Molecular dynamics simulations of interfaces between NiO and cubic ZrO₂FISHER, C. A. J; MATSUBARA, H.Philosophical magazine (2003. Print). 2005, Vol 85, Num 10, pp 1067-1088, issn 1478-6435, 22 p.Article

Study of solid/solid interface by transmitted x-ray reflectivityINOUE, Koji; KITAHARA, Amane; MATSUSHITA, Kiyohiko et al.Surface and interface analysis. 2005, Vol 37, Num 2, pp 185-189, issn 0142-2421, 5 p.Conference Paper

Correlation of stress and atomic-scale surface roughness evolution during intermittent homoepitaxial growth of (111)-oriented Ag and CuFRIESEN, C; THOMPSON, C. V.Physical review letters. 2004, Vol 93, Num 5, pp 056104.1-056104.4, issn 0031-9007Article

Formation of atom wires on vicinal siliconGONZALEZ, C; SNIJDERS, P. C; ORTEGA, J et al.Physical review letters. 2004, Vol 93, Num 12, pp 126106.1-126106.4, issn 0031-9007Article

Kinetic roughening of the interfaces of Langmuir-Blodgett filmsLI, Xiu-Hong; MING LI; MAI, Zhen-Hong et al.Physical review B. Condensed matter and materials physics. 2004, Vol 69, Num 23, pp 235407.1-235407.6, issn 1098-0121Article

Structural analysis of the SiO₂/Si(100) interface by means of photoelectron diffractionDREINER, S; SCHÜRMANN, M; WESTPHAL, C et al.Physical review letters. 2004, Vol 93, Num 12, pp 126101.1-126101.4, issn 0031-9007Article

Interfacial reaction between deposited molybdenum and TiO₂(110) surface: role of the substrate bulk stoichiometryDOMENICHINI, B; FLANK, A. M; LAGARDE, P et al.Surface science. 2004, Vol 560, Num 1-3, pp 63-78, issn 0039-6028, 16 p.Article

Stochastic analysis of different rough surfacesWAECHTER, M; RIESS, F; SCHIMMEL, Th et al.The European physical journal. B, Condensed matter physics. 2004, Vol 41, Num 2, pp 259-277, issn 1434-6028, 19 p.Article

Diffusion des rayonnements X et visibles ; microscopie en champ proche : utilisation comparée pour la caractérisation des surfaces = X ray and visible radiation scattering ; scanning probe microscopy : comparative ulilizatin for surface characterisationTOLLENS, E; MENECIER, S; HAIDAR, Y et al.Journal de physique. IV. 2004, Vol 118, pp 395-405, issn 1155-4339, 11 p.Article

Interfacial reaction study on a solder joint with Sn-4Ag-0.5Cu solder ball and Sn-7Zn-Al (30 ppm) solder paste in a lead-free wafer level chip scale packageCHIANG, Huann-Wu; CHEN, Jun-Yuan; LEE, Jeffrey C. B et al.Journal of electronic materials. 2004, Vol 33, Num 12, pp 1550-1556, issn 0361-5235, 7 p.Conference Paper

Computational study of interfaces between hydroxyapatite and waterZAHN, Dirk; HOCHREIN, Oliver.PCCP. Physical chemistry chemical physics (Print). 2003, Vol 5, Num 18, pp 4004-4007, issn 1463-9076, 4 p.Article

Ag clusters on ultra-thin, ordered SiO₂ filmsSANTRA, A. K; MIN, B. K; GOODMAN, D. W et al.Surface science. 2002, Vol 515, Num 1, pp L475-L479, issn 0039-6028Article

Annealing of thin Zr films on Si_1-xGe_x(0 ≤ x ≤ 1): X-ray diffraction and Raman studiesCHAIX-PLUCHERY, O; CHENEVIER, B; AUBRY-FORTUNA, V et al.The Journal of physics and chemistry of solids. 2002, Vol 63, Num 10, pp 1889-1900, issn 0022-3697Article

Experimental and theoretical study of the MgO/Ag(001) interfaceGIOVANARDI, C; DI BONA, A; MOIA, T. S et al.Surface science. 2002, Vol 505, Num 1-3, pp L209-L214, issn 0039-6028Article

Growth and structure of Fe on MgO(001) studied by modulated electron emissionDI BONA, A; GIOVANARDI, C; VALERI, S et al.Surface science. 2002, Vol 498, Num 1-2, pp 193-201, issn 0039-6028Article

Initial adsorption of Ge on Si(111)-(7 x 7) surface at room temperatureLONG YAN; HAIQIANG YANG; HONGJUN GAO et al.Surface science. 2002, Vol 498, Num 1-2, pp 83-88, issn 0039-6028Article

Molybdenum thin-film growth on rutile titanium dioxide (110)BLONDEAU-PATISSIER, V; LIAN, G. D; DOMENICHINI, B et al.Surface science. 2002, Vol 506, Num 1-2, pp 119-128, issn 0039-6028Article

Nucleation of polycrystalline layer induced by formation of 30° partial dislocation during Si/Si(111) growthNEGISHI, R; SHIGETA, Y.Surface science. 2002, Vol 505, Num 1-3, pp 225-233, issn 0039-6028Article

Pd on Cu(111) studied by photoelectron diffractionDE SIERVO, A; SOARES, E. A; LANDERS, R et al.Surface science. 2002, Vol 504, Num 1-3, pp 215-222, issn 0039-6028Article

Single domain Ca-induced reconstruction on vicinal Si(1 1 1)PETROVYKH, D. Y; ALTMANN, K. N; LIN, J.-L et al.Surface science. 2002, Vol 512, Num 3, pp 269-280, issn 0039-6028Article

Thermal stability of Cr clusters on SrTiO₃(100)QIANG FU; WAGNER, Thomas.Surface science. 2002, Vol 505, Num 1-3, pp 39-48, issn 0039-6028Article

s-p Hybridization in highly oriented pyrolytic graphite and its change on surface modification, as studied by X-ray photoelectron and Raman spectroscopiesYANG, D.-Q; SACHER, E.Surface science. 2002, Vol 504, Num 1-3, pp 125-137, issn 0039-6028Article

An AES, XPS and TDS study on the growth and property of silver thin film on the Pt(1 1 0)-(1 × 2) surfaceWEIXIN HUANG; ZHIQUAN JIANG; FEI DONG et al.Surface science. 2002, Vol 514, Num 1-3, pp 420-425, issn 0039-6028Conference Paper

Annealing behavior of Pd/GaN (0001) microstructureKIM, C. C; JE, J. H; KIM, D. W et al.Materials science & engineering. B, Solid-state materials for advanced technology. 2001, Vol 82, Num 1-3, pp 105-107, issn 0921-5107Article

Reply to comments: Surface morphology and electronic structure of Ge/Si (1 1 1) 7 x 7 systemLOBO, Arun; GOKHALE, Shubha; KULKARNI, S. K et al.Applied surface science. 2001, Vol 185, Num 1-2, pp 44-46, issn 0169-4332Article