electronic Components Conference. 2002, pp 1560-1568, issn 0569-5503, isbn 0-7803-7430-4, 9 p.Conference Paper

Wireless SOC testing: Can RF testing costs be reduced?KAFTON, Alan.Proceedings - International Test Conference. 2002, issn 1089-3539, isbn 0-7803-7542-4, p. 1226Conference Paper

MODIFIED CURRENT MIRROR WITH A "VOLTAGE FOLLOWING" CAPABILITYHART BL; BARKER RWJ.1982; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1982; VOL. 18; NO 22; PP. 970-972; BIBL. 2 REF.Article

EXPANDING HORIZONS IN C.M.O.S.WATSON D.1980; NEW ELECTRON.; GBR; DA. 1980; VOL. 13; NO 13; PP. 51-55; (3 P.)Article

MONOLITHIC CONVECTERS GAIN STRENGTH.MATTERA L.1977; ELECTRONICS; U.S.A.; DA. 1977; VOL. 50; NO 12; PP. 78-79Article

NEW TYPE OF THERMAL-FUNCTION I.C.: THE 4-QUADRANT MULTIPLIER.SZEKELY V.1976; ELECTRON. LETTERS; G.B.; DA. 1976; VOL. 12; NO 15; PP. 372-373; BIBL. 5 REF.Article

Systems-on-chip: Design and testYANG, Laurence T.Integration (Amsterdam). 2007, Vol 40, Num 2, issn 0167-9260, 133 p.Serial Issue

Efficient template generation for instruction-based self-test of processor coresKAMBE, Kazuko; INOUE, Michiko; FUJIWARA, Hideo et al.Asian test symposium. 2004, pp 152-157, isbn 0-7695-2235-1, 1Vol, 6 p.Conference Paper

Evaluation for intra-word faults in word-oriented RAMsHAMDIOUI, Said; REYES, John D; AL-ARS, Zaid et al.Asian test symposium. 2004, pp 283-288, isbn 0-7695-2235-1, 1Vol, 6 p.Conference Paper

Shifts in INTEGRATION: 20 years of VLSI designOTTEN, Ralph H. J. M.Integration (Amsterdam). 2002, Vol 32, Num 1-2, pp 1-4, issn 0167-9260, 4 p.Article

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